ZHCSOJ3B March   2023  – June 2024 ADC12DJ5200SE

PRODUCTION DATA  

  1.   1
  2. 1 特性
  3. 2 应用
  4. 3 说明
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Electrical Characteristics: DC Specifications
    6. 5.6  Electrical Characteristics: Power Consumption
    7. 5.7  Electrical Characteristics: AC Specifications (Dual-Channel Mode)
    8. 5.8  Electrical Characteristics: AC Specifications (Single-Channel Mode)
    9. 5.9  Timing Requirements
    10. 5.10 Switching Characteristics
    11. 5.11 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1  Device Comparison
      2. 6.3.2  Analog Inputs
        1. 6.3.2.1 Analog Input Protection
        2. 6.3.2.2 Full-Scale Voltage (VFS) Adjustment
        3. 6.3.2.3 Analog Input Offset Adjust
      3. 6.3.3  ADC Core
        1. 6.3.3.1 ADC Theory of Operation
        2. 6.3.3.2 ADC Core Calibration
        3. 6.3.3.3 Analog Reference Voltage
        4. 6.3.3.4 ADC Overrange Detection
        5. 6.3.3.5 Code Error Rate (CER)
      4. 6.3.4  Temperature Monitoring Diode
      5. 6.3.5  Timestamp
      6. 6.3.6  Clocking
        1. 6.3.6.1 Noiseless Aperture Delay Adjustment (tAD Adjust)
        2. 6.3.6.2 Aperture Delay Ramp Control (TAD_RAMP)
        3. 6.3.6.3 SYSREF Capture for Multi-Device Synchronization and Deterministic Latency
          1. 6.3.6.3.1 SYSREF Position Detector and Sampling Position Selection (SYSREF Windowing)
          2. 6.3.6.3.2 Automatic SYSREF Calibration
      7. 6.3.7  Programmable FIR Filter (PFIR)
        1. 6.3.7.1 Dual Channel Equalization
        2. 6.3.7.2 Single Channel Equalization
        3. 6.3.7.3 Time Varying Filter
      8. 6.3.8  Digital Down Converters (DDC)
        1. 6.3.8.1 Numerically-Controlled Oscillator and Complex Mixer
          1. 6.3.8.1.1 NCO Fast Frequency Hopping (FFH)
          2. 6.3.8.1.2 NCO Selection
          3. 6.3.8.1.3 Basic NCO Frequency Setting Mode
          4. 6.3.8.1.4 Rational NCO Frequency Setting Mode
          5. 6.3.8.1.5 NCO Phase Offset Setting
          6. 6.3.8.1.6 52
          7. 6.3.8.1.7 NCO Phase Synchronization
        2. 6.3.8.2 Decimation Filters
        3. 6.3.8.3 Output Data Format
        4. 6.3.8.4 Decimation Settings
          1. 6.3.8.4.1 Decimation Factor
          2. 6.3.8.4.2 DDC Gain Boost
      9. 6.3.9  JESD204C Interface
        1. 6.3.9.1 Transport Layer
        2. 6.3.9.2 Scrambler
        3. 6.3.9.3 Link Layer
        4. 6.3.9.4 8B/10B Link Layer
          1. 6.3.9.4.1 Data Encoding (8B/10B)
          2. 6.3.9.4.2 Multiframes and the Local Multiframe Clock (LMFC)
          3. 6.3.9.4.3 Code Group Synchronization (CGS)
          4. 6.3.9.4.4 Initial Lane Alignment Sequence (ILAS)
          5. 6.3.9.4.5 Frame and Multiframe Monitoring
        5. 6.3.9.5 64B/66B Link Layer
          1. 6.3.9.5.1 64B/66B Encoding
          2. 6.3.9.5.2 Multiblocks, Extended Multiblocks and the Local Extended Multiblock Clock (LEMC)
          3. 6.3.9.5.3 Block, Multiblock and Extended Multiblock Alignment using Sync Header
            1. 6.3.9.5.3.1 Cyclic Redundancy Check (CRC) Mode
            2. 6.3.9.5.3.2 Forward Error Correction (FEC) Mode
          4. 6.3.9.5.4 Initial Lane Alignment
          5. 6.3.9.5.5 Block, Multiblock and Extended Multiblock Alignment Monitoring
        6. 6.3.9.6 Physical Layer
          1. 6.3.9.6.1 SerDes Pre-Emphasis
        7. 6.3.9.7 JESD204C Enable
        8. 6.3.9.8 Multi-Device Synchronization and Deterministic Latency
        9. 6.3.9.9 Operation in Subclass 0 Systems
      10. 6.3.10 Alarm Monitoring
        1. 6.3.10.1 NCO Upset Detection
        2. 6.3.10.2 Clock Upset Detection
        3. 6.3.10.3 FIFO Upset Detection
    4. 6.4 Device Functional Modes
      1. 6.4.1 Dual-Channel Mode
      2. 6.4.2 Single-Channel Mode (DES Mode)
      3. 6.4.3 Dual-Input Single-Channel Mode (DUAL DES Mode)
      4. 6.4.4 JESD204C Modes
        1. 6.4.4.1 JESD204C Operating Modes Table
        2. 6.4.4.2 JESD204C Modes cont.
