SPRS550F October   2009  – July 2014 AM3505 , AM3517

PRODUCTION DATA.  

  1. 1Device Summary
    1. 1.1 Features
    2. 1.2 Applications
    3. 1.3 Description
    4. 1.4 Functional Block Diagram
  2. 2Revision History
  3. 3Device Comparison
    1. 3.1 Device Features Comparison
    2. 3.2 ZCN and ZER Package Differences
  4. 4Terminal Configuration and Functions
    1. 4.1 Pin Assignments
      1. 4.1.1 Pin Map (Top View)
    2. 4.2 Ball Characteristics
    3. 4.3 Multiplexing Characteristics
    4. 4.4 Signal Description
      1. 4.4.1 External Memory Interfaces
      2. 4.4.2 Video Interfaces
      3. 4.4.3 Serial Communication Interfaces
      4. 4.4.4 Removable Media Interfaces
      5. 4.4.5 Test Interfaces
      6. 4.4.6 Miscellaneous
      7. 4.4.7 General-Purpose IOs
      8. 4.4.8 System and Miscellaneous Terminals
      9. 4.4.9 Power Supplies
  5. 5Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  Handling Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Power Consumption Summary
    5. 5.5  Electrical Characteristics
    6. 5.6  Thermal Characteristics
    7. 5.7  Core Voltage Decoupling
    8. 5.8  Power-up and Power-down
      1. 5.8.1 Power-up Sequence
      2. 5.8.2 Power-down Sequence
    9. 5.9  Clock Specifications
      1. 5.9.1 Oscillator
      2. 5.9.2 Input Clock Specifications
      3. 5.9.3 Output Clock Specifications
      4. 5.9.4 DPLL Specifications
        1. 5.9.4.1 Digital Phase-Locked Loop (DPLL)
          1. 5.9.4.1.1 DPLL1 (MPU)
          2. 5.9.4.1.2 DPLL3 (CORE)
          3. 5.9.4.1.3 DPLL4 (Peripherals)
          4. 5.9.4.1.4 DPLL5 (Second peripherals DPLL)
        2. 5.9.4.2 DPLL Noise Isolation
    10. 5.10 Video DAC Specifications
      1. 5.10.1 Interface Description
      2. 5.10.2 Electrical Specifications Over Recommended Operating Conditions
      3. 5.10.3 Analog Supply (vdda_dac) Noise Requirements
      4. 5.10.4 External Component Value Choice
  6. 6Timing Requirements and Switching Characteristics
    1. 6.1 Timing Test Conditions
    2. 6.2 Interface Clock Specifications
      1. 6.2.1 Interface Clock Terminology
      2. 6.2.2 Interface Clock Frequency
      3. 6.2.3 Clock Jitter Specifications
      4. 6.2.4 Clock Duty Cycle Error
    3. 6.3 Timing Parameters
    4. 6.4 External Memory Interfaces
      1. 6.4.1 General-Purpose Memory Controller (GPMC)
        1. 6.4.1.1 GPMC/NOR Flash Interface Synchronous Timing
        2. 6.4.1.2 GPMC/NOR Flash Interface Asynchronous Timing
        3. 6.4.1.3 GPMC/NAND Flash Interface Timing
      2. 6.4.2 SDRAM Controller (SDRC)
        1. 6.4.2.1 LPDDR Interface
          1. 6.4.2.1.1 LPDDR Interface Schematic
          2. 6.4.2.1.2 Compatible JEDEC LPDDR Devices
          3. 6.4.2.1.3 PCB Stackup
          4. 6.4.2.1.4 Placement
          5. 6.4.2.1.5 LPDDR Keep Out Region
          6. 6.4.2.1.6 Net Classes
          7. 6.4.2.1.7 LPDDR Signal Termination
          8. 6.4.2.1.8 LPDDR CK and ADDR_CTRL Routing
        2. 6.4.2.2 DDR2 Interface
          1. 6.4.2.2.1  DDR2 Interface Schematic
          2. 6.4.2.2.2  Compatible JEDEC DDR2 Devices
          3. 6.4.2.2.3  PCB Stackup
          4. 6.4.2.2.4  Placement
          5. 6.4.2.2.5  DDR2 Keep Out Region
          6. 6.4.2.2.6  Bulk Bypass Capacitors
          7. 6.4.2.2.7  High-Speed Bypass Capacitors
          8. 6.4.2.2.8  Net Classes
          9. 6.4.2.2.9  DDR2 Signal Termination
          10. 6.4.2.2.10 VREF Routing
          11. 6.4.2.2.11 DDR2 CLK and ADDR_CTRL Routing
          12. 6.4.2.2.12 On Die Termination (ODT)
    5. 6.5 Video Interfaces
      1. 6.5.1 Video Processing Subsystem (VPSS)
        1. 6.5.1.1 Video Processing Front End (VPFE)
          1. 6.5.1.1.1 Video Processing Front End (VPFE) Timing
      2. 6.5.2 Display Subsystem (DSS)
        1. 6.5.2.1 LCD Display Support in Bypass Mode
          1. 6.5.2.1.1 LCD Display in TFT Mode
          2. 6.5.2.1.2 LCD Display in STN Mode
    6. 6.6 Serial Communications Interfaces
      1. 6.6.1  Multichannel Buffered Serial Port (McBSP) Timing
        1. 6.6.1.1 McBSP in Normal Mode
          1. 6.6.1.1.1 McBSP1
          2. 6.6.1.1.2 McBSP2
          3. 6.6.1.1.3 McBSP3
            1. 6.6.1.1.3.1 McBSP3 Multiplexed on McBSP3 Pins
            2. 6.6.1.1.3.2 McBSP3 Multiplexed on UART2 or McBSP1 Pins
          4. 6.6.1.1.4 McBSP4
          5. 6.6.1.1.5 McBSP5
          6. 6.6.1.1.6 McBSP in TDM Mode
          7. 6.6.1.1.7 McBSP Timing Diagrams
      2. 6.6.2  Multichannel Serial Port Interface (McSPI) Timing
        1. 6.6.2.1 McSPI in Slave Mode
        2. 6.6.2.2 McSPI in Master Mode
      3. 6.6.3  Multiport Full-Speed Universal Serial Bus (USB) Interface
        1. 6.6.3.1 Multiport Full-Speed Universal Serial Bus (USB) - Unidirectional Standard 6-pin Mode
        2. 6.6.3.2 Multiport Full-Speed Universal Serial Bus (USB) - Bidirectional Standard 4-pin Mode
        3. 6.6.3.3 Multiport Full-Speed Universal Serial Bus (USB) - Bidirectional Standard 3-pin Mode
      4. 6.6.4  Multiport High-Speed Universal Serial Bus (USB) Timing
        1. 6.6.4.1 High-Speed Universal Serial Bus (USB) on Ports 1 and 2 12-bit Master Mode
      5. 6.6.5  USB0 OTG (USB2.0 OTG)
        1. 6.6.5.1 USB OTG Electrical Parameters
      6. 6.6.6  High-End Controller Area Network Controller (HECC) Timing
        1. 6.6.6.1 HECC Timing Requirements
        2. 6.6.6.2 HECC Switching Characteristics
      7. 6.6.7  Ethernet Media Access Controller (EMAC)
        1. 6.6.7.1 EMAC Electrical Data/ Timing
      8. 6.6.8  Management Data Input/Output (MDIO)
        1. 6.6.8.1 Management Data Input/Output (MDIO) Electrical Data/Timing
      9. 6.6.9  Universal Asynchronous Receiver/Transmitter (UART)
        1. 6.6.9.1 UART IrDA Interface
          1. 6.6.9.1.1 IrDA—Receive Mode
          2. 6.6.9.1.2 IrDA—Transmit Mode
      10. 6.6.10 HDQ / 1-Wire Interfaces
        1. 6.6.10.1 HDQ Protocol
        2. 6.6.10.2 1-Wire Protocol
      11. 6.6.11 I2C Interface
        1. 6.6.11.1 I2C Standard/Fast-Speed Mode
        2. 6.6.11.2 I2C High-Speed Mode
    7. 6.7 Removable Media Interfaces
      1. 6.7.1 High-Speed Multimedia Memory Card (MMC) and Secure Digital IO Card (SDIO) Timing
        1. 6.7.1.1 MMC/SD/SDIO in SD Identification Mode
        2. 6.7.1.2 MMC/SD/SDIO in High-Speed MMC Mode
        3. 6.7.1.3 MMC/SD/SDIO in Standard MMC Mode and MMC Identification Mode
        4. 6.7.1.4 MMC/SD/SDIO in High-Speed SD Mode
        5. 6.7.1.5 MMC/SD/SDIO in Standard SD Mode
    8. 6.8 Test Interfaces
      1. 6.8.1 Embedded Trace Macro Interface (ETM)
      2. 6.8.2 JTAG Interfaces
        1. 6.8.2.1 JTAG Free Running Clock Mode
        2. 6.8.2.2 JTAG Adaptive Clock Mode
  7. 7Device and Documentation Support
    1. 7.1 Device Support
      1. 7.1.1 Development Support
        1. 7.1.1.1 Getting Started and Next Steps
      2. 7.1.2 Device Nomenclature
    2. 7.2 Documentation Support
      1. 7.2.1 Related Documentation
    3. 7.3 Related Links
    4. 7.4 Community Resources
    5. 7.5 Trademarks
    6. 7.6 Electrostatic Discharge Caution
  8. 8Mechanical Packaging and Orderable Information
    1. 8.1 Package Option Addendum

封装选项

请参考 PDF 数据表获取器件具体的封装图。

机械数据 (封装 | 引脚)
  • ZER|484
  • ZCN|491
散热焊盘机械数据 (封装 | 引脚)
订购信息

6 Timing Requirements and Switching Characteristics

Note: The timing data shown is preliminary data and is subject to change in future revisions.

6.1 Timing Test Conditions

All timing requirements and switching characteristics are valid over the recommended operating conditions of Table 5-3, unless otherwise specified.

6.2 Interface Clock Specifications

6.2.1 Interface Clock Terminology

The Interface clock is used at the system level to sequence the data and/or control transfers accordingly with the interface protocol.

6.2.2 Interface Clock Frequency

The two interface clock characteristics are:

  • The maximum clock frequency
  • The maximum operating frequency

The interface clock frequency documented in this document is the maximum clock frequency, which corresponds to the maximum frequency programmable on this output clock. This frequency defines the maximum limit supported by the AM3517/05 IC and does not take into account any system consideration (PCB, peripherals).

The system designer will have to consider these system considerations and AM3517/05 IC timings characteristics as well, to define properly the maximum operating frequency, which corresponds to the maximum frequency supported to transfer the data on this interface.

6.2.3 Clock Jitter Specifications

Jitter is a phase noise, which may alter different characteristics of a clock signal. The jitter specified in this document is the time difference between the typical cycle period and the actual cycle period affected by noise sources on the clock. The cycle (or period) jitter terminology identifies this type of jitter.

SWPS030-020.gifFigure 6-1 Cycle (or Period) Jitter

6.2.4 Clock Duty Cycle Error

The maximum duty cycle error is the difference between the absolute value of the maximum high-level pulse duration or the maximum low-level pulse duration and the typical pulse duration value:

  • Maximum pulse duration = typical pulse duration + maximum duty cycle error
  • Minimum pulse duration = typical pulse duration - maximum duty cycle error

6.3 Timing Parameters

The timing parameter symbols used in the timing requirement and switching characteristic tables are created in accordance with JEDEC Standard 100. To shorten the symbols, some pin names and other related terminologies have been abbreviated as follows:

Table 6-1 Timing Parameters

LOWERCASE SUBSCRIPTS
Symbols Parameter
c Cycle time (period)
d Delay time
dis Disable time
en Enable time
h Hold time
su Setup time
START Start bit
t Transition time
v Valid time
w Pulse duration (width)
X Unknown, changing, or dont care level
H High
L Low
V Valid
IV Invalid
AE Active Edge
FE First Edge
LE Last Edge
Z High impedance

6.4 External Memory Interfaces

The AM3517/05 processor includes the following external memory interfaces:

  • General-purpose memory controller (GPMC)
  • SDRAM controller (SDRC)

6.4.1 General-Purpose Memory Controller (GPMC)

The GPMC is the AM3517/05 unified memory controller used to interface external memory devices such as:

  • Asynchronous SRAM-like memories and ASIC devices
  • Asynchronous page mode and synchronous burst NOR flash
  • NAND flash

6.4.1.1 GPMC/NOR Flash Interface Synchronous Timing

Table 6-2 through Table 6-4 assume testing over the recommended operating conditions and electrical characteristic conditions.

Table 6-2 GPMC/NOR Flash Synchronous Mode Timing Conditions

TIMING CONDITION PARAMETER 1.8V, 3.3V UNIT
MIN MAX
Input Conditions
tR Input signal rise time 0.3 1.8 ns
tF Input signal fall time 0.3 1.8 ns
Output Conditions
CLOAD Output load capacitance 30 pF

Table 6-3 GPMC/NOR Flash Interface Timing Requirements Synchronous Mode

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
F12 tsu(DV-CLKH) Setup time, read gpmc_d[15:0] valid before gpmc_clk high 2.021 ns
F13 th(CLKH-DV) Hold time, gpmc_d[15:0] valid after gpmc_clk high 3.403 ns
F21 tsu(WAITV-CLKH) Setup time, gpmc_waitx(1) valid before gpmc_clk high 3.782 ns
F22 th(CLKH-WAITV) Hold Time, gpmc_waitx(1) valid after gpmc_clk high 3.343 ns
(1) Wait monitoring support is limited to a WaitMonitoringTime value > 0.

Table 6-4 GPMC/NOR Flash Interface Switching Characteristics Synchronous Mode

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
F0 tc(CLK) Cycle time(14), output clock gpmc_clk period 10 ns
F1 tw(CLKH) Typical pulse duration, output clock gpmc_clk high 0.5 P(12) 0.5 P(12) ns
F1 tw(CLKL) Typical pulse duration, output clock gpmc_clk low 0.5 P(12) 0.5 P(12) ns
tdc(CLK) Duty cycle error, output clk gpmc_clk -500 500 ps
tj(CLK) Jitter standard deviation(15), output clock gpmc_clk 33.30 ps
tR(CLK) Rise time, output clock gpmc_clk 1.6 ns
tF(CLK) Fall time, output clock gpmc_clk 1.6 ns
tR(DO) Rise time, output data 2 ns
tF(DO) Fall time, output data 2 ns
F2 td(CLKH-nCSV) Delay time, gpmc_clk rising edge to gpmc_ncsx(11) transition F(6) - 1.9 F(6) + 3.3 ns
F3 td(CLKH-nCSIV) Delay time, gpmc_clk rising edge to gpmc_ncsx(11) invalid E(5) - 1.9 E(5) + 3.3 ns
F4 td(ADDV-CLK) Delay time, address bus valid to gpmc_clk first edge B(2) - 4.1 B(2) + 2.1 ns
F5 td(CLKH-ADDIV) Delay time, gpmc_clk rising edge to gpmc_a[16:1] invalid -2.103 ns
F6 td(nBEV-CLK) Delay time, gpmc_nbe0_cle, gpmc_nbe1 valid to gpmc_clk first edge B(2) - 1.37 B(2) + 2.1 ns
F7 td(CLKH-nBEIV) Delay time, gpmc_clk rising edge to gpmc_nbe0_cle, gpmc_nbe1 invalid D(4) - 2.1 D(4) + 1.1 ns
F8 td(CLKH-nADV) Delay time, gpmc_clk rising edge to gpmc_nadv_ale transition G(7) - 1.9 G(7) + 4.1 ns
F9 td(CLKH-nADVIV) Delay time, gpmc_clk rising edge to gpmc_nadv_ale invalid D(4) - 1.9 D(4) + 4.1 ns
F10 td(CLKH-nOE) Delay time, gpmc_clk rising edge to gpmc_noe transition H(8) - 2.1 H(8) + 2.1 ns
F11 td(CLKH-nOEIV) Delay time, gpcm rising edge to gpmc_noe invalid E(5) - 2.1 E(5) + 2.1 ns
F14 td(CLKH-nWE) Delay time, gpmc_clk rising edge to gpmc_nwe transition I(9) - 1.9 I(9) + 4.1 ns
F15 td(CLKH-Data) Delay time, gpmc_clk rising edge to data bus transition J(10) - 2.1 J(10) + 1.1 ns
F17 td(CLKH-nBE) Delay time, gpmc_clk rising edge to gpmc_nbex_cle transition J(10) - 2.1 J(10) + 1.1 ns
F18 tW(nCSV) Pulse duration, gpmc_ncsx(11) low Read A(1) ns
Write A(1) ns
F19 tW(nBEV) Pulse duration, gpmc_nbe0_cle, gpmc_nbe1 low Read C(3) ns
Write C(3) ns
F20 tW(nADVV) Pulse duration, gpmc_nadv_ale low Read K(13) ns
Write K(13) ns
F23 td(CLKH-IODIR) Delay time, gpmc_clk rising edge to gpmc_io_dir high (IN direction) H(8) - 2.1 H(8) + 4.1 ns
F24 td(CLKH-IODIRIV) Delay time, gpmc_clk rising edge to gpmc_io_dir low (OUT direction) M(16) - 2.1 M(16) + 4.1 ns
(1) For single read: A = (CSRdOffTime - CSOnTime) * (TimeParaGranularity + 1) * GPMC_FCLK period
For burst read: A = (CSRdOffTime - CSOnTime + (n 1) * PageBurstAccessTime) * (TimeParaGranularity + 1) * GPMC_FCLK period
For burst write: A = (CSWrOffTime - CSOnTime + (n 1) * PageBurstAccessTime) * (TimeParaGranularity + 1) * GPMC_FCLK period with n being the page burst access number.
(2) B = ClkActivationTime * GPMC_FCLK
(3) For single read: C = RdCycleTime * (TimeParaGranularity + 1) * GPMC_FCLK
For burst read: C = (RdCycleTime + (n 1) * PageBurstAccessTime) * (TimeParaGranularity + 1) * GPMC_FCLK
For burst write: C = (WrCycleTime + (n 1) * PageBurstAccessTime) * (TimeParaGranularity + 1) * GPMC_FCLK with n being the page burst access number.
(4) For single read: D = (RdCycleTime - AccessTime) * (TimeParaGranularity + 1) * GPMC_FCLK
For burst read: D = (RdCycleTime - AccessTime) * (TimeParaGranularity + 1) * GPMC_FCLK
For burst write: D = (WrCycleTime - AccessTime) * (TimeParaGranularity + 1) * GPMC_FCLK
(5) For single read: E = (CSRdOffTime - AccessTime) * (TimeParaGranularity + 1) * GPMC_FCLK
For burst read: E = (CSRdOffTime - AccessTime) * (TimeParaGranularity + 1) * GPMC_FCLK
For burst write: E = (CSWrOffTime - AccessTime) * (TimeParaGranularity + 1) * GPMC_FCLK
(6) For nCS falling edge (CS activated):
  • Case GpmcFCLKDivider = 0:
    • F = 0.5 * CSExtraDelay * GPMC_FCLK
  • Case GpmcFCLKDivider = 1:
    • F = 0.5 * CSExtraDelay * GPMC_FCLK if (ClkActivationTime and CSOnTime are odd) or (ClkActivationTime and CSOnTime are even)
    • F = (1 + 0.5 * CSExtraDelay) * GPMC_FCLK otherwise
  • Case GpmcFCLKDivider = 2:
    • F = 0.5 * CSExtraDelay * GPMC_FCLK if ((CSOnTime - ClkActivationTime) is a multiple of 3)
    • F = (1 + 0.5 * CSExtraDelay) * GPMC_FCLK if ((CSOnTime - ClkActivationTime - 1) is a multiple of 3)
    • F = (2 + 0.5 * CSExtraDelay) * GPMC_FCLK if ((CSOnTime - ClkActivationTime - 2) is a multiple of 3)
(7) For ADV falling edge (ADV activated):
  • Case GpmcFCLKDivider = 0:
    • G = 0.5 * ADVExtraDelay * GPMC_FCLK
  • Case GpmcFCLKDivider = 1:
    • G = 0.5 * ADVExtraDelay * GPMC_FCLK if (ClkActivationTime and ADVOnTime are odd) or (ClkActivationTime and ADVOnTime are even)
    • G = (1 + 0.5 * ADVExtraDelay) * GPMC_FCLK otherwise
  • Case GpmcFCLKDivider = 2:
    • G = 0.5 * ADVExtraDelay * GPMC_FCLK if ((ADVOnTime - ClkActivationTime) is a multiple of 3)
    • G = (1 + 0.5 * ADVExtraDelay) * GPMC_FCLK if ((ADVOnTime - ClkActivationTime - 1) is a multiple of 3)
    • G = (2 + 0.5 * ADVExtraDelay) * GPMC_FCLK if ((ADVOnTime --ClkActivationTime - 2) is a multiple of 3)

For ADV rising edge (ADV deactivated) in Reading mode:
  • Case GpmcFCLKDivider = 0:
    • G = 0.5 * ADVExtraDelay * GPMC_FCLK
  • Case GpmcFCLKDivider = 1:
    • G = 0.5 * ADVExtraDelay * GPMC_FCLK if (ClkActivationTime and ADVRdOffTime are odd) or (ClkActivationTime and ADVRdOffTime are even)
    • G = (1 + 0.5 * ADVExtraDelay) * GPMC_FCLK otherwise
  • Case GpmcFCLKDivider = 2:
    • G = 0.5 * ADVExtraDelay * GPMC_FCLK if ((ADVRdOffTime - ClkActivationTime) is a multiple of 3)
    • G = (1 + 0.5 * ADVExtraDelay) * GPMC_FCLK if ((ADVRdOffTime --ClkActivationTime --1) is a multiple of 3)
    • G = (2 + 0.5 * ADVExtraDelay) * GPMC_FCLK if ((ADVRdOffTime --ClkActivationTime - 2) is a multiple of 3)

For ADV rising edge (ADV deactivated) in Writing mode:
  • Case GpmcFCLKDivider = 0:
    • G = 0.5 * ADVExtraDelay * GPMC_FCLK
  • Case GpmcFCLKDivider = 1:
    • G = 0.5 * ADVExtraDelay * GPMC_FCLK if (ClkActivationTime and ADVWrOffTime are odd) or (ClkActivationTime and ADVWrOffTime are even)
    • G = (1 + 0.5 * ADVExtraDelay) * GPMC_FCLK otherwise
  • Case GpmcFCLKDivider = 2:
    • G = 0.5 * ADVExtraDelay * GPMC_FCLK if ((ADVWrOffTime - ClkActivationTime) is a multiple of 3)
    • G = (1 + 0.5 * ADVExtraDelay) * GPMC_FCLK if ((ADVWrOffTime - ClkActivationTime - 1) is a multiple of 3)
    • G = (2 + 0.5 * ADVExtraDelay) * GPMC_FCLK if ((ADVWrOffTime - ClkActivationTime - 2) is a multiple of 3)
(8) For OE falling edge (OE activated) / IO DIR rising edge (Data Bus input direction):
  • Case GpmcFCLKDivider = 0:
    • H = 0.5 * OEExtraDelay * GPMC_FCLK
  • Case GpmcFCLKDivider = 1:
    • H = 0.5 * OEExtraDelay * GPMC_FCLK if (ClkActivationTime and OEOnTime are odd) or (ClkActivationTime and OEOnTime are even)
    • H = (1 + 0.5 * OEExtraDelay) * GPMC_FCLK otherwise
  • Case GpmcFCLKDivider = 2:
    • H = 0.5 * OEExtraDelay * GPMC_FCLK if ((OEOnTime - ClkActivationTime) is a multiple of 3)
    • H = (1 + 0.5 * OEExtraDelay) * GPMC_FCLK if ((OEOnTime - ClkActivationTime - 1) is a multiple of 3)
    • H = (2 + 0.5 * OEExtraDelay) * GPMC_FCLK if ((OEOnTime - ClkActivationTime - 2) is a multiple of 3)

