4 修订历史记录
Changes from B Revision (February 2015) to C Revision
-
Updated Figure 1 Go
-
Changed Serial Interface section: changed last half of first paragraph, changed Figure 35Go
-
Changed Figure 38 Go
-
添加了社区资源部分Go
Changes from A Revision (November 2014) to B Revision
-
Changed 宽工作电压范围 特性 要点:已将 AVDD 的值从 1.8V 改为 1.65V Go
-
Changed 宽模拟输入电压范围下限至 1.65V(说明部分第 1 段)Go
-
Changed ESD Ratings table to latest standards Go
-
Changed AVDD parameter minimum specification in Recommended Operating Conditions table to 1.65 VGo
-
Changed AVDD range in conditions of Electrical Characteristics tableGo
-
Changed INL and DNL parameter test conditions in Electrical Characteristics tableGo
-
Changed maximum throughput rate parameter test conditions in Electrical Characteristics tableGo
-
Changed AVDD parameter minimum specification in Electrical Characteristics tableGo
-
Changed conditions for Timing Characteristics table: changed range of AVDD and added CLOAD conditionGo
-
Changed t D_CKDO parameter in Timing Characteristics table Go
-
Added fSCLK minimum specification to Timing Characteristics table Go
-
Changed titles of Figure 26 to Figure 30 Go
-
Changed Reference sub-section in Feature Description sectionGo
-
Changed range of second fCLK-CAL parameter description in Table 2Go
-
Changed range of second fCLK-CAL parameter description in Table 3 Go
-
Changed Reference Circuit section in Application InformationGo
-
Added last two sentences to AVDD and DVDD Supply Recommendations section Go
Changes from * Revision (November 2014) to A Revision