ZHCSMK4A september   2022  – july 2023 ADS131B26-Q1

PRODUCTION DATA  

  1.   1
  2. 1 特性
  3. 2 应用
  4. 3 说明
  5. 4 Revision History
  6. 5 说明（续）
  7. 6 Pin Configuration and Functions
  8. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements
    7. 7.7 Switching Characteristics
    8. 7.8 Timing Diagram
    9. 7.9 Typical Characteristics
  9. 8 Parameter Measurement Information
    1. 8.1 Offset Drift Measurement
    2. 8.2 Gain Drift Measurement
    3. 8.3 Noise Performance
  10. 9 Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1 Naming Conventions
      2. 9.3.2 Precision Voltage References (REFA, REFB)
      3. 9.3.3 Clocking (MCLK, OSCM, OSCD)
      4. 9.3.4 ADC1y
        1. 9.3.4.1 ADC1y Input Multiplexer
        2. 9.3.4.2 ADC1y Programmable Gain Amplifier (PGA)
        3. 9.3.4.3 ADC1y ΔΣ Modulator
        4. 9.3.4.4 ADC1y Digital Filter
        5. 9.3.4.5 ADC1y Offset and Gain Calibration
        6. 9.3.4.6 ADC1y Conversion Data
      5. 9.3.5 ADC2y
        1. 9.3.5.1 ADC2y Input Multiplexer
        2. 9.3.5.2 ADC2y Programmable Gain Amplifier (PGA)
        3. 9.3.5.3 ADC2y ΔΣ Modulator
        4. 9.3.5.4 ADC2y Digital Filter
        5. 9.3.5.5 ADC2y Offset and Gain Calibration
        6. 9.3.5.6 ADC2y Sequencer
        7. 9.3.5.7 VCMy Buffers
        8. 9.3.5.8 ADC2y Measurement Configurations
        9. 9.3.5.9 ADC2y Conversion Data
      6. 9.3.6 ADC3y
      7. 9.3.7 General-Purpose Digital Inputs and Outputs (GPIO0 to GPIO4)
        1. 9.3.7.1 GPIOx PWM Output Configuration
        2. 9.3.7.2 GPIOx PWM Input Readback
      8. 9.3.8 General-Purpose Digital Inputs and Outputs (GPIO0A, GPIO1A, GPIO0B, GPIO1B)
      9. 9.3.9 Monitors and Diagnostics
        1. 9.3.9.1  Supply Monitors
        2. 9.3.9.2  Clock Monitors
        3. 9.3.9.3  Digital Monitors
          1. 9.3.9.3.1 Register Map CRC
          2. 9.3.9.3.2 Memory Map CRC
          3. 9.3.9.3.3 GPIO Readback
        4. 9.3.9.4  Communication Monitors
        5. 9.3.9.5  Fault Flags and Fault Masking
        6. 9.3.9.6  FAULT Pin
        7. 9.3.9.7  Diagnostics and Diagnostic Procedure
        8. 9.3.9.8  Indicators
        9. 9.3.9.9  Conversion and Sequence Counters
        10. 9.3.9.10 Supply Voltage Readback
        11. 9.3.9.11 Temperature Sensors (TSA, TSB)
        12. 9.3.9.12 Test DACs (TDACA, TDACB)
        13. 9.3.9.13 Open-Wire Detection
        14. 9.3.9.14 Missing Host Detection and MHD Pin
        15. 9.3.9.15 Overcurrent Comparators (OCCA, OCCB)
          1. 9.3.9.15.1 OCCA and OCCB Pins
          2. 9.3.9.15.2 Overcurrent Indication Response Time
    4. 9.4 Device Functional Modes
      1. 9.4.1 Power-Up and Reset
        1. 9.4.1.1 Power-On Reset (POR)
        2. 9.4.1.2 RESETn Pin
        3. 9.4.1.3 RESET Command
      2. 9.4.2 Operating Modes
        1. 9.4.2.1 Active Mode
        2. 9.4.2.2 Standby Mode
        3. 9.4.2.3 Power-Down Mode
      3. 9.4.3 ADC Conversion Modes
        1. 9.4.3.1 ADC1y and ADC3y Conversion Modes
          1. 9.4.3.1.1 Continuous-Conversion Mode
          2. 9.4.3.1.2 Single-Shot Conversion Mode
          3. 9.4.3.1.3 Global-Chop Mode
            1. 9.4.3.1.3.1 Overcurrent Indication Response Time in Global-Chop Mode
        2. 9.4.3.2 ADC2y Sequencer Operation and Sequence Modes
          1. 9.4.3.2.1 Continuous Sequence Mode
          2. 9.4.3.2.2 Single-Shot Sequence Mode
          3. 9.4.3.2.3 Synchronized Single-Shot Sequence Mode Based on ADC1y Conversion Starts
    5. 9.5 Programming
      1. 9.5.1 Serial Interface
        1. 9.5.1.1 Serial Interface Signals
          1. 9.5.1.1.1 Chip Select (CSn)
          2. 9.5.1.1.2 Serial Data Clock (SCLK)
          3. 9.5.1.1.3 Serial Data Input (SDI)
          4. 9.5.1.1.4 Serial Data Output (SDO)
          5. 9.5.1.1.5 Data Ready (DRDYn)
        2. 9.5.1.2 Serial Interface Communication Structure
          1. 9.5.1.2.1 SPI Communication Frames
          2. 9.5.1.2.2 SPI Communication Words
          3. 9.5.1.2.3 STATUS Word
          4. 9.5.1.2.4 Communication Cyclic Redundancy Check (CRC)
          5. 9.5.1.2.5 Commands
            1. 9.5.1.2.5.1 NULL (0000 0000 0000 0000b)
            2. 9.5.1.2.5.2 RESET (0000 0000 0001 0001b)
            3. 9.5.1.2.5.3 LOCK (0000 0101 0101 0101b)
            4. 9.5.1.2.5.4 UNLOCK (0000 0110 0101 0101b)
            5. 9.5.1.2.5.5 WREG (011a aaaa aaa0 0nnnb)
            6. 9.5.1.2.5.6 RREG (101a aaaa aaan nnnnb)
          6. 9.5.1.2.6 SCLK Counter
          7. 9.5.1.2.7 SPI Timeout
          8. 9.5.1.2.8 Reading ADC1A, ADC1B, ADC2A, ADC2B, ADC3A, and ADC3B Conversion Data
          9. 9.5.1.2.9 DRDYn Pin Behavior
    6. 9.6 Register Map
      1. 9.6.1 Registers
  11. 10Application and Implementation
    1. 10.1 Application Information
      1. 10.1.1 Unused Inputs and Outputs
      2. 10.1.2 Minimum Interface Connections
    2. 10.2 Typical Application
      1. 10.2.1 Design Requirements
      2. 10.2.2 Detailed Design Procedure
        1. 10.2.2.1 Current Shunt Measurement
        2. 10.2.2.2 Battery Pack Voltage Measurement
        3. 10.2.2.3 Other Voltage Measurements
        4. 10.2.2.4 Shunt Temperature Measurement
        5. 10.2.2.5 Analog Output Temperature Sensor Measurement
      3. 10.2.3 Application Curves
    3. 10.3 Power Supply Recommendations
      1. 10.3.1 Power-Supply Options
        1. 10.3.1.1 Single Unregulated External 4-V to 16-V Supply (3.3-V Digital I/O Levels)
        2. 10.3.1.2 Single Regulated External 3.3-V Supply (3.3-V Digital IO Levels)
        3. 10.3.1.3 Single Regulated External 5-V Supply (5-V Digital I/O Levels)
      2. 10.3.2 Power-Supply Sequencing
      3. 10.3.3 Power-Supply Decoupling
    4. 10.4 Layout
      1. 10.4.1 Layout Guidelines
      2. 10.4.2 Layout Example
  12. 11Device and Documentation Support
    1. 11.1 Documentation Support
      1. 11.1.1 Related Documentation
    2. 11.2 接收文档更新通知
    3. 11.3 支持资源
    4. 11.4 Trademarks
    5. 11.5 静电放电警告
    6. 11.6 术语表
  13. 12Mechanical, Packaging, and Orderable Information