For OE rising edge (OE deactivated):
  • GpmcFCLKDivider = 0:
    • H = 0.5 * OEExtraDelay * GPMC_FCLK
  • Case GpmcFCLKDivider = 1:
    • H = 0.5 * OEExtraDelay * GPMC_FC if (ClkActivationTime and OEOffTime are odd) or (ClkActivationTime and OEOffTime are even)
    • H = (1 + 0.5 * OEExtraDelay) * GPMC_FCLK otherwise
  • Case GpmcFCLKDivider = 2:
    • H = 0.5 * OEExtraDelay * GPMC_FCLK if ((OEOffTime - ClkActivationTime) is a multiple of 3)
    • H = (1 + 0.5 * OEExtraDelay) * GPMC_FCLK if ((OEOffTime - ClkActivationTime - 1) is a multiple of 3)
    • H = (2 + 0.5 * OEExtraDelay) * GPMC_FCLK if ((OEOffTime - ClkActivationTime - 2) is a multiple of 3)
(9) For WE falling edge (WE activated):
  • Case GpmcFCLKDivider = 0:
    • I = 0.5 * WEExtraDelay * GPMC_FCLK
  • Case GpmcFCLKDivider = 1:
    • I = 0.5 * WEExtraDelay * GPMC_FCLK if (ClkActivationTime and WEOnTime are odd) or (ClkActivationTime and WEOnTime are even)
    • I = (1 + 0.5 * WEExtraDelay) * GPMC_FCLK otherwise
  • Case GpmcFCLKDivider = 2:
    • I = 0.5 * WEExtraDelay * GPMC_FCLK if ((WEOnTime - ClkActivationTime) is a multiple of 3)
    • I = (1 + 0.5 * WEExtraDelay) * GPMC_FCLK if ((WEOnTime --ClkActivationTime - 1) is a multiple of 3)
    • I = (2 + 0.5 * WEExtraDelay) * GPMC_FCLK if ((WEOnTime - ClkActivationTime - 2) is a multiple of 3)

For WE rising edge (WE deactivated):
  • Case GpmcFCLKDivider = 0:
    • I = 0.5 * WEExtraDelay * GPMC_FCLK
  • Case GpmcFCLKDivider = 1:
    • I = 0.5 * WEExtraDelay * GPMC_FCLK if (ClkActivationTime and WEOffTime are odd) or (ClkActivationTime and WEOffTime are even)
    • I = (1 + 0.5 * WEExtraDelay) * GPMC_FCLK otherwise
  • Case GpmcFCLKDivider = 2:
    • I = 0.5 * WEExtraDelay * GPMC_FCLK if ((WEOffTime - ClkActivationTime) is a multiple of 3)
    • I = (1 + 0.5 * WEExtraDelay) * GPMC_FCLK if ((WEOffTime - ClkActivationTime - 1) is a multiple of 3)
    • I = (2 + 0.5 * WEExtraDelay) * GPMC_FCLK if ((WEOffTime - ClkActivationTime - 2) is a multiple of 3)
(10) J = GPMC_FCLK period
(11) In gpmc_ncsx, x is equal to 0, 1, 2, 3, 4, 5, 6, or 7. In gpmc_waitx, x is equal to 0, 1, 2, or 3.
(12) P = gpmc_clk period
(13) For read: K = (ADVRdOffTime - ADVOnTime) * (TimeParaGranularity + 1) * GPMC_FCLK
For write: K = (ADVWrOffTime - ADVOnTime) * (TimeParaGranularity + 1) * GPMC_FCLK
(14) Related to the gpmc_clk output clock maximum and minimum frequencies programmable in the I/F module by setting the GPMC_CONFIG1_CSx configuration register bit field GpmcFCLKDivider.
(15) The jitter probability density can be approximated by a Gaussian function.
(16) M = (RdCycleTime - AccessTime) * (TimeParaGranularity + 1) * GPMC_FCLK
Above M parameter expression is given as one example of GPMC programming. IO DIR signal will go from IN to OUT after both RdCycleTime and BusTurnAround completion. Behavior of IO direction signal does depend on kind of successive Read/Write accesses performed to Memory and multiplexed or non-multiplexed memory addressing scheme, bus keeping feature enabled or not. IO DIR behavior is automatically handled by GPMC controller.
SWPS030-021.gif
In gpmc_ncsx, x is equal to 0, 1, 2, 3, 4, 5, 6, or 7. In gpmc_waitx, x is equal to 0, 1, 2, or 3.
Figure 6-2 GPMC/NOR Flash Synchronous Single Read (GpmcFCLKDivider = 0)
SWPS030-022.gif
In gpmc_ncsx, x is equal to 0, 1, 2, 3, 4, 5, 6, or 7. In gpmc_waitx, x is equal to 0, 1, 2, or 3.
Figure 6-3 GPMC/NOR Flash Synchronous Burst Read 4x16-bit (GpmcFCLKDivider = 0)
SWPS030-023.gif
In gpmc_ncsx, x is equal to 0, 1, 2, 3, 4, 5, 6, or 7. In gpmc_waitx, x is equal to 0, 1, 2, or 3.
Figure 6-4 GPMC/NOR Flash Synchronous Burst Write (GpmcFCLKDivider = 0)
SWPS030-024.gif
In gpmc_ncsx, x is equal to 0, 1, 2, 3, 4, 5, 6, or 7. In gpmc_waitx, x is equal to 0, 1, 2, or 3.
Figure 6-5 GPMC/Multiplexed NOR Flash Synchronous Burst Read
SWPS030-025.gif
In gpmc_ncsx, x is equal to 0, 1, 2, 3, 4, 5, 6, or 7. In gpmc_waitx, x is equal to 0, 1, 2, or 3.
Figure 6-6 GPMC/Multiplexed NOR Flash Synchronous Burst Write

6.4.1.2 GPMC/NOR Flash Interface Asynchronous Timing

Table 6-5 through Table 6-8 assume testing over the recommended operating conditions and electrical characteristic conditions.

Table 6-5 GPMC/NOR Flash Asynchronous Mode Timing Conditions

TIMING CONDITION PARAMETER VALUE UNIT
Input Conditions
tR Input signal rise time 1.8 ns
tF Input signal fall time 1.8 ns
Output Conditions
CLOAD Output load capacitance 30 pF

Table 6-6 GPMC/NOR Flash Interface Asynchronous Timing – Internal Parameters(1)(2)

NO. PARAMETER 1.8V,3.3V UNIT
MIN MAX
FI1 Maximum output data generation delay from internal functional clock 6.5 ns
FI2 Maximum input data capture delay by internal functional clock 4 ns
FI3 Maximum device select generation delay from internal functional clock 6.5 ns
FI4 Maximum address generation delay from internal functional clock 6.5 ns
FI5 Maximum address valid generation delay from internal functional clock 6.5 ns
FI6 Maximum byte enable generation delay from internal functional clock 6.5 ns
FI7 Maximum output enable generation delay from internal functional clock 6.5 ns
FI8 Maximum write enable generation delay from internal functional clock 6.5 ns
FI9 Maximum functional clock skew 100 ps
(1) The internal parameters table must be used to calculate Data Access Time stored in the corresponding CS register bit field.
(2) Internal parameters are referred to the GPMC functional internal clock which is not provided externally.

Table 6-7 GPMC/NOR Flash Interface Timing Requirements – Asynchronous Mode

NO. PARAMETER 1.8V,3.3V UNIT
MIN MAX
FA5(1) tacc(DAT) Data maximum access time H(5) GPMC_FCLK cycles
FA20(3) tacc1-pgmode(DAT) Page mode successive data maximum access time P(4) GPMC_FCLK cycles
FA21(2) tacc2-pgmode(DAT) Page mode first data maximum access time H(5) GPMC_FCLK cycles
(1) The FA5 parameter provides the amount of time required to internally sample input Data. It is expressed in number of GPMC functional clock cycles. From start of read cycle and after FA5 functional clock cycles, input Data is internally sampled by active functional clock edge. FA5 value must be stored inside the AccessTime register bit field.
(2) The FA21 parameter shows amount of time required to internally sample first input Page Data. It is expressed in number of GPMC functional clock cycles. From start of read cycle and after FA21 functional clock cycles, First input Page Data is internally sampled by active functional clock edge. FA21 value must be stored inside the AccessTime register bit field.
(3) The FA20 parameter provides amount of time required to internally sample successive input Page Data. It is expressed in number of GPMC functional clock cycles. After each access to input Page Data, next input Page Data is internally sampled by active functional clock edge after FA20 functional clock cycles. The FA20 value must be stored in the PageBurstAccessTime register bit field.
(4) P = PageBurstAccessTime * (TimeParaGranularity + 1)
(5) H = AccessTime * (TimeParaGranularity + 1)

Table 6-8 GPMC/NOR Flash Interface Switching Characteristics – Asynchronous Mode

NO. PARAMETER 1.8V/ 3.3V UNIT
MIN MAX
tR(DO) Rise time, output data 2.0 ns
tF(DO) Fall time, output data 2.0 ns
FA0 tW(nBEV) Pulse duration, gpmc_nbe0_cle, gpmc_nbe1 valid time Read N(12) ns
Write N(12) ns
FA1 tW(nCSV) Pulse duration, gpmc_ncsx(13) v low Read A(1) ns
Write A(1) ns
FA3 td(nCSV-nADVIV) Delay time, gpmc_ncsx(13) valid to gpmc_nadv_ale invalid Read B(2) – 0.2 B(2) + 2.0 ns
Write B(2) – 0.2 B(2) + 2.0 ns
FA4 td(nCSV-nOEIV) Delay time, gpmc_ncsx(13) valid to gpmc_noe invalid (Single read) C(3) – 0.2 C(3) + 2.0 ns
FA9 td(AV-nCSV) Delay time, address bus valid to gpmc_ncsx(13) valid J(9) – 0.2 J(9) + 2.0 ns
FA10 td(nBEV-nCSV) Delay time, gpmc_nbe0_cle, gpmc_nbe1 valid to gpmc_ncsx(13) valid J(9) – 0.2 J(9) + 2.0 ns
FA12 td(nCSV-nADVV) Delay time, gpmc_ncsx(13) valid to gpmc_nadv_ale valid K(10) – 0.2 K(10) + 2.0 ns
FA13 td(nCSV-nOEV) Delay time, gpmc_ncsx(13) valid to gpmc_noe valid L(11) – 0.2 L(11) + 2.0 ns
FA14 td(nCSV-IODIR) Delay time, gpmc_ncsx(13) valid to gpmc_io_dir high L(11) – 0.2 L(11) + 2.0 ns
FA15 td(nCSV-IODIR) Delay time, gpmc_ncsx(13) valid to gpmc_io_dir low M(14) – 0.2 M(14) + 2.0 ns
FA16 tw(AIV) Address invalid duration between 2 successive R/W accesses G(7) ns
FA18 td(nCSV-nOEIV) Delay time, gpmc_ncsx(13) valid to gpmc_noe invalid (Burst read) I(8) – 0.2 I(8) + 2.0 ns
FA20 tw(AV) Pulse duration, address valid – 2nd, 3rd, and 4th accesses D(4) ns
FA25 td(nCSV-nWEV) Delay time, gpmc_ncsx(13) valid to gpmc_nwe valid E(5) – 0.2 E(5) + 2.0 ns
FA27 td(nCSV-nWEIV) Delay time, gpmc_ncsx(13) valid to gpmc_nwe invalid F(6) – 0.2 F(6) + 2.0 ns
FA28 td(nWEV-DV) Delay time, gpmc_ new valid to data bus valid 2.0 ns
FA29 td(DV-nCSV) Delay time, data bus valid to gpmc_ncsx(13) valid J(9) – 0.2 J(9) + 2.0 ns
FA37 td(nOEV-AIV) Delay time, gpmc_noe valid to gpmc_a[16:1]_d[15:0] address phase end 2.0 ns
  1. For single read: A = (CSRdOffTime – CSOnTime) * (TimeParaGranularity + 1) * GPMC_FCLK
    For single write: A = (CSWrOffTime – CSOnTime) * (TimeParaGranularity + 1) * GPMC_FCLK
    For burst read: A = (CSRdOffTime – CSOnTime + (n – 1) * PageBurstAccessTime) * (TimeParaGranularity + 1) * GPMC_FCLK
    For burst write: A = (CSWrOffTime – CSOnTime + (n – 1) * PageBurstAccessTime) * (TimeParaGranularity + 1) * GPMC_FCLK with n being the page burst access number
  2. For reading: B = ((ADVRdOffTime – CSOnTime) * (TimeParaGranularity + 1) + 0.5 * (ADVExtraDelay – CSExtraDelay)) * GPMC_FCLK
    For writing: B = ((ADVWrOffTime – CSOnTime) * (TimeParaGranularity + 1) + 0.5 * (ADVExtraDelay – CSExtraDelay)) * GPMC_FCLK
  3. C = ((OEOffTime – CSOnTime) * (TimeParaGranularity + 1) + 0.5 * (OEExtraDelay – CSExtraDelay)) * GPMC_FCLK
  4. D = PageBurstAccessTime * (TimeParaGranularity + 1) * GPMC_FCLK
  5. E = ((WEOnTime – CSOnTime) * (TimeParaGranularity + 1) + 0.5 * (WEExtraDelay – CSExtraDelay)) * GPMC_FCLK
  6. F = ((WEOffTime – CSOnTime) * (TimeParaGranularity + 1) + 0.5 * (WEExtraDelay – CSExtraDelay)) * GPMC_FCLK
  7. G = Cycle2CycleDelay * GPMC_FCLK
  8. I = ((OEOffTime + (n – 1) * PageBurstAccessTime – CSOnTime) * (TimeParaGranularity + 1) + 0.5 * (OEExtraDelay – CSExtraDelay)) * GPMC_FCLK
  9. J = (CSOnTime * (TimeParaGranularity + 1) + 0.5 * CSExtraDelay) * GPMC_FCLK
  10. K = ((ADVOnTime – CSOnTime) * (TimeParaGranularity + 1) + 0.5 * (ADVExtraDelay – CSExtraDelay)) * GPMC_FCLK
  11. L = ((OEOnTime – CSOnTime) * (TimeParaGranularity + 1) + 0.5 * (OEExtraDelay – CSExtraDelay)) * GPMC_FCLK
  12. For single read: N = RdCycleTime * (TimeParaGranularity + 1) * GPMC_FCLK
    For single write: N = WrCycleTime * (TimeParaGranularity + 1) * GPMC_FCLK
    For burst read: N = (RdCycleTime + (n – 1) * PageBurstAccessTime) * (TimeParaGranularity + 1) * GPMC_FCLK
    For burst write: N = (WrCycleTime + (n – 1) * PageBurstAccessTime) * (TimeParaGranularity + 1) * GPMC_FCLK
  13. In gpmc_ncsx, x is equal to 0, 1, 2, 3, 4, 5, 6, or 7.
  14. M = ((RdCycleTime - CSOnTime) * (TimeParaGranularity + 1) - 0.5 * CSExtraDelay) * GPMC_FCLK
    Above M parameter expression is given as one example of GPMC programming. IO DIR signal will go from IN to OUT after both RdCycleTime and BusTurnAround completion. Behavior of IO direction signal does depend on kind of successive Read/Write accesses performed to Memory and multiplexed or non-multiplexed memory addressing scheme, bus keeping feature enabled or not. IO DIR behavior is automatically handled by GPMC controller.
SWPS030-026.gifFigure 6-7 GPMC/NOR Flash – Asynchronous Read – Single Word Timing(1)(2)(3)
  1. In gpmc_ncsx, x is equal to 0, 1, 2, 3, 4, 5, 6, or 7. In gpmc_waitx, x is equal to 0, 1, 2, or 3.
  2. FA5 parameter provides amount of time required to internally sample input data. It is expressed in number of GPMC functional clock cycles. From start of read cycle and after FA5 functional clock cycles, input data is internally sampled by active functional clock edge. FA5 value must be stored inside AccessTime register bit field.
  3. GPMC_FCLK is an internal clock (GPMC functional clock) not provided externally.
SWPS030-027.gifFigure 6-8 GPMC/NOR Flash – Asynchronous Read – 32-bit Timing(1)(2)(3)
  1. In gpmc_ncsx, x is equal to 0, 1, 2, 3, 4, 5, 6, or 7. In gpmc_waitx, x is equal to 0, 1, 2, or 3.
  2. FA5 parameter provides amount of time required to internally sample input data. It is expressed in number of GPMC functional clock cycles. From start of read cycle and after FA5 functional clock cycles, input data is internally sampled by active functional clock edge. FA5 value must be stored inside AccessTime register bit field.
  3. GPMC_FCLK is an internal clock (GPMC functional clock) not provided externally.
SWPS030-028.gifFigure 6-9 GPMC/NOR Flash – Asynchronous Read – Page Mode 4x16-bit Timing(1)(2)(3)(4)
  1. In gpmc_ncsx, x is equal to 0, 1, 2, 3, 4, 5, 6, or 7. In gpmc_waitx, x is equal to 0, 1, 2, or 3.
  2. FA21 parameter provides amount of time required to internally sample first input page data. It is expressed in number of GPMC functional clock cycles. From start of read cycle and after FA21 functional clock cycles, first input page data is internally sampled by active functional clock edge. FA21 value must be stored inside AccessTime register bit field.
  3. FA20 parameter provides amount of time required to internally sample successive input page data. It is expressed in number of GPMC functional clock cycles. After each access to input page data, next input page data is internally sampled by active functional clock edge after FA20 functional clock cycles. FA20 is also the duration of address phases for successive input page data (excluding first input page data). FA20 value must be stored in PageBurstAccessTime register bit field.
  4. GPMC_FCLK is an internal clock (GPMC functional clock) not provided externally.
SWPS030-029.gif
In gpmc_ncsx, x is equal to 0, 1, 2, 3, 4, 5, 6, or 7. In gpmc_waitx, x is equal to 0, 1, 2, or 3.
Figure 6-10 GPMC/NOR Flash – Asynchronous Write – Single Word Timing
SWPS030-030.gifFigure 6-11 GPMC/Multiplexed NOR Flash – Asynchronous Read – Single Word Timing(1)(2)(3)
  1. In gpmc_ncsx, x is equal to 0, 1, 2, 3, 4, 5, 6, or 7. In gpmc_waitx, x is equal to 0, 1, 2, or 3.
  2. FA5 parameter provides amount of time required to internally sample input data. It is expressed in number of GPMC functional clock cycles. From start of read cycle and after FA5 functional clock cycles, input data is internally sampled by active functional clock edge. FA5 value must be stored inside AccessTime register bit field.
  3. GPMC_FCLK is an internal clock (GPMC functional clock) not provided externally.
SWPS030-031.gif
In gpmc_ncsx, x is equal to 0, 1, 2, 3, 4, 5, 6, or 7. In gpmc_waitx, x is equal to 0, 1, 2, or 3.
Figure 6-12 GPMC/Multiplexed NOR Flash – Asynchronous Write – Single Word Timing

6.4.1.3 GPMC/NAND Flash Interface Timing

Table 6-9 through Table 6-12 assume testing over the recommended operating conditions and electrical characteristic conditions.

Table 6-9 GPMC/NAND Flash Asynchronous Mode Timing Conditions

TIMING CONDITION PARAMETER 1.8V, 3.3V UNIT
MIN MAX
Input Conditions
tR Input signal rise time 1.8 ns
tF Input signal fall time 1.8 ns
CLOAD Output load capacitance 30 pF

Table 6-10 GPMC/NAND Flash Interface Asynchronous Timing Internal Parameters(1)(2)

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
GNFI1 Maximum output data generation delay from internal functional clock 6.5 ns
GNFI2 Maximum input data capture delay by internal functional clock 4 ns
GNFI3 Maximum device select generation delay from internal functional clock 6.5 ns
GNFI4 Maximum address latch enable generation delay from internal functional clock 6.5 ns
GNFI5 Maximum command latch enable generation delay from internal functional clock 6.5 ns
GNFI6 Maximum output enable generation delay from internal functional clock 6.5 ns
GNFI7 Maximum write enable generation delay from internal functional clock 6.5 ns
GNFI8 Maximum functional clock skew 100 ps
(1) Internal parameters table must be used to calculate data access time stored in the corresponding CS register bit field.
(2) Internal parameters are referred to the GPMC functional internal clock which is not provided externally.

Table 6-11 GPMC/NAND Flash Interface Timing Requirements

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
GNF12(1) tacc(DAT) Data maximum access time J(2) GPMC_FCLK cycles
(1) The GNF12 parameter provides the amount of time required to internally sample input data. It is expressed in number of GPMC functional clock cycles. From start of the read cycle and after GNF12 functional clock cycles, input data is internally sampled by the active functional clock edge. The GNF12 value must be stored inside AccessTime register bit field.
(2) J = AccessTime * (TimeParaGranularity + 1)

Table 6-12 GPMC/NAND Flash Interface Switching Characteristics

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
tR(DO) Rise time, output data 2.0 ns
tF(DO) Fall time, output data 2.0 ns
GNF0 tw(nWEV) Pulse duration, gpmc_nwe valid time A(1) ns
GNF1 td(nCSV-nWEV) Delay time, gpmc_ncsx(13) valid to gpmc_nwe valid B(2) - 0.2 B(2) + 2.0 ns
GNF2 tw(CLEH-nWEV) Delay time, gpmc_nbe0_cle high to gpmc_nwe valid C(3) - 0.2 C(3) + 2.0 ns
GNF3 tw(nWEV-DV) Delay time, gpmc_d[15:0] valid to gpmc_nwe valid D(4) - 0.2 D(4) + 2.0 ns
GNF4 tw(nWEIV-DIV) Delay time, gpmc_nwe invalid to gpmc_d[15:0] invalid E(5) - 0.2 E(5) + 2.0 ns
GNF5 tw(nWEIV-CLEIV) Delay time, gpmc_nwe invalid to gpmc_nbe0_cle invalid F(6) - 0.2 F(6) + 2.0 ns
GNF6 tw(nWEIV-nCSIV) Delay time, gpmc_nwe invalid to gpmc_ncsx(13) invalid G(7) - 0.2 G(7) + 2.0 ns
GNF7 tw(ALEH-nWEV) Delay time, gpmc_nadv_ale High to gpmc_nwe valid C(3) - 0.2 C(3) + 2.0 ns
GNF8 tw(nWEIV-ALEIV) Delay time, gpmc_nwe invalid to gpmc_nadv_ale invalid F(6) - 0.2 F(6) + 2.0 ns
GNF9 tc(nWE) Cycle time, Write cycle time H(8) ns
GNF10 td(nCSV-nOEV) Delay time, gpmc_ncsx(13) valid to gpmc_noe valid I(9) - 0.2 I(9) + 2.0 ns
GNF13 tw(nOEV) Pulse duration, gpmc_noe valid time K(10) ns
GN F14 tc(nOE) Cycle time, Read cycle time L(11) ns
GNF15 tw(nOEIV-nCSIV) Delay time, gpmc_noe invalid to gpmc_ncsx(13) invalid M(12) - 0.2 M(12) + 2.0 ns
  1. A = (WEOffTime – WEOnTime) * (TimeParaGranularity + 1) * GPMC_FCLK
  2. B = ((WEOnTime – CSOnTime) * (TimeParaGranularity + 1) + 0.5 * (WEExtraDelay – CSExtraDelay)) * GPMC_FCLK
  3. C = ((WEOnTime – ADVOnTime) * (TimeParaGranularity + 1) + 0.5 * (WEExtraDelay – ADVExtraDelay)) * GPMC_FCLK
  4. D = (WEOnTime * (TimeParaGranularity + 1) + 0.5 * WEExtraDelay ) * GPMC_FCLK
  5. E = (WrCycleTime – WEOffTime * (TimeParaGranularity + 1) – 0.5 * WEExtraDelay ) * GPMC_FCLK
  6. F = (ADVWrOffTime – WEOffTime * (TimeParaGranularity + 1) + 0.5 * (ADVExtraDelay – WEExtraDelay ) * GPMC_FCLK
  7. G = (CSWrOffTime – WEOffTime * (TimeParaGranularity + 1) + 0.5 * (CSExtraDelay – WEExtraDelay ) * GPMC_FCLK
  8. H = WrCycleTime * (1 + TimeParaGranularity) * GPMC_FCLK
  9. I = ((OEOnTime – CSOnTime) * (TimeParaGranularity + 1) + 0.5 * (OEExtraDelay – CSExtraDelay)) * GPMC_FCLK
  10. K = (OEOffTime – OEOnTime) * (1 + TimeParaGranularity) * GPMC_FCLK
  11. L = RdCycleTime * (1 + TimeParaGranularity) * GPMC_FCLK
  12. M = (CSRdOffTime – OEOffTime * (TimeParaGranularity + 1) + 0.5 * (CSExtraDelay – OEExtraDelay ) * GPMC_FCLK
  13. In gpmc_ncsx, x is equal to 0, 1, 2, 3, 4, 5, 6, or 7.
SWPS030-032.gif
In gpmc_ncsx, x is equal to 0, 1, 2, 3, 4, 5, 6, or 7.
Figure 6-13 GPMC/NAND Flash – Command Latch Cycle Timing
SWPS030-033.gif
In gpmc_ncsx, x is equal to 0, 1, 2, 3, 4, 5, 6, or 7.
Figure 6-14 GPMC/NAND Flash – Address Latch Cycle Timing
SWPS030-034.gifFigure 6-15 GPMC/NAND Flash – Data Read Cycle Timing(1)(2)(3)
  1. The GNF12 parameter provides amount of time required to internally sample input data. It is expressed in number of GPMC functional clock cycles. From start of read cycle and after GNF12 functional clock cycles, input data is internally sampled by active functional clock edge. The GNF12 value must be stored inside AccessTime register bit field.
  2. GPMC_FCLK is an internal clock (GPMC functional clock) not provided externally.
  3. In gpmc_ncsx, x is equal to 0, 1, 2, 3, 4, 5, 6, or 7. In gpmc_waitx, x is equal to 0 ,1, 2, or 3.
SWPS030-035.gif
In gpmc_ncsx, x is equal to 0, 1, 2, 3, 4, 5, 6, or 7. In gpmc_waitx, x is equal to 0 or 1.
Figure 6-16 GPMC/NAND Flash – Data Write Cycle Timing

6.4.2 SDRAM Controller (SDRC)

The SDRC is a dedicated interface to DDR2/LPDDR1 SDRAM that performs the following functions:

  • Buffering of input image data from sensors or video sources
  • Intermediate buffering for processing/resizing of image data in the VPFE
  • Numerous OSD display buffers
  • Intermediate buffering for large raw Bayer data image files while performing image processing functions
  • Buffering for intermediate data while performing video encode and decode functions
  • Storage of executable code for the ARM

The main features of the controller are:

  • Open Core Protocol 2.2 (OCP) compliant [7].
  • Supports JEDEC standard compliant DDR2 [2] and LPDDR1 [4] devices.
    • SDRAM address range over 2 chip selects.
    • Supports following data bus widths:
    • OCP Data Bus Width SDRAM Data Bus Width
      64 and 128-Bit 16, 32, and 64-Bit
    • Supports following CAS latencies:
    • SDRAM Type CAS Latencies
      DDR2 2, 3, 4, 5, and 6
      LPDDR1 2 and 3
    • Supports following number of internal banks:
    • SDRAM Type Internal Banks
      DDR2 1, 2, 4, and 8
      LPDDR1 1, 2, and 4
    • Supports 256, 512, 1024, and 2048-word page sizes.
    • Supports following burst lengths:
    • SDRAM Type Burst Length
      DDR2 8 (4 not supported)
      LPDDR1 8 (2 and 4 not supported)
    • Supports sequential burst type.
    • SDRAM auto initialization from reset or configuration change.
    • Supports Bank Interleaving across both the chip selects.
    • Supports Clock Stop mode for LPDDR1 for low power.
    • Supports Self Refresh and Precharge Power-Down modes for low power.
    • Supports Partial Array Self Refresh and Temperature Controlled Self Refresh modes for low power in LPDDR1.
    • Temperature Controlled Self Refresh is only supported for mobile SDRAM having on-chip temperature sensor.
    • Supports ODT on DDR2.
    • Supports prioritized refresh.
    • Programmable SDRAM refresh rate and backlog counter.
    • Programmable SDRAM timing parameters.
    • Supports only little endian.

