ZHCSNH9A December 2021 – September 2022 AFE8030
PRODUCTION DATA
- 1特性
- 2应用
- 3说明
- 4 AFE8030 Functional Block Diagram
- 5Revision History
- 6Device and Documentation Support
- 7Mechanical, Packaging, and Orderable Information
封装选项
机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息
6.5 Electrostatic Discharge Caution
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. |
| ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. |