ZHCSBT2G November 2012 – October 2017 66AK2H06 , 66AK2H12 , 66AK2H14
PRODUCTION DATA.
The Joint Test Action Group (JTAG) interface is used to support boundary scan and emulation of the device. The boundary scan supported allows for an asynchronous test reset (TRST) and only the five baseline JTAG signals (for example, no EMU[1:0]) required for boundary scan. Most interfaces on the device follow the Boundary Scan Test Specification (IEEE 1149.1), while all of the SerDes (SGMII) support the AC-coupled net test defined in AC-Coupled Net Test Specification (IEEE 1149.6).
It is expected that all compliant devices are connected through the same JTAG interface, in daisy-chain fashion, in accordance with the specification. The JTAG interface uses 1.8-V LVCMOS buffers, compliant with the Power Supply Voltage and Interface Standard for Nonterminated Digital Integrated Circuit Specification (EAI/JESD8-5).