6.4.2.1 LPDDR Interface

This section provides the timing specification for the LPDDR interface as a PCB design and manufacturing specification. The design rules constrain PCB trace length, PCB trace skew, signal integrity, cross-talk, and signal timing. These rules, when followed, result in a reliable LPDDR memory system without the need for a complex timing closure process. For more information regarding guidelines for using this LPDDR specification, see the Understanding TI's PCB Routing Rule-Based DDR Timing Specification Application Report (SPRAAV0).

6.4.2.1.1 LPDDR Interface Schematic

Figure 6-17 and Figure 6-18 show the LPDDR interface schematics for a LPDDR memory system. The 1 x16 LPDDR system schematic is identical to Figure 6-17 except that the high word LPDDR device is deleted.

fbd_16_praau5.gifFigure 6-17 AM3517/05 LPDDR High Level Schematic (x16 memories)
fbd_32_praau5.gifFigure 6-18 AM3517/05 LPDDR High Level Schematic (x32 memory)

6.4.2.1.2 Compatible JEDEC LPDDR Devices

Table 6-13 lists the parameters of the JEDEC LPDDR devices that are compatible with this interface. Generally, the LPDDR interface is compatible with x16 and x32 LPDDR333 speed grade LPDDR devices.

Table 6-13 Compatible JEDEC LPDDR Devices

NO. PARAMETER MIN MAX UNIT NOTES
1 JEDEC LPDDR Device Speed Grade LPDDR333 See Note (1)
2 JEDEC LPDDR Device Bit Width 16 32 Bits
3 JEDEC LPDDR Device Count 1 2 Devices See Note (2)
4 JEDEC LPDDR Device Ball Count 60 90 Balls
(1) Higher LPDDR speed grades operating at the specified speeds are supported due to inherent JEDEC LPDDR backwards compatibility.
(2) 1 x16 LPDDR device is used for 16 bit LPDDR memory system. 1x32 or 2x16 LPDDR devices are used for a 32-bit LPDDR memory system.

6.4.2.1.3 PCB Stackup

The minimum stackup required for routing the microprocessor is a six layer stack as listed in Table 6-14. Additional layers may be added to the PCB stack up to accommodate other circuity or to reduce the size of the PCB footprint.

Table 6-14 Minimum PCB Stack Up

LAYER TYPE DESCRIPTION
1 Signal Top Routing Mostly Horizontal
2 Plane Ground
3 Plane Power
4 Signal Internal Routing
5 Plane Ground
6 Signal Bottom Routing Mostly Vertical

Table 6-15 PCB Stack Up Specifications

NO. PARAMETER MIN TYP MAX UNIT NOTES
1 PCB Routing/Plane Layers 6
2 Signal Routing Layers 3
3 Full ground layers under LPDDR routing region 2
4 Number of ground plane cuts allowed within LPDDR routing region 0
5 Number of ground reference planes required for each LPDDR routing 1 layer 1
6 Number of layers between LPDDR routing layer and reference ground 0 plane 0
7 PCB Routing Feature Size 4 Mils
8 PCB Trace Width w 4 Mils
9 PCB BGA escape via pad size 18 Mils
10 PCB BGA escape via hole size 8 Mils
11 Device BGA Pad Size See Note(1)
12 LPDDR Device BGA Pad Size See Note(2)
13 Single Ended Impedance, ZO 50 75 Ω
14 Impedance Control Z-5 Z Z + 5 Ω See Note(3)
(1) Please see the Flip Chip Ball Grid Array Package Reference Guide (SPRU811) for device BGA pad size.
(2) Please see the LPDDR device manufacturer documentation for the LPDDR device BGA pad size.
(3) Z is the nominal singled ended impedance selected for the PCB specified by item 12.

6.4.2.1.4 Placement

Figure 6-19 shows the required placement for the microprocessor as well as the LPDDR devices. The dimensions for Figure 6-19 are defined in Table 6-16. The placement does not restrict the side of the PCB that the devices are mounted on. The ultimate purpose of the placement is to limit the maximum trace lengths and allow for proper routing space. For 1x16 and 1x32 LPDDR memory systems, the second LPDDR device is omitted from the placement.

f1_praau5_sprs550.gifFigure 6-19 AM3517/05 and LPDDR Device Placement

Table 6-16 Placement Specifications

NO. PARAMETER MIN MAX UNIT NOTES
1 X 1440 Mils See Notes(1), (2)
2 Y 1030 Mils See Notes(1), (2)
3 Y Offset 525 Mils See Notes(1),(2),(3)
4 LPDDR Keepout Region See Note(4)
5 Clearance from non-LPDDR signal to LPDDR Keepout Region 4 w See Note(5)
(1) See Figure 6-19 for dimension definitions.
(2) Measurements from center of device to center of LPDDR device.
(3) For 16 bit memory systems it is recommended that Y Offset be as small as possible.
(4) LPDDR keepout region to encompass entire LPDDR routing area.
(5) Non-LPDDR signals allowed within LPDDR keepout region provided they are separated from LPDDR routing layers by a ground plane.

6.4.2.1.5 LPDDR Keep Out Region

The region of the PCB used for the LPDDR circuitry must be isolated from other signals. The LPDDR keep out region is defined for this purpose and is shown in Figure 6-20. The size of this region varies with the placement and LPDDR routing. Additional clearances required for the keep out region are listed in Table 6-16.

f2_praau5.gifFigure 6-20 LPDDR Keepout Region

6.4.2.1.6 Net Classes

Table 6-17 lists the clock net classes for the LPDDR interface. Table 6-18 lists the signal net classes, and associated clock net classes, for the signals in the LPDDR interface. These net classes are used for the termination and routing rules that follow.

Table 6-17 Clock Net Class Definitions

CLOCK NET CLASS PIN NAMES
CK sdrc_clk/sdrc_nclk
DQS0 sdrc_dqs0
DQS1 sdrc_dqs1
DQS2 sdrc_dqs2
DQS3 sdrc_dqs3

Table 6-18 Signal Net Class Definitions

CLOCK NET CLASS ASSOCIATED CLOCK NET CLASS PIN NAMES
ADDR_CTRL CK sdrc_ba, sdrc_a, sdrc_ncs0, sdrc_ncas, sdrc_nras, sdrc_nwe, sdrc_cke0
DQ0 DQS0 sdrc_d, sdrc_dm0
DQ1 DQS1 sdrc_d, sdrc_dm1
DQ2 DQS2 sdrc_d, sdrc_dm2
DQ3 DQS3 sdrc_d, sdrc_dm3

6.4.2.1.7 LPDDR Signal Termination

No terminations of any kind are required in order to meet signal integrity and overshoot requirements. Serial terminators are permitted, if desired, to reduce EMI risk; however, serial terminations are the only type permitted. Table 6-19 lists the specifications for the series terminators.

Table 6-19 LPDDR Signal Terminations

NO. PARAMETER MIN TYP MAX UNIT NOTES
1 CK Net Class 0 10 Ω See Note(1)
2 ADDR_CTRL Net Class 0 22 Zo Ω See Notes(1),(2),(3)
3 Data Byte Net Classes
(DQS0-DQS3, DQ0-DQ3)
0 22 Zo Ω See Notes(1),(2),(3)
(1) Only series termination is permitted, parallel or SST specifically disallowed.
(2) Terminator values larger than typical only recommended to address EMI issues.
(3) Termination value should be uniform across net class.

6.4.2.1.8 LPDDR CK and ADDR_CTRL Routing

Figure 6-21 shows the topology of the routing for the CK and ADDR_CTRL net classes. The route is a balanced T as it is intended that the length of segments B and C be equal. In addition, the length of A should be maximized.

f3_praau5_prs550.gifFigure 6-21 CK and ADDR_CTRL Routing and Topology

Table 6-20 CK and ADDR_CTRL Routing Specification

NO. PARAMETER MIN TYP MAX UNIT NOTES
1 Center to Center CK-CK spacing 2w
2 CK A to B/A to C Skew Length Mismatch 25 Mils See Note(1)
3 CK B to C Skew Length Mismatch 25 Mils
4 Center to Center CK to other
LPDDR trace spacing
4w See Note(2)
5 CK/ADDR_CTRL nominal trace length CACLM-50 CACLM CACLM+50 Mils See Note(3)
6 ADDR_CTRL to CK Skew Length Mismatch 100 Mils
7 ADDR_CTRL to ADDR_CTRL
Skew Length Mismatch
100 Mils
8 Center to Center ADDR_CTRL to other LPDDR trace 4w spacing 4w See Note(2)
9 Center to Center ADDR_CTRL to other ADDR_CTRL 3w trace spacing 3w See Note(2)
10 ADDR_CTRL A to B/A to C Skew Length Mismatch 100 Mils See Note(1)
11 ADDR_CTRL B to C Skew Length Mismatch 100 Mils
(1) Series terminator, if used, should be located closest to device.
(2) Center to center spacing is allowed to fall to minimum (w) for up to 500 mils of routed length to accommodate BGA escape and routing congestion.
(3) CACLM is the longest Manhattan distance of the CK and ADDR_CTRL net classes.

Figure 6-22 shows the topology and routing for the DQS and DQ net classes; the routes are point to point. Skew matching across bytes is not needed nor recommended.

f4_praau5_prs550.gifFigure 6-22 DQS and DQ Routing and Topology

Table 6-21 DQS and DQ Routing Specification(1)

NO. PARAMETER MIN TYP MAX UNIT NOTES
2 DQS E Skew Length Mismatch 25 Mils
3 Center to Center DQS to other LPDDR trace spacing 4w See Note(2)
4 DQS/DQ nominal trace length DQLM - 50 DQLM DQLM + 50 Mils See Note(2)
5 DQ to DQS Skew Length Mismatch 100 Mils
6 DQ to DQ Skew Length Mismatch 100 Mils
7 Center to Center DQ to other LPDDR trace spacing 4w See Note(2)
8 Center to Center DQ to other DQ trace spacing 3w See Note(2),(3)
9 DQ E Skew Length Mismatch 100 Mils
(1) Series terminator, if used, should be located closest to LPDDR.
(2) Center to center spacing is allowed to fall to minimum (w) for up to 500 mils of routed length to accommodate BGA escape and routing congestion.
(3) DQLM is the longest Manhattan distance of the DQS and DQ net classes.

6.4.2.2 DDR2 Interface

This section provides the timing specification for the DDR2 interface as a PCB design and manufacturing specification. The design rules constrain PCB trace length, PCB trace skew, signal integrity, cross-talk, and signal timing. These rules, when followed, result in a reliable DDR2 memory system without the need for a complex timing closure process. For more information regarding guidelines for using this DDR2 specification, Understanding TI's PCB Routing Rule-Based DDR2 Timing Specification (SPRAAV0).

6.4.2.2.1 DDR2 Interface Schematic

Figure 6-23 shows the DDR2 interface schematic for a dual-memory DDR2 system. The single-memory system is shown in Figure 6-24. Pin numbers for the AM3517/05 can be obtained from the pin description section.

6.4.2.2.2 Compatible JEDEC DDR2 Devices

Table 6-22 lists the parameters of the JEDEC DDR2 devices that are compatible with this interface. Generally, the DDR2 interface is compatible with x16 or x32 DDR2 speed grade DDR2-333 devices.

Table 6-22 Compatible JEDEC DDR2 Devices

No. Parameter Min Max Unit Notes
1 JEDEC DDR2 Device Speed Grade DDR2-333 MHz See Note (1)
2 JEDEC DDR2 Device Bit Width x16 x32 Bits
3 JEDEC DDR2 Device Count 1 2 Devices See Note (3)
4 JEDEC DDR2 Device Ball Count 84 92 Balls See Note (2)
(1) Higher DDR2 speed grades operating at the specified speeds are supported due to inherent JEDEC DDR2 backwards compatibility.
(2) 92 ball devices retained for legacy support. New designs should use 84 ball DDR2 devices. Electrically, the 92 and 84 ball DDR2 devices are the same.
(3) Device count indicates number of dies. If a package contains 2 dies, that is the maximum number of devices that can be connected.

6.4.2.2.3 PCB Stackup

The minimum stackup required for routing the AM3517/05 is a six-layer stack as listed in Table 6-23. Additional layers may be added to the PCB stack up to accommodate other circuitry or to reduce the size of the PCB footprint.

Table 6-23 Minimum PCB Stack Up

Layer Type Description
1 Signal Top Routing Mostly Horizontal
2 Plane Ground
3 Plane Power
4 Signal Internal Routing
5 Plane Ground
6 Signal Bottom Routing Mostly Vertical

Complete stack up specifications are provided in Table 6-24.

sprs550-008updated.gifFigure 6-23 DDR2 Dual-Memory High Level Schematic
sprs550-009updated1.gifFigure 6-24 DDR2 Single-Memory High Level Schematic

Table 6-24 PCB Stack Up Specifications

No. Parameter Min Typ Max Unit Notes
1 PCB Routing/Plane Layers 6
2 Signal Routing Layers 3
3 Full ground layers under DDR2 routing Region 2
4 Number of ground plane cuts allowed within DDR routing region 0
5 Number of ground reference planes required for each DDR2 routing layer 1
6 Number of layers between DDR2 routing layer and ground plane 0
7 PCB Routing Feature Size 4 Mils
8 PCB Trace Width w 4 Mils
9 PCB BGA escape via pad size 20 Mils
10 PCB BGA escape via hole size 10 Mils
11 AM3517/05 BGA pad size 12 See Note (1)
12 DDR2 Device BGA pad size See Note (2)
13 Single Ended Impedance, Zo 50 75 Ω
14 Impedance Control Z-5 Z Z+5 Ω See Note (3)
(1) The recommended pad size is 0.3 mm per IPC-7351 specification.
(2) Please refer to IPC standard IPC-7351 or manufacturer's recommendations for correct BGA pad size.
(3) Z is the nominal singled ended impedance selected for the PCB specified by item 12.

6.4.2.2.4 Placement

Figure 6-24 shows the required placement for the DDR2 devices. The dimensions for Figure 6-25 are defined in Table 6-25. The placement does not restrict the side of the PCB that the devices are mounted on. The ultimate purpose of the placement is to limit the maximum trace lengths and allow for proper routing space. For single-memory DDR2 systems, the second DDR2 device is omitted from the placement.

f2_praar3updated.gifFigure 6-25 DDR2 Device Placement

Table 6-25 Placement Specifications

No. Parameter Min Max Unit Notes
1 X 1750 Mils See Notes (1), (2)
2 Y 1280 Mils See Notes (1), (2)
3 Y Offset 650 Mils See Notes (1). (2), (3)
4 DDR2 Keepout Region See Note (4)
5 Clearance from non-DDR2 signal to DDR2 Keepout Region 4 w See Note (5)
(1) See Figure 6-23 for dimension definitions.
(2) Measurements from center of AM3517/05 device to center of DDR2 device.
(3) For single memory systems it is recommended that Y Offset be as small as possible.
(4) DDR2 Keepout region to encompass entire DDR2 routing area
(5) Non-DDR2 signals allowed within DDR2 keepout region provided they are separated from DDR2 routing layers by a ground plane.

6.4.2.2.5 DDR2 Keep Out Region

The region of the PCB used for the DDR2 circuitry must be isolated from other signals. The DDR2 keep out region is defined for this purpose and is shown in Figure 6-26. The size of this region varies with the placement and DDR routing. Additional clearances required for the keep out region are listed in Table 6-25.

f3_praar3updated.gifFigure 6-26 DDR2 Keepout Region

6.4.2.2.6 Bulk Bypass Capacitors

Bulk bypass capacitors are required for moderate speed bypassing of the DDR2 and other circuitry. Table 6-26 contains the minimum numbers and capacitance required for the bulk bypass capacitors. Note that this table only covers the bypass needs of the AM3517/05 and DDR2 interfaces. Additional bulk bypass capacitance may be needed for other circuitry.

Table 6-26 Bulk Bypass Capacitors

No. Parameter Min Max Unit Notes
1 VDDS Bulk Bypass Capacitor Count 3 Devices See Note (1)
2 VDDS Bulk Bypass Total Capacitance 30 uF
3 DDR#1 Bulk Bypass Capacitor Count 1 Devices See Note (1)
4 DDR#1 Bulk Bypass Total Capacitance 22 uF
5 DDR#2 Bulk Bypass Capacitor Count 1 Devices See Notes (1), (2)
6 DDR#2 Bulk Bypass Total Capacitance 22 uF See Note (2)
(1) These devices should be placed near the device they are bypassing, but preference should be given to the placement of the high-speed (HS) bypass caps.
(2) Only used on dual-memory systems

6.4.2.2.7 High-Speed Bypass Capacitors

High-speed (HS) bypass capacitors are critical for proper DDR2 interface operation. It is particularly important to minimize the parasitic series inductance of the HS bypass cap, AM3517/05 DDR2 power, and AM3517/05 DDR2 ground connections. Table 6-27 contains the specification for the HS bypass capacitors as well as for the power connections on the PCB.

6.4.2.2.8 Net Classes

Table 6-28 lists the clock net classes for the DDR2 interface. Table 6-29 lists the signal net classes, and associated clock net classes, for the signals in the DDR2 interface. These net classes are used for the termination and routing rules that follow.

Table 6-27 High-Speed Bypass Capacitors

No. Parameter Min Max Unit Notes
1 HS Bypass Capacitor Package Size 0402 10 Mils See Note (1)
2 Distance from HS bypass capacitor to device being bypassed 250 Mils
3 Number of connection vias for each HS bypass capacitor 2 Vias See Note (4)
4 Trace length from bypass capacitor contact to connection via 1 30 Mils
5 Number of connection vias for each DDR2 device power or ground balls 1 Vias
6 Trace length from DDR2 device power ball to connection via 35 Mils
7 VDDS HS Bypass Capacitor Count 20 Devices See Note (2)
8 VDDS HS Bypass Capacitor Total Capacitance 1.2 μF
9 DDR#1 HS Bypass Capacitor Count 8 Devices See Note (2)
10 DDR#1 HS Bypass Capacitor Total Capacitance 0.4 μF
11 DDR#2 HS Bypass Capacitor Count 8 Devices See Notes (2), (3)
12 DDR#2 HS Bypass Capacitor Total Capacitance 0.4 μF See Note (3)
(1) LxW, 10 mil units, i.e., a 0402 is a 40x20 mil surface mount capacitor
(2) These devices should be placed as close as possible to the device being bypassed.
(3) Only used on dual-memory systems
(4) An additional HS bypass capacitor can share the connection vias only if it is mounted on the opposite side of the board.

Table 6-28 Clock Net Class Definitions

Clock Net Class AM3517/05 Device Pin Names
CK sdrc_clk/sdrc_nclk
DQS0 sdrc_dqs0p /sdrc_dqs0n
DQS1 sdrc_dqs1p /sdrc_dqs1n
DQS2 sdrc_dqs2p/sdrc_dqs2n
DQS3 sdrc_dqs3p/sdrc_dqs3n

Table 6-29 Signal Net Class Definitions

Clock Net Class Associated Clock Net Class AM3517/05 Device Pin Names
ADDR_CTRL CK sdrc_ba[2:0], sdrc_ncs1, sdrc_a[14:0], sdrc_ncs0 , sdrc_ncas, sdrc_nras, sdrc_nwe, sdrc_cke0
DQ0 DQS0 sdrc_d[7:0], sdrc_dm0
DQ1 DQS1 sdrc_d[15:8], sdrc_dm1
DQ2 DQS2 sdrc_d[23:16],sdrc_dm2
DQ3 DQS3 sdrc_d[31:24],sdrc_dm3
SDRC_STRBEN0 CK,DQS0,DQS1 sdrc_strben0, sdrc_strben_dly0
SDRC_STRBEN1 CK,DQS2,DQS3 sdrc_strben1, sdrc_strben_dly1

6.4.2.2.9 DDR2 Signal Termination

No terminations of any kind are required in order to meet signal integrity and overshoot requirements. Serial terminators are permitted, if desired, to reduce EMI risk; however, serial terminations are the only type permitted. Table 6-30 lists the specifications for the series terminators.

Table 6-30 DDR2 Signal Terminations

No. Parameter Min Typ Max Unit Notes
1 CLK Net Class 0 10 Ω See Note (1)
2 ADDR_CTRL Net Class 0 22 Zo Ω See Notes (1), (2), (3)
3 Data Byte Net Classes (DQS0-DQS1, D0-D31) 0 22 Zo Ω See Notes (1), (2), (3)
4 SDRC_STRBENx Net Class (SDRC_STRBENx) 0 10 Zo Ω See Notes (1), (2), (3)
(1) Only series termination is permitted, parallel or SST specifically disallowed.
(2) Terminator values larger than typical only recommended to address EMI issues.
(3) Termination value should be uniform across net class.