封装选项

请参考 PDF 数据表获取器件具体的封装图。

机械数据 (封装 | 引脚)
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订购信息

9.3.9.10 Supply Voltage Readback

In addition to the dedicated supply monitors, all supplies (APWR, DPWR, AVDD, IOVDD, and DVDD) can also be measured back internally through ADC2A or ADC2B. Resistor dividers are integrated in the device to attenuate the supply voltages to within the input voltage range of ADC2A and ADC2B. See the Electrical CharacteristicsElectrical CharacteristicsElectrical CharacteristicsElectrical CharacteristicsElectrical CharacteristicsElectrical CharacteristicsElectrical CharacteristicsElectrical CharacteristicsElectrical Characteristics table for the according attenuation factors. Use the SEQ2y_STEPx_CH_P[3:0] bits to configure an ADC2y sequence step for any of the supply voltage measurements.

The supply voltage measurement accuracy depends on two factors:

  • Multiplexer delay time (configured using the MUX2y_DELAY[2:0] bits)
  • ADC2y conversion time (configured using the OSR2y[1:0] bits)

The large resistor divider values used internally to divide the supply voltages down together with the internal filter capacitor lead to a large RC filter time constant. The input signal therefore needs considerable time to settle when the ADC2y multiplexer selects one of the supply voltage measurements. Increasing the multiplexer delay time provides more time for the input signal to settle after the multiplexer change before ADC2y starts converting. Setting the multiplexer delay time equal to or greater than 256 × tMCLK provides sufficient time for the input signals to settle when measuring the supply voltages.

If increasing the multiplexer delay time is not possible, because the delay time affects all sequence steps equally, configure multiple consecutive sequence steps for the same supply voltage measurement. Then disregard the initial sequence step readings where the conversions are not settled yet.

The input impedance of ADC2y changes with the selected conversion time, see the Electrical CharacteristicsElectrical CharacteristicsElectrical CharacteristicsElectrical CharacteristicsElectrical CharacteristicsElectrical CharacteristicsElectrical CharacteristicsElectrical CharacteristicsElectrical Characteristics table. The impedance of the resistor divider interacts with the input impedance of ADC2y leading to a gain error. Increasing the ADC2y input impedance by increasing the ADC2y conversion time reduces the gain error for the supply voltage measurements.

See Figure 7-32 for details on how the supply voltage measurement accuracy changes with the multiplexer delay time and the ADC2y conversion time.
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