ADC cores can generate bit errors within a sample, often called code errors (CER) or referred to as sparkle codes, resulting from metastability caused by non-ideal comparator limitations. The device uses a unique ADC architecture that inherently allows significant code error rate improvements from traditional pipelined flash or successive approximation register (SAR) ADCs. The code error rate of the device is multiple orders of magnitude better than what can be achieved in alternative architectures at equivalent sampling rates providing significant signal reliability improvements.