6.4.2.2.10 VREF Routing

VREF is used as a reference by the input buffers of the DDR2 memories as well as the AM3517/05. VREF is intended to be half of the DDR2 power supply voltage and should be created using a resistive divider as shown in Figure 6-23. Other methods of creating VREF are not recommended. Figure 6-27 shows the layout guidelines for VREF.

figure_4_praar3updated.gifFigure 6-27 VREF Routing and Topology

6.4.2.2.11 DDR2 CLK and ADDR_CTRL Routing

Figure 6-28 shows the topology of the routing for the CLK and ADDR_CTRL net classes. The route is a balanced T as it is intended that the length of segments B and C be equal. In addition, the length of A should be maximized.

f5_praar3updated.gifFigure 6-28 CLK and ADDR_CTRL Routing and Topology

Table 6-31 CLK and ADDR_CTRL Routing Specification (1)

No Parameter Min Typ Max Unit Notes
1 Center to center DQS-DQSN spacing 2w
2 CK differential pair Skew Length Mismatch(4) 25 Mils See Note (1)
3 CLKB to CLKC Skew Length Mismatch 25 Mils
4 Center to center CLK to other DDR2 trace spacing 4w See Note (3)
5 CK/ADDR_CTRL nominal trace length CACLM-50 CACLM CACLM+50 Mils See Note (2)
6 ADDR_CTRL to CLK Skew Length Mismatch 100 Mils
7 ADDR_CTRL to ADDR_CTRL Skew Length Mismatch 100 Mils
8 Center to center ADDR_CTRL to other DDR2 trace spacing 4w See Note (3)
9 Center to center ADDR_CTRL to other ADDR_CTRL trace spacing 3w See Note (3)
10 ADDR_CTRL A to B, ADDR_CTRL A to C, Skew Length Mismatch 100 Mils See Note (1)
11 ADDR_CTRL B to C Skew Length Mismatch 100 Mils
(1) Series terminator, if used, should be located closest to AM3517/05.
(2) CACLM is the longest Manhattan distance of the CLK and ADDR_CTRL net classes.
(3) Center to center spacing is allowed to fall to minimum (w) for up to 500 mils of routed length to accommodate BGA escape and routing congestion.
(4) Differential impedance should be 100-ohms.

Figure 6-29 shows the topology and routing for the DQS and Dx net classes; the routes are point to point. Skew matching across bytes is not needed nor recommended.

f6_praar3updated.gifFigure 6-29 DQS and Dx Routing and Topology

Table 6-32 DQS and Dx Routing Specification(6)(1)

No. Parameter Min Typ Max Unit Notes
1 Center to center DQS-DQSN spacing 2w
2 DQS E differential pair Skew Length Mismatch(7) 25 Mils
3 Center to center DQS to other DDR2 trace spacing 4w See Note (4)
4 DQS/Dx nominal trace length DQLM-50 DQLM DQLM+50 Mils See Notes (1), (3)
5 Dx to DQS Skew Length Mismatch 100 Mils See Note (3)
6 Dx to Dx Skew Length Mismatch 100 Mils See Note (3)
7 Center to center Dx to other DDR2 trace spacing 4w See Notes (4), (5)
8 Center to Center Dx to other Dx trace spacing 3w See Notes (2), (4)
(1) Series terminator, if used, should be located closest to DDR.
(2) DQLM is the longest Manhattan distance of each of the DQS and Dx net classes.
(3) There is no need and it is not recommended to skew match across data bytes, i.e., from DQS0 and data byte 0 to DQS1 and data byte 1.
(4) Center to center spacing is allowed to fall to minimum (w) for up to 500 mils of routed length to accommodate BGA escape and routing congestion.
(5) Dx's from other DQS domains are considered other DDR2 trace.
(6) "Dx" indicates a data line. E indicates length of DQS differential pair or Dx signal.
(7) Differential impedance should be 100-ohms.

Figure 6-30 shows the routing for the SDRC_STRBENx net classes. Table 6-33 contains the routing specification. SDRC_STRBENx net classes should be shielded from or routed on different layers than the DQx net classes.

f12_praar3updated.gifFigure 6-30 SDRC_STRBENx Routing

Table 6-33 SDRC_STRBENx Routing Specification(4)(5)

No. Parameter Min Typ Max Unit Notes
1 SDRC_STRBEN0 Length F CKB0B1 See Note (1)
SDRC_STRBEN1 Length F CKB0B2 See Note (2)
3 Center to center SDRC_STRBENx to any other trace spacing 4w
4 DQS/Dx nominal trace length DQLM-50 DQLM DQLM+50 Mils
5 SDRC_STRBENx Skew 100 Mils See Note (3)
(1) CKB0B1 is the sum of the length of the CLK (the portion that goes to the memory associated with DQS0 and DQS1) plus the average length of the DQS0 and DQS1 differential pairs.
(2) CKB0B2 is the sum of the length of the CLK (the portion that goes to the memory associated with DQS2 and DQS3) plus the average length of the DQS2 and DQS3 differential pairs.
(3) Skew from CKB0B1 or CKB0B2.
(4) STRBENx termination resistors should be placed close to AM3517/05 STRBENx signal (not close to STRBEN_DLYx signal).
(5) Ensure signal velocities across different layers are taken into account when calculating STRBENx length. For example, if DQS0 and DSQ1 are 1inch each, and DQS0 is on a layer that is 10% faster, use 1.1inch as the length for DQS0.

6.4.2.2.12 On Die Termination (ODT)

ODT should only be used with 1 chip select as shown in Figure 6-31. If using sdrc_cs0 and sdrc_cs1, sdrc_odt should not be used. ODT signals should be tied off at the memory.

ODT_PRS550.gifFigure 6-31 ODT Connection Using One Chip select (sdrc_cs0)

6.5 Video Interfaces

6.5.1 Video Processing Subsystem (VPSS)

The Video Processing Sub-System (VPSS) provides a Video Processing Front End (VPFE) input interface for external imaging peripherals (i.e., image sensors, video decoders, and so forth).

6.5.1.1 Video Processing Front End (VPFE)

The Video Processing Front-End (VPFE) controller receives input video/image data from external capture devices and stores it to external memory which is transferred into the external memory via a built in DMA engine. An internal buffer block provides a high bandwidth path between the VPSS module and the external memory. The Cortex-A8 will process the image data based on application requirements.

6.5.1.1.1 Video Processing Front End (VPFE) Timing

Table 6-34 and Table 6-35 assume testing over recommended operating conditions.

Table 6-34 VPFE Timing Requirements

NO. PARAMETER 1.8V, 3.3V
MIN MAX UNIT
VF1 tc(VDIN_CLK) Cycle time, pixel clock input, VDIN_CLK 13.33 100 ns
VF2 tsu(VDIN_D-VDIN_CLK) Setup time, VDIN_D to VDIN_CLK rising edge 3.5 ns
VF3 tsu(VDIN_HD-VDIN_CLK) Setup time, VDIN_HD to VDIN_CLK rising edge 3.5 ns
VF4 tsu(VDIN_VD-VDIN_CLK) Setup time, VDIN_VD to VDIN_CLK rising edge 3.5 ns
VF5 tsu(VDIN_WEN-VDIN_CLK) Setup time, VDIN_WEN to VDIN_CLK rising edge 3.5 ns
VF6 tsu(C_FLD-VDIN_CLK) Setup time, VDIN_FIELD to VDIN_CLK rising edge 3.5 ns
VF7 th(VDIN_CLK-VDIN_D) Hold time, VDIN_D valid after VDIN_CLK rising edge 2.5 ns
VF8 th(VDIN-HD-VDIN_CLK) Hold time, VDIN_HD to VDIN_CLK rising edge 2.5 ns
VF9 th(VDIN_VD-VDIN_CLK) Hold time, VDIN_VD to VDIN_CLK rising edge 2.5 ns
VF10 th(VDIN_WEN-VDIN_CLK) Hold time, VDIN_WEN to VDIN_CLK rising edge 2.5 ns
VF11 th(C_FLD-VDIN_CLK) Hold time, VDIN_FIELD to VDIN_CLK rising edge 2.5 ns

Table 6-35 VPFE Output Switching Characteristics

NO. PARAMETER 1.8V, 3.3V
MIN MAX UNIT
VF12 td(VDIN_HD-VDIN_CLK) Output delay time, VDIN_HD to CLK rising edge 10 ns
VF13 td(VDIN_VD-VDIN_CLK) Output delay time, VDIN_VD to CLK rising edge 10 ns
VF14 td(VDIN_WEN-VDIN_CLK) Output delay time, VDIN_WEN to CLK rising edge 10 ns
VF15 toh(VDIN_HD-VDIN_CLK) Output hold time, VDIN_HD to CLK rising edge 0.5 ns
VF16 toh(VDIN_VD-VDIN_CLK) Output hold time, VDIN_VD to CLK rising edge 0.5 ns
VF17 toh(C_FLD-VDIN_CLK) Output hold time, VDIN_FLD to CLK rising edge 0.5 ns
sprs550-001.gifFigure 6-32 VPFE0 Input Timings
sprs550-002.gifFigure 6-33 VPFE Output Timings
sprs550-003.gifFigure 6-34 VPFE Input Timings With VDIN0_HD as Pixel Clock

6.5.2 Display Subsystem (DSS)

The display subsystem (DSS) provides the logic to display the video frame from external (SDRAM) or internal (SRAM) memory on an LCD panel or a TV set. The DSS integrates a display controller. It can be used in two configurations:

  • LCD display support in:
    • Bypass mode (RFBI module bypassed)
    • RFBI mode (through RFBI module)
  • TV display support (not discussed in this document because of its analog IO signals)

The two display supports can be active at the same time.

6.5.2.1 LCD Display Support in Bypass Mode

Two types of LCD panel are supported:

  • Thin film transistor (TFT) or active matrix technology
  • Supertwisted nematic (STN) or passive matrix technology

Both configurations are discussed in the following paragraphs.

6.5.2.1.1 LCD Display in TFT Mode

Table 6-36 assumes testing over the recommended operating conditions (see Figure 6-35).

Table 6-36 LCD Display Interface Switching Characteristics in TFT Mode(2)

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
DL0 td(PCLKA-HSYNCT) Delay time, dss_pclk active edge to dss_hsync transition -4.215 4.215 ns
DL1 td(PCLKA-VSYNCT) Delay time, dss_pclk active edge to dss_vsync transition -4.215 4.215 ns
DL2 td(PCLKA-ACBIASA) Delay time, dss_pclk active edge to dss_acbias active level -4.215 4.215 ns
DL3 td(PCLKA-DATAV) Delay time, dss_pclk active edge to dss_data bus valid -4.215 4.215 ns
DL4 tc(PCLK) Cycle time(1), dss_pclk 13.468 ns
DL5 tw(PCLK) Pulse duration, dss_pclk low or high 6.06 7.46 ns
cload Load capacitance 25 pF
(1) The pixel clock frequency is software programmable via the pixel clock divider configuration from 1 to 255 division range in the DISPC_DIVISOR register.
(2) The capacitive load is equivalent to 25 pF.
SWPS030-061.gifFigure 6-35 LCD Display in TFT Mode(1)(2)(3)(4)
  1. The pixel data bus depends on the use of 8-, 9-, 12-, 16-, 18-, or 24-bit per pixel data output pins.
  2. The pixel clock frequency is programmable.
  3. All timings not illustrated in the waveform are programmable by software, control signal polarity, and driven edge of dss_pclk.
  4. For more information, see the AM35x ARM Microprocessor Technical Reference Manual (SPRUGR0).

6.5.2.1.2 LCD Display in STN Mode

Table 6-37 assumes testing over the recommended operating conditions (see Figure 6-36).

Table 6-37 LCD Display Interface Switching Characteristics in STN Mode(2)(3)(4)

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
DL3 td(PCLKA-DATAV) Delay time, dss_pclk active edge to dss_data bus valid -4.21 6.9 ns
DL4 tc(PCLK) Cycle time(1), dss_pclk 22.73 ns
DL5 tw(PCLK) Pulse duration, dss_pclk low or high 10.23 12.5 ns
cload Load capacitance 40 pF
(1) The pixel clock frequency is software programmable via the pixel clock divider configuration from 1 to 255 division range in the DISPC_DIVISOR register.
(2) The DSS in STN mode is used with 4 or 8 pins only; unused pixel data bits always remain low.
(3) The capacitive load is equivalent to 40 pF.
(4) For more information, see the AM35x ARM Microprocessor Technical Reference Manual (SPRUGR0).
SWPS030-062.gifFigure 6-36 LCD Display in STN Mode(1)(2)(3)(4)(5)
  1. The pixel data bus depends on the use 4-, 8-, 12-, 16-, 18-, or 24-bit per pixel data output pins.
  2. All timings not illustrated in the waveform are programmable by software, control signal polarity, and driven edge of dss_pclk.
  3. dss_vsync width must be programmed to be as small as possible.
  4. The pixel clock frequency is programmable.
  5. For more information, see the AM35x ARM Microprocessor Technical Reference Manual (SPRUGR0).

6.6 Serial Communications Interfaces

6.6.1 Multichannel Buffered Serial Port (McBSP) Timing

There are five McBSP modules called McBSP1 through McBSP5. McBSP provides a full-duplex, direct serial interface between the AM3517/05 device and other devices in a system such as other application devices or codecs. It can accommodate a wide range of peripherals and clocked frame-oriented protocols (I2S, PCM, and TDM) due to its high level of versatility.

The McBSP1-5 modules may support two types of data transfer at the system level:

  • The full-cycle mode, for which one clock period is used to transfer the data, generated on one edge and captured on the same edge (one clock period later).
  • The half-cycle mode, for which one half clock period is used to transfer the data, generated on one edge and captured on the opposite edge (one half clock period later). Note that a new data is generated only every clock period, which secures the required hold time.

The interface clock (CLKX/CLKR) activation edge (data/frame sync capture and generation) has to be configured accordingly with the external peripheral (activation edge capability) and the type of data transfer required at the system level.

The AM3517/05 McBSP1-5 timing characteristics are described for both rising and falling activation edges. McBSP1 supports:

  • 6-pin mode: dx and dr as data pins; clkx, clkr, fsx, and fsr as control pins.
  • 4-pin mode: dx and dr as data pins; clkx and fsx pins as control pins. The clkx and fsx pins are internally looped back via software configuration, respectively, to the clkr and fsr internal signals for data receive.

McBSP2, 3, 4, and 5 support only the 4-pin mode.

The following sections describe the timing characteristics for applications in normal mode (that is, AM3517/05 McBSPx connected to one peripheral) and TDM applications in multipoint mode.

6.6.1.1 McBSP in Normal Mode

Table 6-38 through Table 6-40 assume testing over the recommended operating conditions.

Table 6-38 McBSP Timing Conditions

TIMING CONDITION PARAMETER 1.8V, 3.3 V UNIT
Input Conditions VALUE
tR Input signal rise time 2(1) ns
tF Input signal fall time 2 ns
Output Conditions
CLOAD Output load capacitance 10 pF
(1) Maximum value.

Table 6-39 McBSP1,2,4,5 Output Clock Pulse Duration

PARAMETER VDDSHV = 1.8V, 3.3V UNIT
MIN MAX
tC(CLK) Cycle Time, mcbsp1_clkr/mcbspx_clkx(2) 20.83 ns
tW(CLKH) Typical pulse duration, mcbsp1_clkr / mcbspx_clkx high(2) 0.5*P(1) 0.5*P(1) ns
tW(CLKL) Typical pulse duration, mcbsp1_clkr / mcbspx_clkx low(2) 0.5*P(1) 0.5*P(1) ns
tdc(CLK) Duty cycle error, mcbsp1_clkr / mcbspx_clkx(2) -0.75 0.75 ns
(1) P = mcbsp1_clkr / mcbspx_clkx clock period.
(2) In mcbspx, x identifies the McBSP number; 1, 2, 4, or 5.

Table 6-40 McBSP3 Output Clock Pulse Duration

PARAMETER VDDSHV = 1.8V, 3.3V UNIT
MIN MAX
tC(CLK) Cycle time, mcbsp3_clkx 31.25 ns
tW(CLKH) Typical pulse duration, mcbsp3_clkx high 0.5*P(1) 0.5*P(1) ns
tW(CLKL) Typical pulse duration, mcbsp3_clkx low 0.5*P(1) 0.5*P(1) ns
tdc(CLK) Duty cycle error, mcbsp3_clkx -0.75 0.75 ns
(1) P = mcbsp3_clkx clock period

6.6.1.1.1 McBSP1

Table 6-41 through Table 6-48 list the timing requirements and switching characteristics for McBSP1.

Table 6-41 McBSP1 Timing Requirements - Rising Edge and Receive Mode

No. PARAMETER VDDSHV=3.3V VDDSHV=1.8V UNIT
MIN MAX MIN MAX
B3 tsu(DRV-CLKAE) Setup time, mcbsp1_dr valid before mcbsp1_clkr / mcbsp1_clkx active edge Half Cycle Master 5.0 5.0 ns
Half Cycle Slave 5.2 5.2 ns
Full Cycle Master 4.0 4.0 ns
Full Cycle Slave 4.2 4.2 ns
B4 th(CLKAE-DRV) Hold time, mcbsp1_dr valid after mcbsp1_clkr / mcbsp1_clkx active edge Half Cycle Master 5.8 5.8 ns
Half Cycle Slave 5.2 5.2 ns
Full Cycle Master 1.5 1.5 ns
Full Cycle Slave 0.9 0.9 ns
B5 tsu(FSV-CLKAE) Setup time, mcbsp1_fsr / mcbsp1_fsx valid before mcbsp1_clkr / mcbsp1_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 4.2 4.2 ns
B6 th(CLKAE-FSV) Hold time, mcbsp1_fsr / mcbsp1_fsx valid after mcbsp1_clkr / mcbsp1_clkx active edge Half Cycle Slave 0.5 0.5 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-42 McBSP1 Switching Characteristics - Rising Edge and Receive Mode

No. PARAMETER VDDSHV=3.3V VDDSHV=1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKAE-FSV) Delay time, mcbsp1_clkr active edge to mcbsp1_fsr / mcbsp1_fsx valid 0.2 14.8 0.2 14.8 ns

Table 6-43 McBSP1 Timing Requirements - Rising Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B5 tsu(FSXV-CLKXAE) Setup time, mcbsp1_fsx valid before mcbsp1_clkx active edge Full Cycle Slave 5.2 4.7 ns
Half Cycle Slave 4.2 3.7 ns
B6 th(CLKXAE-FSXV) Hold time, mcbsp1_fsx valid after mcbsp1_clkx active edge Full Cycle Slave 5.2 4.7 ns
Half Cycle Slave 1.0 0.5 ns

Table 6-44 McBSP1 Switching Characteristics - Rising Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp1_clkx active edge to mcbsp1_fsx valid 0.2 14.8 0.7 14.8 ns
B8 td(CLKXAE-DXV) Delay time, mcbsp1_clkx active edge to mcbsp1_dx valid Master 0.6 14.8 0.6 14.8 ns
Slave 0.6 14.8 0.6 14.8 ns

Table 6-45 McBSP1 Timing Requirements - Falling Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B3 tsu(DRV-CLKAE) Setup time, mcbsp1_dr valid before mcbsp1_clkr / mcbsp1_clkx active edge Half Cycle Master 5.0 5.0 ns
Half Cycle Slave 5.2 5.2 ns
Full Cycle Master 4.0 4.0 ns
Full Cycle Slave 4.2 4.2 ns
B4 th(CLKAE-DRV) Hold time, mcbsp1_dr valid after mcbsp1_clkr / mcbsp1_clkx active edge Half Cycle Master 5.8 5.8 ns
Half Cycle Slave 5.2 5.2 ns
Full Cycle Master 1.5 1.5 ns
Full Cycle Slave 0.9 0.9 ns
B5 tsu(FSV-CLKAE) Setup time, mcbsp1_fsr / mcbsp1_fsx valid before mcbsp1_clkr / mcbsp1_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 4.2 4.2 ns
B6 th(CLKAE-FSV) Hold time, mcbsp1_fsr / mcbsp1_fsx valid after mcbsp1_clkr / mcbsp1_clkx active edge Half Cycle Slave 0.5 0.5 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-46 McBSP1 Switching Characteristics - Falling Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKAE-FSV) Delay time, mcbsp1_clkr / mcbsp1_clkx active edge to mcbsp1_fsr / mcbsp1_fsx valid 0.2 14.8 0.7 14.8 ns

Table 6-47 McBSP1 Timing Requirements - Falling Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B5 tsu(FSXV-CLKXAE) Setup time, mcbsp1_fsx valid before mcbsp1_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 4.2 4.2 ns
B6 th(CLKXAE-FSXV) Hold time, mcbsp1_fsx valid after mcbsp1_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-48 McBSP1 Switching Characteristics - Falling Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp1_clkx active edge to mcbsp1_fsx valid 0.2 14.8 0.2 14.8 ns
B8 td(CLKXAE-DXV) Delay time, mcbsp1_clkx active edge to mcbsp1_dx valid Master 0.6 14.8 0.6 14.8 ns
Slave 0.6 14.8 0.6 14.8 ns

6.6.1.1.2 McBSP2

Table 6-49 through Table 6-56 list the timing requirements and switching characteristics for McBSP2.

Table 6-49 McBSP2 Timing Requirements - Rising Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B3 tsu(DRV-CLKXAE) Setup time, mcbsp2_dr valid before mcbsp2_clkx active edge Half Cycle Master 5.0 5.0 ns
Half Cycle Slave 5.2 5.2 ns
Full Cycle Master 4.2 4.2 ns
Full Cycle Slave 4.2 4.2 ns
B4 th(CLKXAE-DRV) Hold time, mcbsp2_dr valid after mcbsp2_clkx active edge Half Cycle Master 5.8 5.8 ns
Half Cycle Slave 5.2 5.2 ns
Full Cycle Master 1.5 1.5 ns
Full Cycle Slave 0.9 0.9 ns
B5 tsu(FSV-CLKXAE) Setup time, mcbsp2_fsx valid before mcbsp2_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 4.2 4.2 ns
B6 th(CLKXAE-FSV) Hold time, mcbsp2_fsx valid after mcbsp2_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-50 McBSP2 Switching Characteristics - Rising Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp2_clkx active edge to mcbsp2_fsx valid 0.2 14.8 0.2 14.8 ns

Table 6-51 McBSP2 Timing Requirements - Rising Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B5 tsu(FSXV-CLKXAE) Setup time, mcbsp2_fsx valid before mcbsp2_clkx active edge Half Cycle Slave 5.2 4.7 ns
Full Cycle Slave 4.2 3.7 ns
B6 th(CLKXAE-FSXV) Hold time, mcbsp2_fsx valid after mcbsp2_clkx active edge Half Cycle Slave 5.2 4.7 ns
Full Cycle Slave 1.0 0.5 ns

Table 6-52 McBSP2 Switching Characteristics - Rising Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp2_clkx active edge to mcbsp2_fsx valid 0.2 14.8 0.2 14.8 ns
B8 td(CLKXAE-DXV) Delay time, mcbsp2_clkx active edge to mcbsp2_dx valid Master 0.6 14.8 0.6 14.8 ns
Slave 0.6 14.8 0.6 14.8 ns

Table 6-53 McBSP2 Timing Requirements - Falling Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B3 tsu(DRV-CLKXAE) Setup time, mcbsp2_dr valid before mcbsp2_clkx active edge Half Cycle Master 5.0 5.0 ns
Half Cycle Slave 5.2 5.2 ns
Full Cycle Master 4.2 4.2 ns
Full Cycle Slave 4.2 4.2 ns
B4 th(CLKXAE-DRV) Hold time, mcbsp2_dr valid after mcbsp2_clkx active edge Half Cycle Master 5.8 5.8 ns
Half Cycle Slave 5.2 5.2 ns
Full Cycle Master 1.5 1.5 ns
Full Cycle Slave 0.9 0.9 ns
B5 tsu(FSXV-CLKXAE) Setup time, mcbsp2_fsx valid before mcbsp2_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 4.2 4.2 ns
B6 th(CLKXAE-FSXV) Hold time, mcbsp2_fsx valid after mcbsp2_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-54 McBSP2 Switching Characteristics - Falling Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp2_clkx active edge to mcbsp2_fsx valid 0.2 14.8 0.2 14.8 ns

Table 6-55 McBSP2 Timing Requirements - Falling Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B5 tsu(FSXV-CLKXAE) Setup time, mcbsp2_fsx valid before mcbsp2_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 4.2 4.2 ns
B6 th(CLKXAE-FSXV) Hold time, mcbsp2_fsx valid after mcbsp2_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-56 McBSP2 Switching Characteristics - Falling Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp2_clkx active edge to mcbsp2_fsx valid 0.2 14.8 0.2 14.8 ns
B8 td(CLKXAE-DXV) Delay time, mcbsp2_clkx active edge to mcbsp2_dx valid Master 0.6 14.8 0.6 14.8 ns
Slave 0.6 14.8 0.6 14.8 ns

6.6.1.1.3 McBSP3

6.6.1.1.3.1 McBSP3 Multiplexed on McBSP3 Pins

Table 6-57 through Table 6-64 list the timing conditions and switching characteristics for McBSP3 multiplexed on McBSP3 pins.

