4 修订历史记录
Changes from C Revision (February 2015) to D Revision
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Changed Figure 1Go
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Changed Serial Interface section: changed last half of first paragraph, changed Figure 35Go
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Changed Figure 38Go
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添加了社区资源部分Go
Changes from B Revision (December 2014) to C Revision
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已更改宽工作电压范围 特性 要点:已将 AVDD 的值从 1.8V 改为 1.65VGo
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已将宽模拟输入电压范围下限值改为 ±1.65V (说明 部分第一段)Go
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Changed AVDD parameter minimum specification in Recommended Operating Conditions table Go
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Changed EO parameter uncalibrated test conditions in Electrical Characteristics table Go
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Changed Maximum throughput rate parameter test conditions in Electrical Characteristics table Go
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Changed AVDD parameter minimum specification in Electrical Characteristics table Go
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Changed conditions for Timing Characteristics table: changed range of AVDD and added CLOAD condition Go
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Changed tD_CKDO specification in Timing Characteristics table Go
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Added fSCLK minimum specification to Timing Characteristics table Go
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Changed titles of Figure 26 to Figure 30Go
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Changed Reference sub-section in Feature Description sectionGo
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Changed AVDD range in description of fCLK-CAL parameter in Table 2 Go
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Changed AVDD range in description of fCLK-CAL parameter in Table 3Go
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Changed Reference Circuit section in Application InformationGo
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Added last two sentences to AVDD and DVDD Supply Recommendations sectionGo
Changes from A Revision (November 2014) to B Revision
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Changed ESD Ratings table to latest standards Go
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Added footnote 3 to Electrical Characteristics table Go
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Changed y-axis unit in Figure 30 Go
Changes from * Revision (November 2014) to A Revision