        3. 6.4.4.3 JESD204C Transport Layer Data Formats
        4. 6.4.4.4 64B/66B Sync Header Stream Configuration
        5. 6.4.4.5 Dual DDC and Redundant Data Mode
      5. 6.4.5 Power-Down Modes
      6. 6.4.6 Test Modes
        1. 6.4.6.1 Serializer Test-Mode Details
        2. 6.4.6.2 PRBS Test Modes
        3. 6.4.6.3 Clock Pattern Mode
        4. 6.4.6.4 Ramp Test Mode
        5. 6.4.6.5 Short and Long Transport Test Mode
          1. 6.4.6.5.1 Short Transport Test Pattern
          2. 6.4.6.5.2 Long Transport Test Pattern
        6. 6.4.6.6 D21.5 Test Mode
        7. 6.4.6.7 K28.5 Test Mode
        8. 6.4.6.8 Repeated ILA Test Mode
        9. 6.4.6.9 Modified RPAT Test Mode
      7. 6.4.7 Calibration Modes and Trimming
        1. 6.4.7.1 Foreground Calibration Mode
        2. 6.4.7.2 Background Calibration Mode
        3. 6.4.7.3 Low-Power Background Calibration (LPBG) Mode
      8. 6.4.8 Offset Calibration
      9. 6.4.9 Trimming
    5. 6.5 Programming
      1. 6.5.1 Using the Serial Interface
        1. 6.5.1.1 SCS
        2. 6.5.1.2 SCLK
        3. 6.5.1.3 SDI
        4. 6.5.1.4 SDO
        5. 6.5.1.5 Streaming Mode
    6. 6.6 SPI Register Map
  8. 7 Application Information Disclaimer
    1. 7.1 Application Information
    2. 7.2 Typical Applications
      1. 7.2.1 Wideband RF Sampling Receiver
        1. 7.2.1.1 Design Requirements
          1. 7.2.1.1.1 Input Signal Path
          2. 7.2.1.1.2 Clocking
        2. 7.2.1.2 Application Curves
    3. 7.3 Initialization Set Up
    4. 7.4 Power Supply Recommendations
      1. 7.4.1 Power Sequencing
    5. 7.5 Layout
      1. 7.5.1 Layout Guidelines
      2. 7.5.2 Layout Example
  9. 8 Device and Documentation Support
    1. 8.1 Device Support
      1. 8.1.1 Development Support
    2. 8.2 Documentation Support
      1. 8.2.1 Related Documentation
    3. 8.3 Receiving Notification of Documentation Updates
    4. 8.4 Support Resources
    5. 8.5 Trademarks
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

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5.9 Timing Requirements

typical values at TA = 25°C, VA19 = 1.9 V, VA11 = 1.1 V, VD11 = 1.1 V, default full-scale voltage, fIN = 2347 MHz, AIN = –1 dBFS, fCLK = 5.12 GHz, filtered 1-VPP sine-wave clock, JMODE = 1, Dither enabled with default settings, VA11, VD11 and VS11 noise suppression ON (EN_VA11_NOISE_SUPPR = EN_VD11_NOISE_SUPPR = EN_VS11_NOISE_SUPPR = 1), and background calibration (unless otherwise noted); minimum and maximum values are at nominal supply voltages and over the operating free-air temperature range provided in the Recommended Operating Conditions table
MIN NOM MAX UNIT
DEVICE (SAMPLING) CLOCK (CLK+, CLK–)
fCLK Input clock frequency (CLK±), both single-channel and dual-channel modes(1) 800 5200 MHz
tCLK Input clock period (CLK±), both single-channel and dual-channel modes(1) 192.3 1250 ps
SYSREF (SYSREF+, SYSREF–)
tINV(SYSREF) Width of invalid SYSREF capture region of CLK± period, indicating setup or hold time violation, as measured by SYSREF_POS status register, SYSREF_ZOOM = 1(3) 48 ps
tINV(TEMP) Drift of invalid SYSREF capture region over temperature, positive number indicates a shift toward MSB of SYSREF_POS register, SYSREF_ZOOM = 1 0.02 ps/°C