Note: All timings apply only to Set #1- multiplexing on mcbsp3 pins.

Table 6-57 McBSP3 (Set #1) Timing Requirements - Rising Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B3 tsu(DRV-CLKXAE) Setup time, mcbsp3_dr valid before mcbsp3_clkx active edge Half Cycle Master 7.5 7.5 ns
Half Cycle Slave 7.7 7.7 ns
Full Cycle Master 5.6 5.6 ns
Full Cycle Slave 5.8 5.8 ns
B4 th(CLKXAE-DRV) Hold time, mcbsp3_dr valid after mcbsp3_clkx active edge Half Cycle Master 8.3 8.3 ns
Half Cycle Slave 7.7 7.7 ns
Full Cycle Master 1.5 1.5 ns
Full Cycle Slave 0.9 0.9 ns
B5 tsu(FSV-CLKXAE) Setup time, mcbsp3_fsx valid before mcbsp3_clkx active edge Half Cycle Slave 7.7 7.7 ns
Full Cycle Slave 5.8 5.8 ns
B6 th(CLKXAE-FSV) Hold time, mcbsp3_fsx valid after mcbsp3_clkx active edge Half Cycle Slave 7.7 7.7 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-58 McBSP3 (Set #1) Switching Characteristics - Rising Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp3_clkx active edge to mcbsp3_fsx valid 0.2 22.2 0.2 22.2 ns

Table 6-59 McBSP3 (Set #1) Timing Requirements - Rising Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B5 tsu(FSXV-CLKXAE) Setup time, mcbsp3_fsx valid before mcbsp3_clkx active edge Half Cycle Slave 7.7 7.7 ns
Full Cycle Slave 5.8 5.8 ns
B6 th(CLKXAE-FSXV) Hold time, mcbsp3_fsx valid after mcbsp3_clkx active edge Half Cycle Slave 7.7 7.7 ns
Full Cycle Slave 1 1 ns

Table 6-60 McBSP3 (Set #1) Switching Characteristics - Rising Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp3_clkx active edge to mcbsp3_fsx valid 0.2 22.2 0.2 22.2 ns
B8 td(CLKXAE-DXV) Delay time, mcbsp3_clkx active edge to mcbsp3_dx valid Master 0.6 22.2 0.6 22.2 ns
Slave 0.6 22.2 0.6 22.2 ns

Table 6-61 McBSP3 (Set #1) Timing Requirements - Falling Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
tsu(DRV-CLKXAE) Setup time, mcbsp3_dr valid before mcbsp3_clkx active edge Half Cycle Master 7.5 7.5 ns
Half Cycle Slave 7.7 7.7 ns
Full Cycle Master 5.6 5.6 ns
Full Cycle Slave 5.8 5.8 ns
th(CLKXAE-DRV) Hold time, mcbsp3_dr valid after mcbsp3_clkx active edge Half Cycle Master 8.3 8.3 ns
Half Cycle Slave 7.7 7.7 ns
Full Cycle Master 1.5 1.5 ns
Full Cycle Slave 0.9 0.9 ns
B5 tsu(FXSV-CLKXAE) Setup time, mcbsp3_fsx valid before mcbsp3_clkx active edge Half Cycle Slave 7.7 7.7 ns
Full Cycle Slave 5.8 5.8 ns
B6 th(CLKXAE-FSXV) Hold time, mcbsp3_fsx valid after mcbsp3_clkx active edge Half Cycle Slave 7.7 7.7 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-62 McBSP3 (Set #1) Switching Characteristics - Falling Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp3_clkx active edge to mcbsp3_fsx valid 0.2 22.2 0.2 22.2 ns

Table 6-63 McBSP3 (Set #1) Timing Requirements - Falling Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B5 tsu(FSXV-CLKXAE) Setup time, mcbsp3_fsx valid before mcbsp3_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 4.2 4.2 ns
B6 th(CLKXAE-FSXV) Hold time, mcbsp3_fsx valid after mcbsp3_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-64 McBSP3 (Set #1) Switching Characteristics - Falling Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp3_clkx active edge to mcbsp3_fsx valid 0.2 22.2 0.2 22.2 ns
B8 td(CLKXAE-DXV) Delay time, mcbsp3_clkx active edge to mcbsp3_dx valid Master 0.6 22.2 0.6 22.2 ns
Slave 0.6 22.2 0.6 22.2 ns

6.6.1.1.3.2 McBSP3 Multiplexed on UART2 or McBSP1 Pins

Table 6-65 through Table 6-72 list the timing conditions and switching characteristics for McBSP3 multiplexed on UART2 or McBSP1 pins.

Note: These timings only apply to Set #2 (multiplexing mode on uart2 pins) and Set #3 (multiplexing on mcbsp1 pins).

Table 6-65 McBSP3 (Sets #2 and #3) Timing Requirements - Rising Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B3 tsu(DRV-CLKXAE) Setup time, mcbsp3_dr valid before mcbsp3_clkx active edge Half Cycle Master 5.0 5.0 ns
Half Cycle Slave 5.2 5.2 ns
Full Cycle Master 4.2 4.2 ns
Full Cycle Slave 4.2 4.2 ns
B4 th(CLKXAE-DRV) Hold time, mcbsp3_dr valid after mcbsp3_clkx active edge Half Cycle Master 5.8 5.8 ns
Half Cycle Slave 5.2 5.2 ns
Full Cycle Master 1.5 1.5 ns
Full Cycle Slave 0.9 0.9 ns
B5 tsu(FSV-CLKXAE) Setup time, mcbsp3_fsx valid before mcbsp3_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 4.2 4.2 ns
B6 th(CLKXAE-FSV) Hold time, mcbsp3_fsx valid after mcbsp3_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-66 McBSP3 (Sets #2 and #3) Switching Characteristics - Rising Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp3_clkx active edge to mcbsp3_fsx valid 0.2 14.8 0.2 14.8 ns

Table 6-67 McBSP3 (Sets #2 and #3) Timing Requirements - Rising Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B5 tsu(FSXV-CLKXAE) Setup time, mcbsp3_fsx valid before mcbsp3_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 4.2 4.2 ns
B6 th(CLKXAE-FSXV) Hold time, mcbsp3_fsx valid after mcbsp3_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-68 McBSP3 (Sets #2 and #3) Switching Characteristics - Rising Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp3_clkx active edge to mcbsp3_fsx valid 0.2 14.8 0.2 14.8 ns
B8 td(CLKXAE-DXV) Delay time, mcbsp3_clkx active edge to mcbsp3_dx valid Master 0.6 14.8 0.6 14.8 ns
Slave 0.6 14.8 0.6 14.8 ns

Table 6-69 McBSP3 (Sets #2 and #3) Timing Requirements - Falling Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B3 tsu(DRV-CLKXAE) Setup time, mcbsp3_dr valid before mcbsp3_clkx active edge Half Cycle Master 5.0 5.0 ns
Half Cycle Slave 5.2 5.2 ns
Full Cycle Master 4.2 4.2 ns
Full Cycle Slave 4.2 4.2 ns
B4 th(CLKXAE-DRV) Hold time, mcbsp3_dr valid after mcbsp3_clkx active edge Half Cycle Master 5.8 5.8 ns
Half Cycle Slave 5.2 5.2 ns
Full Cycle Master 1.5 1.5 ns
Full Cycle Slave 0.9 0.9 ns
B5 tsu(FXSV-CLKXAE) Setup time, mcbsp3_fsx valid before mcbsp3_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 4.2 4.2 ns
B6 th(CLKXAE-FSXV) Hold time, mcbsp3_fsx valid after mcbsp3_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-70 McBSP3 (Sets #2 and #3) Switching Characteristics - Falling Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp3_clkx active edge to mcbsp3_fsx valid 0.2 14.8 0.2 14.8 ns

Table 6-71 McBSP3 (Sets #2 and #3) Timing Requirements - Falling Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B5 tsu(FSXV-CLKXAE) Setup time, mcbsp3_fsx valid before mcbsp3_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 4.2 4.2 ns
B6 th(CLKXAE-FSXV) Hold time, mcbsp3_fsx valid after mcbsp3_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-72 McBSP3 (Sets #2 and #3) Switching Characteristics - Falling Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1 .8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp3_clkx active edge to mcbsp3_fsx valid 0.2 14.8 0.2 14.8 ns
B8 td(CLKXAE-DXV) Delay time, mcbsp3_clkx active edge to mcbsp3_dx valid Master 0.6 14.8 0.6 14.8 ns
Slave 0.6 14.8 0.6 14.8 ns

6.6.1.1.4 McBSP4

Table 6-73 through Table 6-80 list the timing requirements and switching characteristics for McBSP4.

Table 6-73 McBSP4 Timing Requirements - Rising Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B3 tsu(DRV-CLKXAE) Setup time, mcbsp4_dr valid before mcbsp4_clkx active edge Half Cycle Master 7.5 7.5 ns
Half Cycle Slave 7.7 7.7 ns
Full Cycle Master 3.2 3.2 ns
Full Cycle Slave 4.2 4.2 ns
B4 th(CLKXAE-DRV) Hold time, mcbsp4_dr valid after mcbsp4_clkx active edge Half Cycle Master 7.7 7.7 ns
Half Cycle Slave 5.2 5.2 ns
Full Cycle Master 1.5 1.5 ns
Full Cycle Slave 0.9 0.9 ns
B5 tsu(FSV-CLKXAE) Setup time, mcbsp4_fsx valid before mcbsp4_clkx active edge Half Cycle Slave 7.7 7.7 ns
Full Cycle Slave 4.2 4.2 ns
B6 th(CLKXAE-FSV) Hold time, mcbsp4_fsx valid after mcbsp4_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-74 McBSP4 Switching Characteristics - Rising Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp4_clkx active edge to mcbsp4_fsx valid 0.2 16.6 0.2 16.6 ns

Table 6-75 McBSP4 Timing Requirements - Rising Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B5 tsu(FSXV-CLKXAE) Setup time, mcbsp4_fsx valid before mcbsp4_clkx active edge Half Cycle Slave 7.7 7.7 ns
Full Cycle Slave 3.7 3.7 ns
B6 th(CLKXAE-FSXV) Hold time, mcbsp4_fsx valid after mcbsp4_clkx active edge Half Cycle Slave 1.0 1.0 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-76 McBSP4 Switching Characteristics - Rising Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp4_clkx active edge to mcbsp4_fsx valid 0.2 16.6 0.2 16.6 ns
B8 td(CLKXAE-DXV) Delay time, mcbsp4_clkx active edge to mcbsp4_dx valid Master 0.6 16.6 0.6 16.6 ns
Slave 0.6 17.3 0.6 17.3 ns

Table 6-77 McBSP4 Timing Requirements - Falling Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B3 tsu(DRV-CLKXAE) Setup time, mcbsp4_dr valid before mcbsp4_clkx active edge Half Cycle Master 7.5 7.5 ns
Half Cycle Slave 7.7 7.7 ns
Full Cycle Master 5.6 5.6 ns
Full Cycle Slave 5.8 5.8 ns
B4 th(CLKXAE-DRV) Hold time, mcbsp4_dr valid after mcbsp4_clkx active edge Half Cycle Master 7.7 7.7 ns
Half Cycle Slave 5.2 5.2 ns
Full Cycle Master 1.5 1.5 ns
Full Cycle Slave 0.9 0.9 ns
B5 tsu(FXSV-CLKXAE) Setup time, mcbsp4_fsx valid before mcbsp4_clkx active edge Half Cycle Slave 7.7 7.7 ns
Full Cycle Slave 5.8 5.8 ns
B6 th(CLKXAE-FSXV) Hold time, mcbsp4_fsx valid after mcbsp4_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-78 McBSP4 Switching Characteristics - Falling Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp4_clkx active edge to mcbsp4_fsx valid 0.2 16.6 0.2 16.6 ns

Table 6-79 McBSP4 Timing Requirements - Falling Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B5 tsu(FSXV-CLKXAE) Setup time, mcbsp4_fsx valid before mcbsp4_clkx active edge Half Cycle Slave 7.7 7.7 ns
Full Cycle Slave 3.7 3.7 ns
B6 th(CLKXAE-FSXV) Hold time, mcbsp4_fsx valid after mcbsp4_clkx active edge Half Cycle Slave 5.2 5.2 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-80 McBSP4 Switching Characteristics - Falling Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp4_clkx active edge to mcbsp4_fsx valid 0.2 16.6 0.2 16.6 ns
B8 td(CLKXAE-DXV) Delay time, mcbsp4_clkx active edge to mcbsp4_dx valid Master 0.6 16.6 0.6 16.6 ns
Slave 0.6 17.3 0.6 17.3 ns

6.6.1.1.5 McBSP5

Table 6-81 through Table 6-88 list the timing conditions and switching characteristics for McBSP5.

Table 6-81 McBSP5 Timing Requirements - Rising Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B3 tsu(DRV-CLKXAE) Setup time, mcbsp5_dr valid before mcbsp5_clkx active edge Half Cycle Master 7.5 7.5 ns
Half Cycle Slave 7.7 7.7 ns
Full Cycle Master 5.6 5.6 ns
Full Cycle Slave 5.8 5.8 ns
B4 th(CLKXAE-DRV) Hold time, mcbsp5_dr valid after mcbsp5_clkx active edge Half Cycle Master 7.5 7.5 ns
Half Cycle Slave 7.7 7.7 ns
Full Cycle Master 1.5 1.5 ns
Full Cycle Slave 0.9 0.9 ns
B5 tsu(FSV-CLKXAE) Setup time, mcbsp5_fsx valid before mcbsp5_clkx active edge Half Cycle Slave 7.7 7.7 ns
Full Cycle Slave 5.8 5.8 ns
B6 th(CLKXAE-FSV) Hold time, mcbsp5_fsx valid after mcbsp5_clkx active edge Half Cycle Slave 7.7 7.7 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-82 McBSP5 Switching Characteristics - Rising Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp5_clkx active edge to mcbsp5_fsx valid 0.2 14.8 0.7 14.8 ns

Table 6-83 McBSP5 Timing Requirements - Rising Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B5 tsu(FSXV-CLKXAE) Setup time, mcbsp5_fsx valid before mcbsp5_clkx active edge Half Cycle Slave 7.7 7.7 ns
Full Cycle Slave 5.8 5.8 ns
B6 th(CLKXAE-FSXV) Hold time, mcbsp5_fsx valid after mcbsp5_clkx active edge Half Cycle Slave 7.7 7.7 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-84 McBSP5 Switching Characteristics - Rising Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp5_clkx active edge to mcbsp5_fsx valid 0.2 14.8 0.2 14.8 ns
B8 td(CLKXAE-DXV) Delay time, mcbsp5_clkx active edge to mcbsp5_dx valid Master 0.6 14.8 0.6 14.8 ns
Slave 0.6 14.8 0.6 14.8 ns

Table 6-85 McBSP5 Timing Requirements - Falling Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B3 tsu(DRV-CLKXAE) Setup time, mcbsp5_dr valid before mcbsp5_clkx active edge Half Cycle Master 7.5 7.5 ns
Half Cycle Slave 7.7 7.7 ns
Full Cycle Master 5.6 5.6 ns
Full Cycle Slave 5.8 5.8 ns
B4 th(CLKXAE-DRV) Hold time, mcbsp5_dr valid after mcbsp5_clkx active edge Half Cycle Master 8.3 8.3 ns
Half Cycle Slave 7.7 7.7 ns
Full Cycle Master 1.5 1.5 ns
Full Cycle Slave 0.9 0.9 ns
B5 tsu(FXSV-CLKXAE) Setup time, mcbsp5_fsx valid before mcbsp5_clkx active edge Half Cycle Slave 7.7 7.7 ns
Full Cycle Slave 5.8 5.8 ns
B6 th(CLKXAE-FSXV) Hold time, mcbsp5_fsx valid after mcbsp5_clkx active edge Half Cycle Slave 7.7 7.7 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-86 McBSP5 Switching Characteristics - Falling Edge and Receive Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp5_clkx active edge to mcbsp5_fsx valid 0.2 22.2 0.2 22.2 ns

Table 6-87 McBSP5 Timing Requirements - Falling Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B5 tsu(FSXV-CLKXAE) Setup time, mcbsp5_fsx valid before mcbsp5_clkx active edge Half Cycle Slave 7.7 7.7 ns
Full Cycle Slave 5.8 5.8 ns
B6 th(CLKXAE-FSXV) Hold time, mcbsp5_fsx valid after mcbsp5_clkx active edge Half Cycle Slave 7.7 7.7 ns
Full Cycle Slave 1.0 1.0 ns

Table 6-88 McBSP5 Switching Characteristics - Falling Edge and Transmit Mode

No. PARAMETER VDDSHV = 3.3V VDDSHV = 1.8V UNIT
MIN MAX MIN MAX
B2 td(CLKXAE-FSXV) Delay time, mcbsp5_clkx active edge to mcbsp5_fsx valid 0.2 22.2 0.2 22.2 ns
B8 td(CLKXAE-DXV) Delay time, mcbsp5_clkx active edge to mcbsp5_dx valid Master 0.6 22.2 0.6 22.2 ns
Slave 0.6 22.2 0.6 22.2 ns

6.6.1.1.6 McBSP in TDM Mode

Table 6-89 through Table 6-91 assume testing over the recommended operating conditions.

Table 6-89 McBSP Timing Conditions – TDM in Multipoint Mode

PARAMETER DESCRIPTION VDDSHV = 1.8V or 3.3V UNIT
MIN MAX
tr Input signal rise time 1 8.5 ns
tf Input signal fall time 1 8.5 ns
Cload Output load capacitance 40 pf

Table 6-90 McBSP Timing Requirements — TDM in Multipoint Mode

INDEX PARAMETER DESCRIPTION VDDSHV = 1.8V or 3.3V UNIT
MIN MAX
tw(CLKH) Cycle Time, mcbspx_clkx 162.8 ns
tw(CLKH) Typical Pulse duration, mcbspx_clkx high 81.4 ns
tw(CLKL) Typical Pulse duration, mcbspx_clkx low 81.4 ns
tdc(CLK) Duty cycle error, mcbspx_clkx -8.14 8.14 ns
B3 tsu(DRV-CLKAE) Setup time, mcbspx_dr valid before mcbspx_clkx active edge 9 ns
B4 th(CLKAE-DRV) Hold time, mcbspx_dr valid after mcbspx_clkx active edge 2.4 ns
B5 tsu(FSV-CLKAE) Setup time, mcbspx_fsx valid before mcbspx_clkx active edge 9 ns
B6 th(CLKAE-FSV) Hold time, mcbspx_fsx valid after mcbspx_clkx active edge 2.4 ns

Table 6-91 McBSP Switching Characteristics — TDM in Multipoint Mode

INDEX PARAMETER DESCRIPTION VDDSHV = 1.8V or 3.3V UNIT
MIN MAX
B8 td(CLKXAE-DXV) Delay time, mcbspx_clkx active edge to mcbspx_dx valid 0.6 16.8 ns

6.6.1.1.7 McBSP Timing Diagrams

SWPS030-068.gifFigure 6-37 McBSP Rising Edge Receive Timing in Master Mode
SWPS030-069.gifFigure 6-38 McBSP Rising Edge Receive Timing in Slave Mode
SWPS030-070.gifFigure 6-39 McBSP Rising Edge Transmit Timing in Master Mode
SWPS030-071.gifFigure 6-40 McBSP Rising Edge Transmit Timing in Slave Mode
SWPS030-072.gifFigure 6-41 McBSP Falling Edge Receive Timing in Master Mode
SWPS030-073.gifFigure 6-42 McBSP Falling Edge Receive Timing in Slave Mode
SWPS030-074.gifFigure 6-43 McBSP Falling Edge Transmit Timing in Master Mode
SWPS030-075.gifFigure 6-44 McBSP Falling Edge Transmit Timing in Slave Mode

6.6.2 Multichannel Serial Port Interface (McSPI) Timing

The multichannel SPI is a master/slave synchronous serial bus. The McSPI1 module supports up to four peripherals and the others (McSPI2, McSPI3, and McSPI4) support up to two peripherals. The following timings are applicable to the different configurations of McSPI in master/slave mode for any McSPI and any channel (n).

6.6.2.1 McSPI in Slave Mode

Table 6-92 and Table 6-93 assume testing over the recommended operating conditions.

Table 6-92 McSPI Interface Timing Requirements – Slave Mode

NO. PARAMETER 1.8 V 3.3 V UNIT
MIN MAX MIN MAX
SS0 tc(CLK) Cycle time, mcspix_clk 41.67 41.67 ns
SS1 tw(CLK) Pulse duration, mcspix_clk high or low 18.75 22.92 11.25 ns
SS2 tsu(SIMOV-CLKAE) Setup time, mcspix_simo valid before mcspix_clk active edge 4.2 4 ns
SS3 th(SIMOV-CLKAE) Hold time, mcspix_simo valid after mcspix_clk active edge 4.6 3 ns
SS4 tsu(CS0V-CLKFE) Setup time, mcspix_cs0 valid before mcspix_clk first edge 13.8 7 ns
SS5 th(CS0I-CLKLE) Hold time, mcspix_cs0 invalid after mcspix_clk last edge 13.8 9.17 ns

Table 6-93 McSPI Interface Switching Characteristics(1)(2)(3)(4)

NO. PARAMETER 1.8 V 3.3 V UNIT
MIN MAX MIN MAX
SS6 td(CLKAE-SOMIV) Delay time, mcspix_clk active edge to mcspix_somi shifted 1.8 15.9 2 16.5 ns
SS7 td(CS0AE-SOMIV) Delay time, mcspix_cs0 active edge to mcspix_somi shifted Modes 0 and 2 16.38 15.9 ns
(1) The capacitive load is equivalent to 20 pF.
(2) In mcspix, x is equal to 1, 2, 3, or 4.
(3) The polarity of mcspix_clk and the active edge (rising or falling) on which mcspix_simo is driven and mcspix_somi is latched is all software configurable.
(4) This timing applies to all configurations regardless of mcspix_clk polarity and which clock edges are used to drive output data and capture input data.
SWPS030-076.gifFigure 6-45 McSPI Interface Transmit and Receive in Slave Mode(1)(2)
  1. The active clock edge (rising or falling) on which mcspi_somi is driven and mcspi_simo data is latched is software configurable with the bit MSPI_CHCONFx[0] = PHA and the bit MSPI_CHCONFx[1] = POL.
  2. The polarity of mcspix_csi is software configurable with the bit MSPI_CHCONFx[6] = EPOL In mcspix, x is equal to 1, 2, 3, or 4.

6.6.2.2 McSPI in Master Mode

Table 6-94 and Table 6-95 assume testing over the recommended operating conditions.

Table 6-94 McSPI1, 2, and 4 Interface Timing Requirements – Master Mode(1)(2)

NO. PARAMETER 1.8 V 3.3 V UNIT
MIN MAX MIN MAX
SM2 tsu(SOMIV-CLKAE) Setup time, mcspix_somi valid before mcspix_clk active edge 2.56 4 ns
SM3 th(SOMIV-CLKAE) Hold time, mcspix_somi valid after mcspix_clk active edge 2.93 4 ns
(1) The input timing requirements are given by considering a rise time and a fall time of 4 ns.
(2) In mcspix, x is equal to 1, 2, 3, or 4. In mcspix_csn, n is equal to 0, 1, 2, or 3 for x equal to 1, n is equal to 0 or 1 for x equal to 2 and 3. n is equal to 0 for x equal to 4.

