TIMING CHARACTERISTICS |
fJESD
|
Serial output data rate in terms of F (number of octets per frame) and fC (ADC clock frequency in MHz)
|
0.01 × F × fC
|
|
Gbps |
UI |
Unit interval
|
200 |
1000 / fJESD
|
2000 |
ps |
Tj |
Total jitter: fJESD = 5 Gbps, PRE_EMP = 7, INC_JESD_VDD = 1 |
|
0.27 |
|
p-p UI |
tR, tF
|
Rise and fall time: 20% to 80%, each pin loaded by CLOAD = 1.2 pF to DVDD_1P2 |
|
85 |
|
ps |
SAMPLING TIMING |
tSU_S
|
Setup time for SYSREF with respect to the device clock rising edge |
|
3 |
|
ns |
tH_S
|
Hold time for SYSREF with respect to the device clock rising edge |
|
2 |
|
ns |
tSU_T
|
Setup time for SYNC~ with respect to the device clock rising edge |
|
3 |
|
ns |
tH_T
|
Hold time for SYNC~ with respect to the device clock rising edge |
|
2 |
|
ns |
JESD LATENCY |
NA_SYNC~
|
Latency from SYNC~ assertion (falling) edge to start of CGS phase (K28.5) in subclass 0, 1, and 2 |
|
17 |
|
Device clock cycles |
ND_SYNC~
|
Latency from the first LMFC boundary after SYNC~ deassertion (rising) edge to start of ILA phase (K28.0) in subclass 1 |
|
11 |
|
Device clock cycles |
NLAT_JESD
|
Latency from the device clock falling edge sampling the analog input of ADC1 to the appearance of the corresponding octets on the JESD outputs |
|
14.5 |
|
Device clock cycles |
JESD DIGITAL OUTPUTS |
|
VOH-CML
|
High-level output voltage of the CML output (CMLx_OUTP, CMLx_OUTM) |
DVDD_1P2 |
|
V |
VOL-CML
|
Low-level output voltage of the CML output (CMLx_OUTP, CMLx_OUTM) |
DVDD_1P2 – 0.4 |
|
V |
|VOD-CML| |
Differential output voltage of CMLx_OUT
|
|
0.4 |
|
V |
VOC-CML
|
Common-mode output voltage of CMLx_OUTP, CMLx_OUTM |
DVDD_1P2 – 0.2 |
|
V |
zOS
|
Single-ended output impedance |
|
50 ± 25% |
|
Ω |
CCML
|
Output capacitance inside device from either CML output to ground |
|
1 |
|
pF |
|
Transmitter short-circuit current: transmitter terminals shorted to any voltage between –0.25 V and 1.45 V |
|
±100 |
|
mA |