tINV(VA11) Drift of invalid SYSREF capture region over VA11 supply voltage, positive number indicates a shift toward MSB of SYSREF_POS register, SYSREF_ZOOM = 1 -0.03 ps/mV
tSTEP(SP) Delay of SYSREF_POS LSB(4) SYSREF_ZOOM = 0 39 ps
SYSREF_ZOOM = 1 24
t(PH_SYS) Minimum SYSREF± assertion duration with SYSREF Windowing after SYSREF± rising edge event 5*TCLK+4.5 ns
t(PL_SYS) Minimum SYSREF± de-assertion duration with SYSREF Windowing after SYSREF± falling edge event 5*TCLK+4.5 ns
JESD204B SYNC TIMING (SYNCSE OR TMSTP±)
tH(SYNCSE) Minimum hold time from multiframe or extended multiblock boundary (SYSREF rising edge captured high) to de-assertion of JESD204C SYNC signal (SYNCSE if SYNC_SEL = 0 or TMSTP± if SYNC_SEL = 1) for NCO synchronization (NCO_SYNC_ILA = 1)(2) JMODE = 10, 21, 23 19 tCLK cycles
JMODE = 11, 14, 22, 24, 61 10
JMODE = 12, 15, 16, 25, 26, 27, 56, 57, 58, 62, 63, 66, 67, 69, 70 18
JMODE = 13 23
JMODE = 36, 37, 38, 52, 53, 54, 55, 59, 60, 65, 68, 71 17
JMODE = 39 21
JMODE = 46, 47, 48, 49, 64 9
tSU(SYNCSE) Minimum setup time from de-assertion of JESD204C SYNC signal (SYNCSE if SYNC_SEL = 0 or TMSTP± if SYNC_SEL = 1) to multiframe or extended multiblock boundary (SYSREF rising edge captured high) for NCO synchronization (NCO_SYNC_ILA = 1)(2) JMODE = 10, 21, 23 –2 tCLK cycles
JMODE = 11, 14, 22, 24, 61 7
JMODE = 12, 15, 16, 25, 26, 27, 56, 57, 58, 62, 63, 66, 67, 69, 70 –1
JMODE = 13 –6
JMODE = 36, 37, 38, 52, 53, 54, 55, 59, 60, 65, 68, 71 0
JMODE = 39 –4
JMODE = 46, 47, 48, 49, 64 8
t(SYNCSE) SYNCSE minimum assertion time to trigger link resynchronization 4 Frames
SERIAL PROGRAMMING INTERFACE (SCLK, SDI, SCS)
fCLK(SCLK) Serial clock frequency 15.625 MHz
t(PH) Serial clock high value pulse duration 32 ns
t(PL) Serial clock low value pulse duration 32 ns
tSU(SCS) Setup time from SCS to rising edge of SCLK 30 ns
tH(SCS) Hold time from rising edge of SCLK to SCS 30 ns
tSU(SDI) Setup time from SDI to rising edge of SCLK 25 ns
tH(SDI) Hold time from rising edge of SCLK to SDI 3 ns
(1) Unless functionally limited to a smaller range in the ADC12DJ5200SE Operating Modes  table based on programmed JMODE.
(2) This parameter only applies to JMODE settings that use 8B/10B encoding or settings that use 64B/66B encoding and 4x or 8x decimation. SYNC is not used for 64B/66B encoding modes unless the DDC block and NCOs are used and require synchronization.
(3) Use SYSREF_POS to select an optimal SYSREF_SEL value for the SYSREF capture, see the SYSREF Position Detector and Sampling Position Selection (SYSREF Windowing) section for more information on SYSREF windowing. The invalid region, specified by tINV(SYSREF), indicates the portion of the CLK± period(tCLK), as measured by SYSREF_SEL, that may result in a setup and hold violation. Verify that the timing skew between SYSREF± and CLK± over system operating conditions from the nominal conditions (that used to find optimal SYSREF_SEL) does not result in the invalid region occurring at the selected SYSREF_SEL position in SYSREF_POS, otherwise a temperature dependent SYSREF_SEL selection may be needed to track the skew between CLK± and SYSREF±.
(4) It is recommended to use SYSREF_ZOOM = 0 below fCLK = 3GHz and SYSREF_ZOOM = 1 above fCLK = 3GHz
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