Table 6-95 McSPI1, 2, and 4 Interface Switching Characteristics – Master Mode(1)(3)(4)

NO. PARAMETER 1.8 V 3.3 V UNIT
MIN MAX MIN MAX
SM0 tc(CLK) Cycle time, mcspix_clk 20.83 20.83 ns
tj(CLK) Cycle jitter(7), mcspix_clk -200 200 -200 200 ps
SM1 tw(CLK) Pulse duration, mcspix_clk high or low 0.45P(2) 0.55P(2) 0.45P(2) 0.55P(2) ns
SM4 td(CLKAE-SIMOV) Delay time, mcspix_clk active edge to mcspix_simo shifted -2.1 5 -3 6 ns
SM5 td(CSnA-CLKFE) Delay time, mcspix_csi active to mcspix_clk first edge Modes 1 and 3 A(5) - 3.2 A(5) - 3.0 6 ns
Modes 0 and 2 B(6) - 3.2 B(6) -3.0 6 ns
SM6 td(CLKLE-CSnI) Delay time, mcspix_clk last edge to mcspix_csi inactive Modes 1 and 3 B(6) - 3.2 B(6) - 3.0 ns
Modes 0 and 2 A(5) - 3.2 A(5) - 3.0 ns
SM7 td(CSnAE-SIMOV) Delay time, mcspix_csi active edge to mcspix_simo shifted Modes 0 and 2 5 5 ns
(1) Timings are given for a maximum load capacitance of 20 pF for spix_csn signals, 30 pF for spix_clk and spix_simo signals with x = 1 or 2, and 20 pF for spi4_clk and spi4_simo signals.
(2) P = mcspix_clk clock period
(3) In mcspix, x is equal to 1, 2, 3, or 4. In mcspix_csn, n is equal to 0, 1, 2, or 3 for x equal to 1, n is equal to 0 or 1 for x equal to 2 and 3. n is equal to 0 for x equal to 4.
(4) The polarity of mcspix_clk and the active edge (rising or falling) on which mcspix_simo is driven and mcspix_somi is latched is all software configurable.
(5) Case P = 20.8 ns, A = (TCS+0.5)*P (TCS is a bit field of MSPI_CHCONFx[26:25] register). Case P > 20.8 ns, A = TCS*P (TCS is a bitfield of MSPI_CHCONFx[26:25] register). For more information, see the Device Multichannel Serial Port Interface (McSPI) Reference Guide [SPRUFV6].
(6) B = TCS*P (TCS is a bit field of MSPI_CHCONFx[26:25] register). For more information, see the Device Multichannel Serial Port Interface (McSPI) Reference Guide [SPRUFV6].
(7) Maximum cycle jitter supported by mcspix_clk input clock.

Table 6-96 and Table 6-97 assume testing over the recommended operating conditions.

Table 6-96 McSPI 3 Interface Timing Requirements – Master Mode(1)(2)

NO. PARAMETER 1.8 V 3.3 V UNIT
MIN MAX MIN MAX
SM2 tsu(SOMIV-CLKAE) Setup time, mcspi3_somi valid before mcspi3_clk active edge 2.5 4 ns
SM3 th(SOMIV-CLKAE) Hold time, mcspi3_somi valid after mcspi3_clk active edge 2.89 4 ns
(1) The input timing requirements are given by considering a rise time and a fall time of 4 ns.
(2) In mcspi3_csn, n is equal to 0 or 1. The polarity of mcspi3_clk and the active edge (rising or falling) on which mcspi3_simo is driven and mcspi3_somi is latched is all software configurable.

Table 6-97 McSPI3 Interface Switching Characteristics – Master Mode(1)(2)(3)

NO. PARAMETER 1.8 V 3.3 V UNIT
MIN MAX MIN MAX
SM0 tc(CLK) Cycle time, mcspix_clk 41.67 41.67 ns
tj(CLK) Cycle jitter(6) -200 200 -200 200 ps
SM1 tw(CLK) Pulse duration, mcspix_clk high or low 0.45P(7) 0.55P(7) 0.45P(7) 0.55P(7) ns
SM4 td(CLKAE-SIMOV) Delay time, mcspix_clk active edge to mcspix_simo shifted -2.1 11.3 -3 ns
SM5 td(CSnA-CLKFE) Delay time, mcspix_csi active to mcspix_clk first edge Modes 1 and 3 A(4) - 4.4 A(4) - 3.0 6 ns
Modes 0 and 2 B(5) - 4.4 B(5) - 3.0 6 ns
SM6 td(CLKLE-CSnI) Delay time, mcspix_clk last edge to mcspix_csi inactive Modes 1 and 3 B(5) - 4.4 B(5) - 3.0 ns
Modes 0 and 2 A(4) - 4.4 A(4) - 3.0 ns
SM7 td(CSnAE-SIMOV) Delay time, mcspix_csi active edge to mcspix_simo shifted Modes 0 and 2 11.3 5 ns
(1) The capacitive load is equivalent to 20 pF.
(2) In mcspi3_csn, n is equal to 0 or 1. The polarity of mcspi3_clk and the active edge (rising or falling) on which mcspi3_simo is driven and mcspi3_somi is latched are all software configurable.
(3) This timing applies to all configurations regardless of McSPI3_CLK polarity and which clock edges are used to drive output data and capture input data.
(4) Case P = 20.8 ns, A = (TCS + 0.5)*P (TCS is a bit field of MSPI_CHCONFx[26:25] register). Case P > 20.8 ns, A = TCS*P (TCS is a bit field of MSPI_CHCONFx[26:25] register). For more information, see the Device Multichannel Serial Port Interface (McSPI) Reference Guide [SPRUFV6].
(5) B = TCS*P (TCS is a bit field of MSPI_CHCONFx[26:25] register). For more information, see the Device Multichannel Serial Port Interface (McSPI) Reference Guide [SPRUFV6].
(6) Maximum cycle jitter supported by mcspix_clk input clock.
(7) P = mcspix_clk clock period.
SWPS030-077.gifFigure 6-46 McSPI Interface Transmit and Receive in Master Mode(1)(2)(3)
  1. The active clock edge (rising or falling) on which mcspix_simo is driven and mcspi_somi data is latched is software configurable with the bit MSPI_CHCONFx[0] = PHA and the bit MSPI_CHCONFx[1] = POL.
  2. The polarity of mcspix_csi is software configurable with the bit MSPI_CHCONFx[6] = EPOL.
  3. In mcspix, x is equal to 1. In mcspix_csn, n is equal to 0, 1, 2, or 3.

6.6.3 Multiport Full-Speed Universal Serial Bus (USB) Interface

The AM3517/05 microprocessor provides three USB ports working in full- and low-speed data transactions (up to 12Mbit/s).

Connected to either a serial link controller or a serial PHY (PHY interface modes) it supports:

  • 6-pin (Tx: Dat/Se0 or Tx: Dp/Dm) unidirectional mode
  • 4-pin bidirectional mode
  • 3-pin bidirectional mode

6.6.3.1 Multiport Full-Speed Universal Serial Bus (USB) – Unidirectional Standard 6-pin Mode

Table 6-98 through Table 6-100 assume testing over the recommended operating conditions.

Table 6-98 Low-/Full-Speed USB Timing Conditions Unidirectional Standard 6-pin Mode

TIMING CONDITION PARAMETER 1.8V, 3.3V UNIT
Input Conditions
tR Input signal rise time 2.0 ns
tF Input signal fall time 2.0 ns
Output Conditions
CLOAD Output load capacitance 15.0 pF

Table 6-99 Low-/Full-Speed USB Timing Requirements Unidirectional Standard 6-pin Mode

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
FSU1 td(Vp,Vm) Time duration, mmx_rxdp and mmx_rxdm low together during transition 14.0 ns
FSU2 td(Vp,Vm) Time duration, mmx_rxdp and mmx_rxdm high together during transition 8.0 ns
FSU3 td(RCVU0) Time duration, mmx_rrxcv undefine during a single end 0 (mmx_rxdp and mmx_rxdm low together) 14.0 ns
FSU4 td(RCVU1) Time duration, mmx_rxrcv undefine during a single end 1 (mmx_rxdp and mmx_rxdm high together) 8.0 ns

Table 6-100 Low-/Full-Speed USB Switching Characteristics Unidirectional Standard 6-pin Mode

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
FSU5 td(TXENL-DATV) Delay time, mmx_txen_n low to mmx_txdat valid 81.8 84.8 ns
FSU6 td(TXENL-SE0V) Delay time, mmx_txen_n low to mmx_txse0 valid 81.8 84.8 ns
FSU7 ts(DAT-SE0) Skew between mmx_txdat and mmx_txse0 transition 1.5 ns
FSU8 td(DATI-TXENH) Delay time, mmx_txdat invalid to mmx_txen_n high 81.8 ns
FSU9 td(SE0I-TXENH) Delay time, mmx_txse0 invalid to mmx_txen_n high 81.8 ns
tR(do) Rise time, mmx_txen_n 4.0 ns
tF(do) Fall time, mmx_txen_n 4.0 ns
tR(do) Rise time, mmx_txdat 4.0 ns
tF(do) Fall time, mmx_txdat 4.0 ns
tR(do) Rise time, mmx_txse0 4.0 ns
tF(do) Fall time, mmx_txse0 4.0 ns
SWPS030-080.gif
In mmx, x is equal to 0, 1, or 2.
Figure 6-47 Low-/Full-Speed USB Unidirectional Standard 6-pin Mode

6.6.3.2 Multiport Full-Speed Universal Serial Bus (USB) – Bidirectional Standard 4-pin Mode

Table 6-101 through Table 6-103 assume testing over the recommended operating conditions.

Table 6-101 Low-/Full-Speed USB Timing Conditions Bidirectional Standard 4-pin Mode

TIMING CONDITION PARAMETER 1.8V, 3.3V UNIT
Input Conditions
tR Input signal rise time 2.0 ns
tF Input signal fall time 2.0 ns
Output Conditions
CLOAD Output load capacitance 15.0 pF

Table 6-102 Low-/Full-Speed USB Timing Requirements Bidirectional Standard 4-pin Mode

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
FSU10 td(DAT,SE0) Time duration, mmx_txdat and mmx_txse0 low together during transition 14.0 ns
FSU11 td(DAT,SE0) Time duration, mmx_txdat and mmx_txse0 high together during transition 8.0 ns
FSU12 td(RCVU0) Time duration, mmx_rrxcv undefine during a single end 0 (mmx_txdat and mmx_txse0 low together) 14.0 ns
FSU13 td(RCVU1) Time duration, mmx_rxrcv undefine during a single end 1 (mmx_txdat and mmx_txse0 high together) 8.0 ns

Table 6-103 Low-/Full-Speed USB Switching Characteristics Bidirectional Standard 4-pin Mode

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
FSU14 td(TXENL-DATV) Delay time, mmx_txen_n low to mmx_txdat valid 81.8 84.8 ns
FSU15 td(TXENL-SE0V) Delay time, mmx_txen_n low to mmx_txse0 valid 81.8 84.8 ns
FSU16 ts(DAT-SE0) Skew between mmx_txdat and mmx_txse0 transition 1.5 ns
FSU17 td(DATV-TXENH) Delay time, mmx_txdat invalid before mmx_txen_n high 81.8 ns
FSU18 td(SE0V-TXENH) Delay time, mmx_txse0 invalid before mmx_txen_n high 81.8 ns
tR(txen) Rise time, mmx_txen_n 4.0 ns
tF(txen) Fall time, mmx_txen_n 4.0 ns
tR(dat) Rise time, mmx_txdat 4.0 ns
tF(dat) Fall time, mmx_txdat 4.0 ns
tR(se0) Rise time, mmx_txse0 4.0 ns
tF(se0) Fall time, mmx_txse0 4.0 ns
SWPS030-081.gif
In mmx, x is equal to 0, 1, or 2.
Figure 6-48 Low-/Full-Speed USB Bidirectional Standard 4-pin Mode

6.6.3.3 Multiport Full-Speed Universal Serial Bus (USB) – Bidirectional Standard 3-pin Mode

Table 6-104 through Table 6-106 assume testing over the recommended operating conditions.

Table 6-104 Low-/Full-Speed USB Timing Conditions Bidirectional Standard 3-pin Mode

TIMING CONDITION PARAMETER 1.8V, 3.3V UNIT
Input Conditions
tR Input signal rise time 2.0 ns
tF Input signal fall time 2.0 ns
Output Conditions
CLOAD Output load capacitance 15.0 pF

Table 6-105 Low-/Full-Speed USB Timing Requirements Bidirectional Standard 3-pin Mode

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
FSU19 td(DAT,SE0) Time duration, mmx_txdat and mmx_txse0 low together during transition 14.0 ns
FSU20 td(DAT,SE0) Time duration, mmx_tsdat and mmx_txse0 high together during transition 8.0 ns

Table 6-106 Low-/Full-Speed USB Switching Characteristics Bidirectional Standard 3-pin Mode

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
FSU21 td(TXENL-DATV) Delay time, mmx_txen_n low to mmx_txdat valid 81.8 84.8 ns
FSU22 td(TXENL-SE0V) Delay time, mmx_txen_n low to mmx_txse0 valid 81.8 84.8 ns
FSU23 ts(DAT-SE0) Skew between mmx_txdat and mmx_txse0 transition 1.5 ns
FSU24 td(DATI-TXENH) Delay time, mmx_txdat invalid to mmx_txen_n high 81.8 ns
FSU25 td(SE0I-TXENH) Delay time, mmx_txse0 invalid to mmx_txen_n high 81.8 ns
tR(do) Rise time, mmx_txen_n 4.0 ns
tF(do) Fall time, mmx_txen_n 4.0 ns
tR(do) Rise time, mmx_txdat 4.0 ns
tF(do) Fall time, mmx_txdat 4.0 ns
tR(do) Rise time, mmx_txse0 4.0 ns
tF(do) Fall time, mmx_txse0 4.0 ns
SWPS030-082.gif
In mmx, x is equal to 0, 1, or 2.
Figure 6-49 Low-/Full-Speed USB Bidirectional Standard 3-pin Mode

6.6.4 Multiport High-Speed Universal Serial Bus (USB) Timing

In addition to the full-speed USB controller, a high-speed (HS) USB controller is instantiated inside the AM3517/05. It allows high-speed transactions (up to 480 Mbit/s) on the USB ports 1 and 2.

  • Port 1 and port 2:
    • 12-bit master mode (SDR)

6.6.4.1 High-Speed Universal Serial Bus (USB) on Ports 1 and 2 12-bit Master Mode

Table 6-107 through Table 6-109 assume testing over the recommended operating conditions.

Table 6-107 High-Speed USB Timing Conditions 12-bit Master Mode

TIMING CONDITION PARAMETER 1.8V, 3.3V UNIT
Input Conditions
tR Input signal rise time 2 ns
tF Input signal fall time 2 ns
Output Conditions
CLOAD Output load capacitance 3 pF

Table 6-108 High-Speed USB Timing Requirements 12-bit Master Mode(1)

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
HSU3 ts(DIRV-CLKH) Setup time, hsusbx_dir valid before hsusbx_clk rising edge 7.5 ns
ts(NXTV-CLKH) Setup time, hsusbx_nxt valid before hsusbx_clk rising edge 7.5 ns
HSU4 th(CLKH-DIRIV) Hold time, hsusbx_dir valid after hsusbx_clk rising edge 0.2 ns
th(CLKH-NXT/IV) Hold time, hsusbx_nxt valid after hsusbx_clk rising edge 0.2 ns
HSU5 ts(DATAV-CLKH) Setup time, hsusbx_data[0:7] valid before hsusbx_clk rising edge 7.5 ns
HSU6 th(CLKH-DATIV) Hold time, hsusbx_data[0:7] valid after hsusbx_clk rising edge 0.2 ns
(1) In hsusbx, x is equal to 1 or 2.

Table 6-109 High-Speed USB Switching Characteristics 12-bit Master Mode(1)

N O. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
HSU0 fp(CLK) hsusbx_clk clock frequency 60 MHz
tj(CLK) Jitter standard deviation(2), hsusbx_clk 200 ps
HSU1 td(CLKH-STPV) Delay time, hsusbx_clk high to output hsusbx_stp valid 13 ns
td(CLKH-STPIV) Delay time, hsusbx_clk high to output hsusbx_stp invalid 2 ns
HSU2 td(CLKH-DV) Delay time, hsusbx_clk high to output hsusbx_data[0:7] valid 13 ns
td(CLKH-DIV) Delay time, hsusbx_clk high to output hsusbx_data[0:7] invalid 2 ns
tR(do) Rise time, output signals 2 ns
tF(do) Fall time, output signals 2 ns
(1) In hsusbx, x is equal to 1 or 2.
(2) The jitter probability density can be approximated by a Gaussian function.
SWPS030-087.gif
In hsusbx, x is equal to 1 or 2.
Figure 6-50 High-Speed USB 12-bit Master Mode

6.6.5 USB0 OTG (USB2.0 OTG)

The AM3517/05 USB2.0 peripheral supports the following features:

  • USB 2.0 peripheral at speeds high speed (HS: 480 Mb/s) and full speed (FS: 12 Mb/s)
  • USB 2.0 host at speeds HS, FS, and low speed (LS: 1.5 Mb/s)
  • All transfer modes (control, bulk, interrupt, and isochronous)
  • 16 Transmit (TX) and 16 Receive (RX) endpoints in addition to endpoint 0
  • FIFO RAM
    • 32K endpoint
    • Programmable size
  • Integrated USB 2.0 High Speed PHY
  • Connects to a standard Charge Pump for VBUS 5 V generation
  • RNDIS mode for accelerating RNDIS type protocols using short packet termination over USB

6.6.5.1 USB OTG Electrical Parameters

The USB OTG electrical parameters meet or exceed those specified in the following documents which can be obtained from the USB Implementers Forum:

  • Universal Serial Bus Specification, Revision 2.0, April 27, 2000
  • On-The-Go Supplement to the USB 2.0 Specification, Revision 1.3, December 5, 2006
  • Engineering Change Notice “Pull-up/pull-down resistors”, Universal Serial Bus Specification Revision 2.0

For additional information related to USB OTG electrical parameters, please see the respective documents on the USB Implementers Forum web site (http://www.usb.org).

6.6.6 High-End Controller Area Network Controller (HECC) Timing

The AM3517/05 device has a High-End Controller Area Network Controller (HECC). The HECC uses established protocol to communicate serially with other controllers in harsh environments. The HECC is fully compliant with the Controller Area Network (CAN) protocol, version 2.0B.

Key features of the HECC include the following:

  • CAN, version 2.0B compliant
  • 32 RX/TX message objects
  • 32 receive identifier masks
  • Programmable wake-up on bus activity
  • Programmable interrupt scheme
  • Automatic reply to a remote request
  • Automatic re-transmission in case of error or loss of arbitration
  • Protection against reception of a new message
  • 32-bit time stamp
  • Local network time counter
  • Programmable priority register for each message
  • Programmable transmission and reception time-out
  • HECC/SCC mode of operation
  • Standard-Extended Identifier
  • Self-test mode

6.6.6.1 HECC Timing Requirements

Table 6-110 Timing Requirements for HECC Receive (see Figure 6-51)

NO. 1.8 V, 3.3 V UNIT
MIN MAX
1 f(baud) Maximum programmable baud rate 1 Mbps
2 tw(HECC_RX) Pulse duration, receive data bit H-1(1) H+3(1) ns
(1) These values are relative to H (where H = 1/(baud rate).

6.6.6.2 HECC Switching Characteristics

Table 6-111 Switching Characteristics Over Recommended Operating Conditions for HECC Transmit
(see Figure 6-51)

NO. PARAMETER 1.8 V, 3.3 V UNIT
MIN MAX
3 f(baud) Maximum programmable baud rate 1 Mbps
4 tw(HECC_TX) Pulse duration, transmit data bit H-1(1) H+3(1) ns
(1) These values are relative to H (where H = 1/(baud rate).
td_hecc_prs345.gifFigure 6-51 HECC Transmit/Receive Timing

6.6.7 Ethernet Media Access Controller (EMAC)

The Ethernet Media Access Controller (EMAC) provides an efficient interface between the AM3517/05 and the network. The EMAC supports both 10Base-T and 100Base-TX, or 10 Mbits/second (Mbps) and 100 Mbps in either half- or full-duplex mode, with hardware flow control and quality of service (QOS) support.

The EMAC controls the flow of packet data from the AM3517/05 device to the PHY. The MDIO module controls PHY configuration and status monitoring.

Both the EMAC and the MDIO modules interface to the AM3517/05 device through a custom interface that allows efficient data transmission and reception. This custom interface is referred to as the EMAC control module, and is considered integral to the EMAC/MDIO peripheral. The control module is also used to multiplex and control interrupts.

6.6.7.1 EMAC Electrical Data/ Timing

Table 6-112 through Table 6-114 assume testing over the recommended operating conditions.

Table 6-112 RMII Input Timing Requirements

NO. PARAMETER 1.8V, 3.3V
MIN TYP MAX UNIT
fc(REFCLK) Frequency, REF_CLK 50 MHz
ft (REFCLK) Frequency stability, REF_CLK +/-50 ppm
1 tc(REFCLK) Cycle Time, REF_CLK 20 ns
2 tw(REFCLKH) Pulse Width, REF_CLK High 7 13 ns
3 tw(REFCLKL) Pulse Width, REF_CLK Low 7 13 ns
6 tsu(RXD-REFCLK) Input Setup Time, RXD Valid before REF_CLK High 4 ns
7 th(REFCLK-RXD) Input Hold Time, RXD Valid after REF_CLK High 2 ns
8 tsu(CRSDV-REFCLK) Input Setup Time, CRSDV Valid before REF_CLK High 4 ns
9 th(REFCLK-CRSDV) Input Hold Time, CRSDV Valid after REF_CLK High 2 ns
10 tsu(RXER-REFCLK) Input Setup Time, RXER Valid before REF_CLK High 4 ns
11 th(REFCLKR-RXER) Input Hold Time, RXER Valid after REF_CLK High 2 ns

Table 6-113 RMII Timing Conditions

TIMING CONDITION PARAMETER 1.8V, 3.3V UNIT
Input Conditions MIN MAX
tR Input signal rise time 1 5 ns
tF Input signal fall time 1 5 ns
Output Conditions
CLOAD Output load capacitance 5.5 pF

Table 6-114 RMII Output Switching Characteristics

NO. PARAMETER 1.8V, 3.3V
MIN TYP MAX UNIT
4 td(REFCLK-TXD) Output Delay Time, REF_CLK High to TXD Valid 2.5 13 ns
5 td(REFCLK-TXEN) Output Delay Time, REF_CLK High to TXEN Valid 2.5 13 ns
sprs550-004.gifFigure 6-52 RMII Timing Diagram

6.6.8 Management Data Input/Output (MDIO)

The Management Data Input/Output (MDIO) module continuously polls all 32 MDIO addresses in order to enumerate all PHY devices in the system.

The Management Data Input/Output (MDIO) module implements the 802.3 serial management interface to interrogate and control Ethernet PHY(s) using a shared two-wire bus. Host software uses the MDIO module to configure the auto-negotiation parameters of each PHY attached to the EMAC, retrieve the negotiation results, and configure required parameters in the EMAC module for correct operation. The module is designed to allow almost transparent operation of the MDIO interface, with very little maintenance from the core processor. Only one PHY may be connected at any given time.

6.6.8.1 Management Data Input/Output (MDIO) Electrical Data/Timing

Table 6-115 Timing Requirements for MDIO Input (see Figure 6-53 and Figure 6-54)

No. PARAMETER UNIT
MIN MAX
1 tc(MD_CLK) Cycle time, MD_CLK 400 ns
4 tsu(MDIO-MDCLKH) Setup time, MDIO data input valid before MD_CLK high 20 ns
5 th(MDCLKH-MDIO) Hold time, MDIO data input valid after MDCLK high 0 ns
td_mdio_in_prs550.gifFigure 6-53 MDIO Input Timing

Table 6-116 Switching Characteristics Over Recommended Operating Conditions for MDIO Output
(see Figure 6-54)

No. PARAMETER UNIT
MIN MAX
7 td(MDCLKL-MDIO) Delay time, MDCLK low to MDIO data output valid 0 100 ns
td_mdio_out_prs550.gifFigure 6-54 MDIO Output Timing

6.6.9 Universal Asynchronous Receiver/Transmitter (UART)

The AM3517/05 has four UARTs (one with Infrared Data Association [IrDA] and Consumer Infrared [CIR] modes).

Table 6-117 Timing Requirements for UARTx Receive(1)

NO. 1.8V, 3.3V UNIT
MIN MAX
4 tw(URXDB) Pulse duration, receive data bit (RXDn) .96U 1.05U ns
5 tw(URXSB) Pulse duration, receive start bit .96U 1.05U ns
(1) U = UART baud time = 1/programmed baud rate.

Table 6-118 Switching Characteristics Over Recommended Operating Conditions for UARTx Transmit(1)

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
1 f(baud) UART0 Maximum programmable baud rate f(baud_15) 5 mbps
UART0 Maximum programmable baud rate f(baud_30) 0.23
UART0 Maximum programmable baud rate f(baud_100) 0.115
2 tw(UTXDB) Pulse duration, transmit data bit, 15/30/100 pF U - 2 U + 2 ns
3 tw(UTXSB) Pulse duration, transmit start bit, 15/30/100 pF U - 2 U + 2 ns
(1) U = UART baud time = 1/programmed baud rate.
td_uart_prs348.gifFigure 6-55 UART Transmit/Receive Timing

6.6.9.1 UART IrDA Interface

The IrDA module can operate in three different modes:

  • Slow infrared (SIR) (≤115.2 Kbits/s)
  • Medium infrared (MIR) (0.576 Mbits/s and 1.152 Mbits/s)
  • Fast infrared (FIR) (4 Mbits/s)
swps030-118.gifFigure 6-56 UART IrDA Pulse Parameters

6.6.9.1.1 IrDA—Receive Mode

Table 6-119 UART IrDA—Signaling Rate and Pulse Duration—Receive Mode

SIGNALING RATE ELECTRICAL PULSE DURATION UNIT
MIN NOMINAL MAX
SIR
2.4 Kbit/s 1.41 78.1 88.55 μs
9.6 Kbit/s 1.41 19.5 22.13 μs
19.2 Kbit/s 1.41 9.75 11.07 μs
38.4 Kbit/s 1.41 4.87 5.96 μs
57.6 Kbit/s 1.41 3.25 4.34 μs
115.2 Kbit/s 1.41 1.62 2.23 μs
MIR
0.576 Mbit/s 297.2 416 518.8 ns
1.152 Mbit/s 149.6 208 258.4 ns
FIR
4.0 Mbit/s (Single pulse) 67 125 164 ns
4.0 Mbit/s (Double pulse) 190 250 289 ns

Table 6-120 UART IrDA—Rise and Fall Time—Receive Mode

PARAMETER MAX UNIT
tR Rising time, uart3_rx_irrx 200 ns
tF Falling time, uart3_rx_irrx 200 ns

6.6.9.1.2 IrDA—Transmit Mode

Table 6-121 UART IrDA—Signaling Rate and Pulse Duration—Transmit Mode

SIGNALING RATE ELECTRICAL PULSE DURATION UNIT
MIN NOMINAL MAX
SIR
2.4 Kbit/s 78.1 78.1 78.1 μs
9.6 Kbit/s 19.5 19.5 19.5 μs
19.2 Kbit/s 9.75 9.75 9.75 μs
38.4 Kbit/s 4.87 4.87 4.87 μs
57.6 Kbit/s 3.25 3.25 3.25 μs
115.2 Kbit/s 1.62 1.62 1.62 μs
MIR
0.576 Mbit/s 414 416 419 ns
1.152 Mbit/s 206 208 211 ns
FIR
4.0 Mbit/s (Single pulse) 123 125 128 ns
4.0 Mbit/s (Double pulse) 248 250 253 ns

6.6.10 HDQ / 1-Wire Interfaces

This module is intended to work with both the HDQ and the 1-Wire protocols. The protocols use a single wire to communicate between the master and the slave. The protocols employ an asynchronous return to 1 mechanism where, after any command, the line is pulled high.

6.6.10.1 HDQ Protocol

Table 6-122 and Table 6-123 assume testing over the recommended operating conditions (see Figure 6-57 through Figure 6-60).

Table 6-122 HDQ Timing Requirements

PARAMETER DESCRIPTION MIN MAX UNIT
tCYCD Bit window 253 s
tHW1 Reads 1 68
tHW0 Reads 0 180
tRSPS Command to host respond time(1)
(1) Defined by software.

Table 6-123 HDQ Switching Characteristics

PARAMETER DESCRIPTION MIN TYP MAX UNIT
tB Break timing 193 s
tBR Break recovery 63
tCYCH Bit window 253
tDW1 Sends1 (write) 1.3
tDW0 Sends0 (write) 101
SWPS030-095.gifFigure 6-57 HDQ Break (Reset) Timing
SWPS030-096.gifFigure 6-58 HDQ Read Bit Timing (Data)
SWPS030-097.gifFigure 6-59 HDQ Write Bit Timing (Command/Address or Data)
SWPS030-098.gifFigure 6-60 HDQ Communication Timing

6.6.10.2 1-Wire Protocol

Table 6-124 and Table 6-125 assume testing over the recommended operating conditions (see Figure 6-61 through Figure 6-63).

Table 6-124 1-Wire Timing Requirements

PARAMETER DESCRIPTION MIN MAX UNIT
tPDH Presence pulse delay high 68 s
tPDL Presence pulse delay low 68 tPDH
tRDV + tREL Read bit-zero time 102

Table 6-125 1-Wire Switching Characteristics

PARAMETER DESCRIPTION MIN TYP MAX UNIT
tRSTL Reset time low 484 s
tRSTH Reset time high 484
tSLOT Write bit cycle time 102
tLOW1 Write bit-one time 1.3
tLOW0 Write bit-zero time 101
tREC Recovery time 134
tLOWR Read bit strobe time 13
SWPS030-099.gifFigure 6-61 1-Wire Break (Reset) Timing
SWPS030-100.gifFigure 6-62 1-Wire Read Bit Timing (Data)
SWPS030-101.gifFigure 6-63 1-Wire Write Bit Timing (Command/Address or Data)

6.6.11 I2C Interface

The multimaster I2C peripheral provides an interface between two or more devices via an I2C serial bus. The I2C controller supports the multimaster mode which allows more than one device capable of controlling the bus to be connected to it. Each I2C device is recognized by a unique address and can operate as either transmitter or receiver, according to the function of the device. In addition to being a transmitter or receiver, a device connected to the I2C bus can also be considered as master or slave when performing data transfers. This data transfer is carried out via two serial bidirectional wires:

  • An SDA data line
  • An SCL clock line

The following sections illustrate the data transfer is in master or slave configuration with 7-bit addressing format. The I2C interface is compliant with Philips I2C specification version 2.1. It supports standard mode (up to 100K bits/s), fast mode (up to 400K bits/s) and high-speed mode (up to 3.4Mb/s) .

6.6.11.1 I2C Standard/Fast-Speed Mode

Table 6-126 I2C Standard/Fast-Speed Mode Timings

1.8V, 3.3-V
NO. PARAMETER(3) STANDARD MODE FAST MODE UNIT
MIN MAX MIN MAX
fSCL Clock Frequency, i2cX_scl 100 400 kHz
I1 tw(SCLH) Pulse Duration, i2cX_scl high 4 0.6 s
I2 tw(SCLL) Pulse Duration, i2cX_scl low 4.7 1.3 s
I3 tsu(SDAV-SCLH) Setup time, i2cX_sda valid before i2cX_scl active level 250 100(1) ns
I4 th(SCLHSDAV) Hold time, i2cX_sda valid after i2cX_scl active level 3.45(2) 0.9(2) s
I5 tsu(SDAL-SCLH) Setup time, i2cX_scl high after i2cX_sda low (for a START(4) condition or a repeated START condition) 4.7 0.6 s
I6 th(SCLHSDAH) Hold time, i2cX_sda low level after i2cX_scl high level (STOP condition) 4 0.6 s
I7 th(SCLHRSTART) Hold time, i2cX_sda low level after i2cX_scl high level (for a repeated START condition) 4 0.6 s
I8 tw(SDAH) Pulse duration, i2cX_sda high between STOP and START conditions 4.7 1.3 s
tR(SCL) Rise time, i2cX_scl 1000 300 ns
tF(SCL) Fall time, i2cX_scl 300 300 ns
tR(SDA) Rise time, i2cX_sda 1000 300 ns
tF(SDA) Fall time, i2cX_sda 300 300 ns
CB Capacitive load for each bus line 60 60 pF
(1) A fast-mode I2C-bus device can be used in a standard-mode I2C-bus system, but the requirement tsu(SDAV-SCLH) 250 ns must then be met. This is automatically the case if the device does not stretch the low period of the i2cx_scl. If such a device does stretch the low period of the i2cx_scl, it must output the next data bit to the i2cx_sda line tr(SDA) max + tsu(SDAV-SCLH) = 1000 + 250 = 1250 ns (according to the standard-mode I2C-bus specification) before the i2cx_scl line is released.
(2) The maximum th(SCLH-SDA) has only to be met if the device does not stretch the low period of the i2cx_scl signal.
(3) In i2cX, X is equal to 1, 2, or 3.
(4) After this time, the first clock is generated.
SWPS030-093.gifFigure 6-64 I2C Standard/Fast Mode

6.6.11.2 I2C High-Speed Mode

Table 6-127 I2C High-Speed Mode Timings(3)(4)

1.8V, 3.3V
NO. PARAMETER UNIT
MIN MAX
fSCL Clock frequency, i2cX_scl 3.4 MHz
I1 tw(SCLH) Pulse duration, i2cX_scl high 60(1) s
I2 tw(SCLL) Pulse duration, i2cX_scl low 160(1) s
I3 tsu(SDAV-SCLH) Setup time, i2cX_sda valid before i2cX_scl active level 10 ns
I4 th(SCLHSDAV) Hold time, i2cX_sda valid after i2cX_scl active level 70 s
I5 tsu(SDAL-SCLH) Setup time, i2cX_scl high after i2cX_sda low
(for a START(2) condition or a repeated START condition)
160 s
I6 th(SCLHSDAH) Hold time, i2cX_sda low level after i2cX_scl high level (STOP condition) 160 s
I7 th(SCLHRSTART) Hold time, i2cX_sda low level after i2cX_scl high level (for a repeated START condition) 160 ns
tR(SCL) Rise time, i2cX_scl 10 40 ns
tR(SCL) Rise time, i2cX_scl after a repeated START condition and after a bit acknowledge 10 80 ns
tF(SCL) Fall time, i2cX_scl 10 40 ns
tR(SDA) Rise time, i2cX_sda 10 80 ns
tF(SDA) Fall time, i2cX_sda 10 80 ns
(1) HS-mode master devices generate a serial clock signal with a high to low ratio of 1 to 2. tw(SCLL) > 2 tw(SCLH).
(2) After this time, the first clock is generated.
(3) In i2cX, X is equal to 1, 2, or 3.
(4) The device provides (via the I2C bus) a hold time of at least 300 ns for the i2cx_sda signal (refer to the fall and rise time of i2cx_scl) to bridge the undefined region of the falling edge of i2cx_scl.
SWPS030-094.gifFigure 6-65 I2C High-Speed Mode(1)(2)(3)
  1. HS-mode master devices generate a serial clock signal with a high-to-low ratio of 1 to 2. tw(SCLL) > 2 x tw(SCLH).
  2. In i2cX, X is equal to 1, 2, or 3.
  3. After this time, the first clock is generated.

Table 6-128 Correspondence Standard vs. TI Timing References

AM3517/05 STANDARD-I2C
S/F Mode HS Mode
fSCL FSCL FSCLH
I1 tw(SCLH) THIGH THIGH
I2 tw(SCLL) TLOW TLOW
I3 tsu(SDAV-SCLH) TSU;DAT TSU;DAT
I4 th(SCLH-SDAV) TSU;DAT TSU;DAT
I5 tsu(SDAL-SCLH) TSU;STA TSU;STA
I6 th(SCLH-SDAH) THD;STA THD;STA
I7 th(SCLH-RSTART) TSU;STO TSU;STO
I8 tw(SDAH) TBUF

6.7 Removable Media Interfaces

6.7.1 High-Speed Multimedia Memory Card (MMC) and Secure Digital IO Card (SDIO) Timing

The MMC/SDIO host controller provides an interface to high-speed and standard MMC, SD memory cards, or SDIO cards. The application interface is responsible for managing transaction semantics. The MMC/SDIO host controller deals with MMC/SDIO protocol at transmission level, packing data, adding CRC, start/end bit, and checking for syntactical correctness.

There are three MMC interfaces on the AM3517/05:

  • MMC/SD/SDIO Interface 1:
    • 1.8-V/3.3-V support
    • 8 bits
  • MMC/SD/SDIO Interface 2:
    • 1.8-V/3.3-V support
    • 8 bits
    • 4 bits with external transceiver allowing to support 1.8-V/3.3-V peripherals in 1.8-V mode operation. Transceiver direction control signals are multiplexed with the upper four data bits.
  • MMC/SD/SDIO Interface 3:
    • 1.8-V/3.3-V support
    • 8 bits

6.7.1.1 MMC/SD/SDIO in SD Identification Mode

Table 6-129 through Table 6-131 assume testing over the recommended operating conditions and electrical characteristic conditions.

Table 6-129 MMC/SD/SDIO Timing Conditions SD Identification Mode

TIMING CONDITION PARAMETER 1.8V, 3.3V UNIT
MIN MAX
SD Identification Mode
Input Conditions
tr Input signal rise time 10 ns
tf Input signal fall time 10 ns
Output Conditions
CLOAD Output load capacitance 30 pF

Table 6-130 MMC/SD/SDIO Timing Requirements SD Identification Mode(1)(2)(3)(4)

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
SD Identification Mode
MMC/SD/SDIO Interface 1
HSSD3/SD3 tsu(CMDV-CLKIH) Setup time, mmc1_cmd valid before mmc1_clk rising clock edge 1198.4 ns
HSSD4/SD4 tsu(CLKIH-CMDIV) Hold time, mmc1_cmd valid after mmc1_clk rising clock edge 1249.2 ns
MMC/SD/SDIO Interface 2
HSSD3/SD3 tsu(CMDV-CLKIH) Setup time, mmc2_cmd valid before mmc2_clk rising clock edge 1198.4 ns
HSSD4/SD4 tsu(CLKIH-CMDIV) Hold time, mmc2_cmd valid after mmc2_clk rising clock edge 1249.2 ns
MMC/SD/SDIO Interface 3
HSSD3/SD3 tsu(CMDV-CLKIH) Setup time, mmc3_cmd valid before mmc3_clk rising clock edge 1198.4 ns
HSSD4/SD4 tsu(CLKIH-CMDIV) Hold time, mmc3_cmd valid after mmc3_clk rising clock edge 1249.2 ns
(1) Timing parameters refer to output clock specified in Table 6-131.
(2) The timing requirements are assured for the cycle jitter and duty cycle error conditions specified in Table 6-131.
(3) Corresponding figures showing timing parameters are common with other interface modes. (See SD and HS SD modes).
(4) For more information, see the AM35x ARM Microprocessor Technical Reference Manual (SPRUGR0).

Table 6-131 MMC/SD/SDIO Switching Characteristics SD Identification Mode(3)(2)

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
SD Identification Mode
HSSD1/SD1 tc(clk) Cycle time, output clk period 2500 ns
HSSD2/SD2 tW(clkH) Typical pulse duration, output clk high X(4)*PO(1) ns
HSSD2/SD2 tW(clkL) Typical pulse duration, output clk low Y(5)*PO(1) ns
tdc(clk) Duty cycle error, output clk 125 ns
tj(clk) Jitter standard deviation, output clk 200 ps
MMC/SD/SDIO Interface 1
tr(clk) Rise time, output clk 10 ns
tf(clkH) Fall time, output clk 10 ns
tr(clkL) Rise time, output data 10 ns
tf(clk) Fall time, output data 10 ns
HSSD5/SD5 td(CLKOH-CMD) Delay time, mmc1_clk rising clock edge to mmc1_cmd transition 6.3 2492.7 ns
MMC/SD/SDIO Interface 2
tr(clk) Rise time, output clk 10 ns
tf(clkH) Fall time, output clk 10 ns
tr(clkL) Rise time, output data 10 ns
tf(clk) Fall time, output data 10 ns
HSSD5/SD5 td(CLKOH-CMD) Delay time, mmc2_clk rising clock edge to mmc2_cmd transition 6.3 2492.7 ns
MMC/SD/SDIO Interface 3
tr(clk) Rise time, output clk 10 ns
tf(clkH) Fall time, output clk 10 ns
tr(clkL) Rise time, output data 10 ns
tf(clk) Fall time, output data 10 ns
HSSD5/SD5 td(CLKOH-CMD) Delay time, mmc3_clk rising clock edge to mmc3_cmd transition 6.3 2492.7 ns
(1) PO = output clk period in ns.
(2) The jitter probability density can be approximated by a Gaussian function.
(3) Corresponding figures showing timing parameters are common with other interface modes (see SD and HS SD modes).
(4) The X parameter is defined as listed below.
(5) The Y parameter is defined as listed below.

Table 6-132 X Parameter

CLKD X
1 or Even 0.5
Odd (trunc[CLKD/2]+1)/CLKD

Table 6-133 Y Parameter

CLKD Y
1 or Even 0.5
Odd (trunc[CLKD/2])/CLKD

6.7.1.2 MMC/SD/SDIO in High-Speed MMC Mode

Table 6-134 through Table 6-136 assume testing over the recommended operating conditions and electrical characteristic conditions.

Table 6-134 MMC/SD/SDIO Timing Conditions High-Speed MMC Mode

TIMING CONDITION PARAMETER 1.8V, 3.3V UNIT
MIN MAX
High-Speed MMC Mode
Input Conditions
tr Input signal rise time 0.19 3 ns
tf Input signal fall time 0.19 3 ns
Output Conditions
CLOAD Output load capacitance 30 pF

Table 6-135 MMC/SD/SDIO Timing Requirements High-Speed MMC Mode(4)(1)(2)(3)

NO. PARAMETER 1.8 V 3.3V UNIT
MIN MAX MIN MAX
High-Speed MMC Mode
MMC/SD/SDIO Interface 1
MMC3 tsu(CMDV-CLKIH) Setup time, mmc1_cmd valid before mmc1_clk rising clock edge 2.13 2.41 ns
MMC4 th(CLKIH-CMDIV) Hold time, mmc1_cmd valid after mmc1_clk rising clock edge 3.47 2.09 ns
MMC7 tsu(DATxV-CLKIH) Setup time, mmc1_datx valid before mmc1_clk rising clock edge 2.13 2.41 ns
MMC8 th(CLKIH-DATxIV) Hold time, mmc1_datx valid after mmc1_clk rising clock edge 3.47 2.09 ns
MMC/SD/SDIO Interface 2
MMC3 tsu(CMDV-CLKIH) Setup time, mmc2_cmd valid before mmc2_clk rising clock edge 2.88 3.23 ns
MMC4 th(CLKIH-CMDIV) Hold time, mmc2_cmd valid after mmc2_clk rising clock edge 2.90 1.46 ns
MMC7 tsu(DATxV-CLKIH) Setup time, mmc2_datx valid before mmc2_clk rising clock edge 2.88 3.23 ns
MMC8 th(CLKIH-DATxIV) Hold time, mmc2_datx valid after mmc2_clk rising clock edge 2.90 1.46 ns
MMC/SD/SDIO Interface 3
MMC3 tsu(CMDV-CLKIH) Setup time, mmc3_cmd valid before mmc3_clk rising clock edge 3.38 3.41 ns
MMC4 th(CLKIH-CMDIV) Hold time, mmc3_cmd valid after mmc3_clk rising clock edge 2.83 1.46 ns
MMC7 tsu(DATxV-CLKIH) Setup time, mmc3_datx valid before mmc3_clk rising clock edge 3.38 3.41 ns
MMC8 th(CLKIH-DATxIV) Hold time, mmc3_datx valid after mmc3_clk rising clock edge 2.83 1.46 ns
(1) Timing parameters refer to output clock specified in Table 6-136.
(2) The timing requirements are assured for the cycle jitter and duty cycle error conditions specified in Table 6-136.
(3) Corresponding figures showing timing parameters are common with Standard MMC mode.
(4) In datx, x is equal to 1, 2, 3, 4, 5, 6, or 7.

Table 6-136 MMC/SD/SDIO Switching Characteristics High-Speed MMC Mode(3)(2)

N O. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
High-Speed MMC Mode
MMC1 tc(clk) Cycle time, output clk period 20.83 ns
MMC2 tW(clkH) Typical pulse duration, output clk high X(4)*PO(1) ns
MMC2 tW(clkL) Typical pulse duration, output clk low Y(5)*PO(1) ns
tdc(clk) Duty cycle error, output clk 1041.67 ps
tj(clk) Jitter standard deviation, output clk 200 ps
MMC/SD/SDIO Interface 1
tc(clk) Rise time, output clk 3 ns
tW(clkH) Fall time, output clk 3 ns
tW(clkL) Rise time, output data 3 ns
tdc(clk) Fall time, output data 3 ns
MMC5 td(CLKOH-CMD) Delay time, mmc1_clk rising clock edge to mmc1_cmd transition 3.7 14.11 ns
MMC6 td(CLKOH-DATx) Delay time, mmc1_clk rising clock edge to mmc1_datx transition 3.7 16.50 ns
MMC/SD/SDIO Interface 2
tc(clk) Rise time, output clk 3 ns
tW(clkH) Fall time, output clk 3 ns
tW(clkL) Rise time, output data 3 ns
tdc(clk) Fall time, output data 3 ns
MMC5 td(CLKOH-CMD) Delay time, mmc2_clk rising clock edge to mmc2_cmd transition 3.7 14.11 ns
MMC6 td(CLKOH-DATx) Delay time, mmc2_clk rising clock edge to mmc2_datx transition 3.7 16.50 ns
MMC/SD/SDIO Interface 3
tc(clk) Rise time, output clk 3 ns
tW(clkH) Fall time, output clk 3 ns
tW(clkL) Rise time, output data 3 ns
tdc(clk) Fall time, output data 3 ns
MMC5 td(CLKOH-CMD) Delay time, mmc3_clk rising clock edge to mmc3_cmd transition 3.7 14.11 ns
MMC6 td(CLKOH-DATx) Delay time, mmc3_clk rising clock edge to mmc3_datx transition 3.7 14.11 ns
(1) PO = output clk period in ns.
(2) The jitter probability density can be approximated by a Gaussian function.
(3) In datx, x is equal to 1, 2, 3, 4, 5, 6, or 7.
(4) The X parameter is defined as listed below.
(5) The Y parameter is defined as listed below.

Table 6-137 X Parameter

CLKD X
1 or Even 0.5
Odd (trunc[CLKD/2]+1)/CLKD

Table 6-138 Y Parameter

CLKD Y
1 or Even 0.5
Odd (trunc[CLKD/2])/CLKD

For details about clock division factor CLKD, see the AM35x ARM Microprocessor Technical Reference Manual (SPRUGR0).

6.7.1.3 MMC/SD/SDIO in Standard MMC Mode and MMC Identification Mode

Table 6-139 through Table 6-141 assume testing over the recommended operating conditions and electrical characteristic conditions.

Table 6-139 MMC/SD/SDIO Timing Conditions Standard MMC Mode and MMC Identification Mode

TIMING CONDITION PARAMETER 1.8-V,3.3-V UNIT
MIN MAX
Standard MMC Mode and MMC Identification Mode
Input Conditions
tr Input signal rise time 0.19 10 ns
tf Input signal fall time 0.19 10 ns
Output Conditions
CLOAD Output load capacitance 30 pF

Table 6-140 MMC/SD/SDIO Timing Requirements Standard MMC Mode and MMC Identification Mode(1)(2)(3)

NO. PARAMETER 1.8 V 3.3V UNIT
MIN MAX MIN MAX
Standard MMC Mode and MMC Identification Mode
MMC/SD/SDIO Interface 1
MMC3 tsu(CMDV-CLKIH) Setup time, mmc1_cmd valid before mmc1_clk rising clock edge 2.13 2.41 ns
MMC4 th(CLKIH-CMDIV) Hold time, mmc1_cmd valid after mmc1_clk rising clock edge 3.47 2.09 ns
MMC7 tsu(DATxV-CLKIH) Setup time, mmc1_datx valid before mmc1_clk rising clock edge 2.13 2.41 ns
MMC8 th(CLKIH-DATxIV) Hold time, mmc1_datx valid after mmc1_clk rising clock edge 3.47 2.09 ns
MMC/SD/SDIO Interface 2
MMC3 tsu(CMDV-CLKIH) Setup time, mmc2_cmd valid before mmc2_clk rising clock edge 2.88 3.23 ns
MMC4 th(CLKIH-CMDIV) Hold time, mmc2_cmd valid after mmc2_clk rising clock edge 2.90 1.46 ns
MMC7 tsu(DATxV-CLKIH) Setup time, mmc2_datx valid before mmc2_clk rising clock edge 2.88 3.23 ns
MMC8 th(CLKIH-DATxIV) Hold time, mmc2_datx valid after mmc2_clk rising clock edge 2.90 1.46 ns
MMC/SD/SDIO Interface 3
MMC3 tsu(CMDV-CLKIH) Setup time, mmc3_cmd valid before mmc3_clk rising clock edge 3.38 3.41 ns
MMC4 th(CLKIH-CMDIV) Hold time, mmc3_cmd valid after mmc3_clk rising clock edge 2.83 1.46 ns
MMC7 tsu(DATxV-CLKIH) Setup time, mmc3_datx valid before mmc3_clk rising clock edge 3.38 3.41 ns
MMC8 th(CLKIH-DATxIV) Hold time, mmc3_datx valid after mmc3_clk rising clock edge 2.83 1.46 ns
(1) Timing parameters are referred to output clock specified in Table 6-141.
(2) The timing requirements are assured for the cycle jitter and duty cycle error conditions specified in Table 6-141.
(3) In datx, x is equal to 1, 2, 3, 4, 5, 6, or 7.

Table 6-141 MMC/SD/SDIO Switching Characteristics Standard MMC Mode and MMC Identification Mode(2)(1)

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
MMC Identification Mode
MMC1 tc(clk) Cycle time 2500 ns
MMC2 tW(clkH) Typical pulse duration, output clk high X(3)*PO(5) ns
MMC2 tW(clkL) Typical pulse duration, output clk low Y(4)*PO(5) ns
tdc(clk) Duty cycle error, output clk 2604.17 ns
tj(clk) Jitter standard deviation 200 ps
Standard MMC Mode
MMC1 tc(clk) Cycle time 2500 ns
MMC2 tW(clkH) Typical pulse duration, output clk high X(3)*PO(5) ns
MMC2 tW(clkL) Typical pulse duration, output clk low Y(4)*PO(5) ns
tdc(clk) Duty cycle error, output clk 2604.17 ps
tj(clk) Jitter standard deviation 200 ps
MMC/SD/SDIO Interface 1
tr(clk) Rise time, output clk 10 ns
tf(clkH) Fall time, output clk 10 ns
tr(clkL) Rise time, output data 10 ns
tf(clk) Fall time, output data 10 ns
MMC5 td(CLKOH-CMD) Delay time, mmc1_clk rising clock edge to mmc1_cmd transition 4.3 47.78 ns
MMC6 td(CLKOH-DATx) Delay time, mmc1_clk rising clock edge to mmc1_datx transition 4.3 47.78 ns
MMC/SD/SDIO Interface 2
tr(clk) Rise time, output clk 10 ns
tf(clkH) Fall time, output clk 10 ns
tr(clkL) Rise time, output data 10 ns
tf(clk) Fall time, output data 10 ns
MMC5 td(CLKOH-CMD) Delay time, mmc2_clk rising clock edge to mmc2_cmd transition 4.3 47.78 ns
MMC6 td(CLKOH-DATx) Delay time, mmc2_clk rising clock edge to mmc2_datx transition 4.3 47.78 ns
MMC/SD/SDIO Interface 3
tr(clk) Rise time, output clk 10 ns
tf(clkH) Fall time, output clk 10 ns
tr(clkL) Rise time, output data 10 ns
tf(clk) Fall time, output data 10 ns
MMC5 td(CLKOH-CMD) Delay time, mmc3_clk rising clock edge to mmc3_cmd transition 4.3 47.78 ns
MMC6 td(CLKOH-DATx) Delay time, mmc3_clk rising clock edge to mmc3_datx transition 4.3 47.78 ns
(1) The jitter probability density can be approximated by a Gaussian function.
(2) In datx, x is equal to 1, 2, 3, 4, 5, 6, or 7.
(3) The X parameter is defined as listed below.
(4) The Y parameter is defined as listed below.
(5) PO = output clk period in ns.

Table 6-142 X Parameter

CLKD X
1 or Even 0.5
Odd (trunc[CLKD/2]+1)/CLKD

Table 6-143 Y Parameter

CLKD Y
1 or Even 0.5
Odd (trunc[CLKD/2])/CLKD

For details about clock division factor CLKD, see the AM35x ARM Microprocessor Technical Reference Manual (SPRUGR0).

SWPS030-104.gif
In mmcx, x is equal to 1, 2, or 3.
Figure 6-66 MMC/SD/SDIO High-Speed and Standard MMC Modes Data/Command Receive
SWPS030-105.gif
In mmcx, x is equal to 1, 2, or 3.
Figure 6-67 MMC/SD/SDIO High-Speed and Standard MMC Modes Data/Command Transmit

6.7.1.4 MMC/SD/SDIO in High-Speed SD Mode

Table 6-144 through Table 6-146 assume testing over the recommended operating conditions and electrical characteristic conditions.

Table 6-144 MMC/SD/SDIO Timing Conditions High-Speed SD Mode

TIMING CONDITION PARAMETER 1.8V, 3.3V UNIT
MIN MAX
High-Speed SD Mode
Input Conditions
tR Input signal rise time 0.19 3 ns
tF Input signal fall time 0.19 3 ns
Output Conditions
CLOAD Output load capacitance 30 pF

Table 6-145 MMC/SD/SDIO Timing Requirements High-Speed SD Mode(3)(2)(1)

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
High-Speed SD Mode
MMC/SD/SDIO Interface 1
HSSD3 tsu(CMDV-CLKIH) Setup time, mmc1_cmd valid before mmc1_clk rising clock edge 5.61 ns
HSSD4 th(CLKIH-CMDIV) Hold time, mmc1_cmd valid after mmc1_clk rising clock edge 2.28 ns
HSSD7 tsu(DATxV-CLKIH) Setup time, mmc1_datx valid before mmc1_clk rising clock edge 5.61 ns
HSSD8 th(CLKIH-DATxIV) Hold time, mmc1_datx valid after mmc1_clk rising clock edge 2.28 ns
MMC/SD/SDIO Interface 2
HSSD3 tsu(CMDV-CLKIH) Setup time, mmc2_cmd valid before mmc2_clk rising clock edge 5.61 ns
HSSD4 th(CLKIH-CMDIV) Hold time, mmc2_cmd valid after mmc2_clk rising clock edge 2.28 ns
HSSD7 tsu(DATxV-CLKIH) Setup time, mmc2_datx valid before mmc2_clk rising clock edge 5.61 ns
HSSD8 th(CLKIH-DATxIV) Hold time, mmc2_datx valid after mmc2_clk rising clock edge 2.28 ns
MMC/SD/SDIO Interface 3
HSSD3 tsu(CMDV-CLKIH) Setup time, mmc3_cmd valid before mmc3_clk rising clock edge 5.61 ns
HSSD4 th(CLKIH-CMDIV) Hold time, mmc3_cmd valid after mmc3_clk rising clock edge 2.28 ns
HSSD7 tsu(DATxV-CLKIH) Setup time, mmc3_datx valid before mmc3_clk rising clock edge 5.61 ns
HSSD8 th(CLKIH-DATxIV) Hold time, mmc3_datx valid after mmc3_clk rising clock edge 2.28 ns
(1) Timing Parameters refer to output clock specified in Table 6-146.
(2) The timing requirements are assured for the cycle jitter and duty cycle error conditions specified in Table 6-146.
(3) In datx, x is equal to 1, 2, 3, 4, 5, 6, or 7.

Table 6-146 MMC/SD/SDIO Switching Characteristics High-Speed SD Mode(3)(2)

NO. PARAMETER 1.8 V, 3.3 V UNIT
MIN MAX
High-Speed SD Mode
HSSD1 tc(clk) Cycle time 20.83 ns
HSSD2 tW(clkH) Typical pulse duration, output clk high X(4)*PO(1) ns
HSSD2 tW(clkL) Typical pulse duration, output clk low Y(5)*PO(1) ns
tdc(clk) Duty cycle error, output clk 1041.67 ps
tj(clk) Jitter standard deviation 200 ps
MMC/SD/SDIO Interface 1
tr(clk) Rise time, output clk 3 ns
tf(clkH) Fall time, output clk 3 ns
tr(clkL) Rise time, output data 3 ns
tf(clk) Fall time, output data 3 ns
HSSD5 td(CLKOH-CMD) Delay time, mmc1_clk rising clock edge to mmc1_cmd transition 3.72 14.11 ns
HSSD6 td(CLKOH-DATx) Delay time, mmc1_clk rising clock edge to mmc1_datx transition 3.72 14.11 ns
MMC/SD/SDIO Interface 2
tr(clk) Rise time, output clk 3 ns
tf(clkH) Fall time, output clk 3 ns
tr(clkL) Rise time, output data 3 ns
tf(clk) Fall time, output data 3 ns
HSSD5 td(CLKOH-CMD) Delay time, mmc2_clk rising clock edge to mmc2_cmd transition 3.72 14.11 ns
HSSD6 td(CLKOH-DATx) Delay time, mmc2_clk rising clock edge to mmc2_datx transition 3.72 14.11 ns
MMC/SD/SDIO Interface 3
tr(clk) Rise time, output clk 3 ns
tf(clkH) Fall time, output clk 3 ns
tr(clkL) Rise time, output data 3 ns
tf(clk) Fall time, output data 3 ns
HSSD5 td(CLKOH-CMD) Delay time, mmc3_clk rising clock edge to mmc3_cmd transition 3.72 14.11 ns
HSSD6 td(CLKOH-DATx) Delay time, mmc3_clk rising clock edge to mmc3_datx transition 3.72 14.11 ns
(1) PO = output clk period in ns.
(2) The jitter probability density can be approximated by a Gaussian function.
(3) In datx, x is equal to 1, 2, 3, 4, 5, 6, or 7.
(4) The X parameter is defined as listed in Table 6-147.
(5) The Y parameter is defined as listed in Table 6-148.

Table 6-147 X Parameters

CLKD X
1 or Even 0.5
Odd (trunc[CLKD/2]+1)/CLKD

Table 6-148 Y Parameters

CLKD Y
1 or Even 0.5
Odd (trunc[CLKD/2])/CLKD

For details about clock division factor CLKD, see the AM35x ARM Microprocessor Technical Reference Manual (SPRUGR0).

SWPS030-106.gif
In mmcx, x is equal to 1, 2, or 3.
Figure 6-68 MMC/SD/SDIO High-Speed SD Mode Data/Command Receive
SWPS030-107.gif
In mmcx, x is equal to 1, 2, or 3.
Figure 6-69 MMC/SD/SDIO High-Speed SD Mode Data/Command Transmit

6.7.1.5 MMC/SD/SDIO in Standard SD Mode

Table 6-149 through Table 6-151 assume testing over the recommended operating conditions and electrical characteristic conditions.

Table 6-149 MMC/SD/SDIO Timing Conditions Standard SD Mode

TIMING CONDITION PARAMETER 1.8V, 3.3V UNIT
MIN MAX
Standard SD Mode
Input Conditions
tR Input signal rise time 0.19 10 ns
tF Input signal fall time 0.19 10 ns
Output Conditions
CLOAD Output load capacitance 30 pF

Table 6-150 MMC/SD/SDIO Timing Requirements Standard SD Mode(1)(2)(3)

NO. PARAMETER 1.8 V, 3.3V UNIT
MIN MAX
Standard SD Mode
MMC/SD/SDIO Interface 1
SD3 tsu(CMDV-CLKIH) Setup time, mmc1_cmd valid before mmc1_clk rising clock edge 6.23 ns
SD4 th(CLKIH-CMDIV) Hold time, mmc1_cmd valid after mmc1_clk rising clock edge 19.37 ns
SD7 tsu(DATxV-CLKIH) Setup time, mmc1_datx valid before mmc1_clk rising clock edge 6.23 ns
SD8 th(CLKIH-DATxIV) Hold time, mmc1_datx valid after mmc1_clk rising clock edge 19.37 ns
MMC/SD/SDIO Interface 2
SD3 tsu(CMDV-CLKIH) Setup time, mmc2_cmd valid before mmc2_clk rising clock edge 6.23 ns
SD4 th(CLKIH-CMDIV) Hold time, mmc2_cmd valid after mmc2_clk rising clock edge 19.37 ns
SD7 tsu(DATxV-CLKIH) Setup time, mmc2_datx valid before mmc2_clk rising clock edge 6.23 ns
SD8 th(CLKIH-DATxIV) Hold time, mmc2_datx valid after mmc2_clk rising clock edge 19.37 ns
MMC/SD/SDIO Interface 3
SD3 tsu(CMDV-CLKIH) Setup time, mmc3_cmd valid before mmc3_clk rising clock edge 6.23 ns
SD4 th(CLKIH-CMDIV) Hold time, mmc3_cmd valid after mmc3_clk rising clock edge 19.37 ns
SD7 tsu(DATxV-CLKIH) Setup time, mmc3_datx valid before mmc3_clk rising clock edge 6.23 ns
SD8 th(CLKIH-DATxIV) Hold time, mmc3_datx valid after mmc3_clk rising clock edge 19.37 ns
(1) Timing parameters refer to output clock specified in Table 6-151.
(2) The timing requirements are assured for the cycle jitter and duty cycle error conditions specified in Table 6-151.
(3) In datx, x is equal to 1, 2, 3, 4, 5, 6, or 7.

Table 6-151 MMC/SD/SDIO Switching Characteristics Standard SD Mode(2)(3)

NO. PARAMETER 1.8V, 3.3V UNIT
MIN MAX
Standard SD Mode
SD1 tc(clk) Cycle time 41.67 ns
SD2 tW(clkH) Typical pulse duration, output clk high X(4)*PO(1) ns
SD2 tW(clkL) Typical pulse duration, output clk low Y(5)*PO(1) ns
tdc(clk) Duty cycle error, output clk 2083.33 ps
tj(clk) Jitter standard deviation 200 ps
MMC/SD/SDIO Interface 1
tr(clk) Rise time, output clk 10 ns
tf(clkH) Fall time, output clk 10 ns
tr(clkL) Rise time, output data 10 ns
tf(clk) Fall time, output data 10 ns
SD5 td(CLKOH-CMD) Delay time, mmc1_clk rising clock edge to mmc1_cmd transition 6.13 35.53 ns
SD6 td(CLKOH-DATx) Delay time, mmc1_clk rising clock edge to mmc1_datx transition 6.13 35.53 ns
MMC/SD/SDIO Interface 2
tr(clk) Rise time, output clk 10 ns
tf(clkH) Fall time, output clk 10 ns
tr(clkL) Rise time, output data 10 ns
tf(clk) Fall time, output data 10 ns
SD5 td(CLKOH-CMD) Delay time, mmc2_clk rising clock edge to mmc2_cmd transition 6.13 35.53 ns
SD6 td(CLKOH-DATx) Delay time, mmc2_clk rising clock edge to mmc2_datx transition 6.13 35.53 ns
MMC/SD/SDIO Interface 3
tr(clk) Rise time, output clk 10 ns
tf(clkH) Fall time, output clk 10 ns
tr(clkL) Rise time, output data 10 ns
tf(clk) Fall time, output data 10 ns
SD5 td(CLKOH-CMD) Delay time, mmc3_clk rising clock edge to mmc3_cmd transition 6.13 35.53 ns
SD6 td(CLKOH-DATx) Delay time, mmc3_clk rising clock edge to mmc3_datx transition 6.13 35.53 ns
(1) PO = output clk period in ns.
(2) The jitter probability density can be approximated by a Gaussian function.
(3) In datx, x is equal to 1, 2, 3, 4, 5, 6, or 7.
(4) The X parameter is defined as listed in Table 6-152.
(5) The Y parameter is defined as listed in Table 6-153.

Table 6-152 X Parameter

CLKD X
1 or Even 0.5
Odd (trunc[CLKD/2]+1)/CLKD

Table 6-153 Y Parameter

CLKD Y
1 or Even 0.5
Odd (trunc[CLKD/2])/CLKD

For details about clock division factor CLKD, see the AM35x ARM Microprocessor Technical Reference Manual (SPRUGR0).

SWPS030-108.gif
In mmcx, x is equal to 1, 2, or 3.
Figure 6-70 MMC/SD/SDIO Standard SD Mode Data/Command Receive
SWPS030-109.gif
In mmcx, x is equal to 1, 2, or 3.
Figure 6-71 MMC/SD/SDIO Standard SD Mode Data/Command Transmit

6.8 Test Interfaces

The emulation and trace interfaces allow tracing activities of the following CPUs:

  • ARM CortexTM-A8 through an Embedded Trace Macro-cell (ETM11) dedicated to enable real-time trace of the ARM subsystem operations.

All processors can be emulated via JTAG ports.

6.8.1 Embedded Trace Macro Interface (ETM)

Table 6-154 assumes testing over the recommended operating conditions.

Table 6-154 Embedded Trace Macro Interface Switching Characteristics

NO. PARAMETER MIN MAX UNIT
f 1/tc(CLK) Frequency, etk_clk 166 MHz
ETM0 tc(CLK) Cycle time 6.02 ns
ETM1 tW(CLK) Clock pulse width, etk_clk 3.01 ns
ETM2 td(CLK-CTL) Delay time, etk_clk clock edge to etk_ctl transition -0.5 0.5 ns
ETM3 td(CLK-D) Delay time, etk_clk clock high to etk_d[15:0] transition -0.5 0.5 ns
SWPS030-110.gifFigure 6-72 Embedded Trace Macro Interface

6.8.2 JTAG Interfaces

AM3517/05 JTAG TAP controller handles standard IEEE JTAG interfaces. The following sections define the timing requirements for several tools used to test the AM3517/05 processors as:

  • Free running clock tool, like XDS560 and XDS510 tools
  • Adaptive clock tool, like RealView ICE tool and Lauterbach tool

6.8.2.1 JTAG Free Running Clock Mode

Table 6-155 through Table 6-157 assume testing over the recommended operating conditions and electrical characteristic conditions.

Table 6-155 JTAG Timing Conditions Free Running Clock Mode

TIMING CONDITION PARAMETER 1.8 V 3.3 V UNIT
MAX MAX
Input Conditions
tR Input signal rise time 5 3 ns
tF Input signal fall time 5 3 ns
Output Conditions
CLOAD Output load capacitance 30 pF

Table 6-156 JTAG Timing Requirements Free Running Clock Mode(1)(2)(3)

NO. PARAMETER 1.8V 3.3V UNIT
MIN MAX MIN MAX
JT4 tc(tck) Cycle time 20 20 ns
JT5 tw(tckL) Typical pulse duration, jtag_tck low 10 10 ns
JT6 tw(tckH) Typical pulse duration, jtag_tck high 10 10 ns
tdc(tck) Duty cycle error, jtag_tck -1250 1250 -1250 1250 ps
tj(tck) Cycle jitter -1250 1250 -1250 1250 ps
JT7 tsu(tdiV-rtckH) Setup time, jtag_tdi valid before jtag_rtck high 1.8 3.8 ns
JT8 th(tdiV-rtckH) Hold time, jtag_tdi valid after jtag_rtck high 0.7 2.7 ns
JT9 tsu(tmsV-rtckH) Setup time, jtag_tms valid before jtag_rtck high 1.8 3.8 ns
JT10 th(tmsV-rtckH) Hold time, jtag_tms valid after jtag_rtck high 0.7 2.7 ns
JT12 tsu(emuxV-rtckH) Setup time, jtag_emux 14.6 14.6 ns
JT13 th(emuxV-rtckH) Hold time,jtag_emux 2 2 ns
(1) Maximum cycle jitter supported by jtag _tck input clock.
(2) x = 0 to 1
(3) The timing requirements are assured for the cycle jitter and duty cycle error conditions specified.

Table 6-157 JTAG Switching Characteristics Free Running Clock Mode(1)(2)

1.8 V 3.3 V
NO. PARAMETER MIN MAX MIN MAX UNIT 
JT1 tc(rtck) Cycle time(1), jtag_rtck period 20 20 ns
JT2 tw(rtckL) Typical pulse duration, jtag_rtck low 10 10 ns
JT3 tw(rtckH) Typical pulse duration, jtag_rtck high 10 10 ns
tdc(rtck) Duty cycle error, jtag_rtck -1250 1250 -1250 1250 ps
tj(rtck) Jitter standard deviation(2), jtag_rtck 33.33 33.33 ps
tR(rtck) Rise time, jtag_rtck 4 4 ns
tF(rtck) Fall time, jtag_rtck 4 4 ns
JT11 td(rtckL-tdoV) Delay time, jtag_rtck low to jtag_tdo valid -5.8 5.8 -8 8 ns
tR(tdo) Rise time, jtag_tdo 4 4 ns
tF(tdo) Fall time, jtag_tdo 4 4 ns
JT14 td(rtckH-emuxV) Delay time, jtag_rtck high to ,jtag_emux 2.7 15.1 2.7 15.1 ns
tR(emux) Rise time, jtag_emux 6 6 ns
tF(emux) Fall time, jtag_emux 6 6 ns
(1) Related with the jtag_rtck maximum frequency.
(2) The jitter probability density can be approximated by a Gaussian function.
SWPS030-113.gif
In jtag_emux, x is equal to 0 to 1.
Figure 6-73 JTAG Interface Timing Free Running Clock Mode

6.8.2.2 JTAG Adaptive Clock Mode

Table 6-158 through Table 6-160 assume testing over the recommended operating conditions and electrical characteristic conditions.

Table 6-158 JTAG Timing Conditions Adaptive Clock Mode

TIMING CONDITION PARAMETER 1.8 V 3.3 V UNIT
MAX MAX
Input Conditions
tR Input signal rise time 5 3 ns
tF Input signal fall time 5 3 ns
Output Conditions
CLOAD Output load capacitance 30 pF

Table 6-159 JTAG Timing Requirements Adaptive Clock Mode(1)(2)

1.8 V 3.3 V
NO. PARAMETER MIN MAX MIN MAX UNIT
JA4 tc(tck) Cycle time 20 20 ns
JA5 tw(tckL) Typical pulse duration, jtag_tck low 10 10 ns
JA6 tw(tckH) Typical pulse duration, jtag_tck high 10 10 ns
tdc(lclk) Duty cycle error, jtag_tck -2500 2500 -2500 2500 ps
tj(lclk) Cycle jitter -1500 1500 -1500 1500 ps
JA7 tsu(tdiV-tckH) Setup time, jtag_tdi valid before jtag_tck high 13.8 13.8 ns
JA8 th(tdiV-tckH) Hold time, jtag_tdi valid after jtag_tck high 13.8 13.8 ns
JA9 tsu(tmsV-tckH) Setup time, jtag_tms valid before jtag_tck high 13.8 13.8 ns
JA10 th(tmsV-tckH) Hold time, jtag_tms valid after jtag_tck high 13.8 13.8 ns
(1) Maximum cycle jitter supported by jtag _tck input clock.
(2) The timing requirements are assured for the cycle jitter and duty cycle error conditions specified.

Table 6-160 JTAG Switching Characteristics Adaptive Clock Mode(1)

1.8 V 3.3 V
NO. PARAMETER MIN MAX MIN MAX UNIT
JA1 tc(rtck) Cycle time 20 20 ns
JA2 tw(rtckL) Typical pulse duration, jtag_rtck low 10 10 ns
JA3 tw(rtckH) Typical pulse duration, jtag_rtck high 10 10 ns
tdc(rtck) Duty cycle error, jtag_rtck -2500 2500 -2500 2500 ps
tj(rtck) Jitter standard deviation 33.33 33.33 ps
tR(rtck) Rise time, jtag_rtck 4 4 ns
tF(rtck) Fall time, jtag_rtck 4 4 ns
JA11 td(rtckL-tdoV) Delay time, jtag_rtck low to jtag_tdo valid -14.6 14.6 -14.6 14.6 ns
tR(tdo) Rise time, jtag_tdo, 4 4 ns
tF(tdo) Fall time, jtag_tdo 4 4 ns
(1) The jitter probability density can be approximated by a Gaussian function.
SWPS030-114.gifFigure 6-74 JTAG Interface Timing Adaptive Clock Mode