8.3.1 Analog Input

The AMC1304-Q1 incorporates a front-end circuitry that contains a differential amplifier and sampling stage, followed by a ΔΣ modulator. The gain of the differential amplifier is set by internal precision resistors to a factor of 4 for devices with a specified input voltage range of ±250 mV (this value is for the AMC1304x25-Q1), or to a factor of 20 in devices with a ±50-mV input voltage range (for the AMC1304x05-Q1), resulting in a differential input impedance of 5 kΩ (for the AMC1304x05-Q1) or 25 kΩ (for the AMC1304x25-Q1).

Consider the input impedance of the AMC1304-Q1 in designs with high-impedance signal sources that can cause degradation of gain and offset specifications. The importance of this effect, however, depends on the desired system performance. Additionally, the input bias current caused by the internal common-mode voltage at the output of the differential amplifier causes an offset that is dependent on the actual amplitude of the input signal. See the Isolated Voltage Sensing section for more details on reducing these effects.

There are two restrictions on the analog input signals (AINP and AINN). First, if the input voltage exceeds the range AGND – 6 V to 3.7 V, the input current must be limited to 10 mA because the device input electrostatic discharge (ESD) diodes turn on. In addition, the linearity and noise performance of the device are ensured only when the differential analog input voltage remains within the specified linear full-scale range (FSR), that is ±250 mV (for the AMC1304x25-Q1) or ±50 mV (for the AMC1304x05-Q1), and within the specified input common-mode range.

8.3.2 Modulator

The modulator implemented in the AMC1304-Q1 is a second-order, switched-capacitor, feed-forward ΔΣ modulator, such as the one conceptualized in Figure 48. The analog input voltage V_IN and the output V₅ of the 1-bit digital-to-analog converter (DAC) are differentiated, providing an analog voltage V₁ at the input of the first integrator stage. The output of the first integrator feeds the input of the second integrator stage, resulting in output voltage V₃ that is differentiated with the input signal V_IN and the output of the first integrator V₂. Depending on the polarity of the resulting voltage V₄, the output of the comparator is changed. In this case, the 1-bit DAC responds on the next clock pulse by changing its analog output voltage V₅, causing the integrators to progress in the opposite direction and forcing the value of the integrator output to track the average value of the input.

Figure 48. Block Diagram of a Second-Order Modulator

The modulator shifts the quantization noise to high frequencies, as shown in Figure 49. Therefore, use a low-pass digital filter at the output of the device to increase the overall performance. This filter is also used to convert from the 1-bit data stream at a high sampling rate into a higher-bit data word at a lower rate (decimation). TI's microcontroller families TMS320F2807x and TMS320F2837x offer a suitable programmable, hardwired filter structure termed a sigma-delta filter module (SDFM) optimized for usage with the AMC1304-Q1 family. Alternatively, a field-programmable gate array (FPGA) can be used to implement the digital filter.

Figure 49. Quantization Noise Shaping

8.3.3 Digital Output

A differential input signal of 0 V ideally produces a stream of ones and zeros that are high 50% of the time. A differential input of 250 mV (for the AMC1304x25-Q1) or 50 mV (for the AMC1304x05-Q1) produces a stream of ones and zeros that are high 90% of the time. A differential input of –250 mV (–50 mV for the AMC1304x05-Q1) produces a stream of ones and zeros that are high 10% of the time. These input voltages are also the specified linear ranges of the different AMC1304-Q1 versions with performance as specified in this data sheet. If the input voltage value exceeds these ranges, the output of the modulator shows non-linear behavior when the quantization noise increases. The output of the modulator clips with a stream of only zeros with an input less than or equal to –312.5 mV (–62.5 mV for the AMC1304x05-Q1) or with a stream of only ones with an input greater than or equal to 312.5 mV (62.5 mV for the AMC1304x05-Q1). In this case, however, the AMC1304-Q1 generates a single 1 (if the input is at negative full-scale) or 0 every 128 clock cycles to indicate proper device function (see the Fail-Safe Output section for more details). The input voltage versus the output modulator signal is shown in Figure 50.

The density of ones in the output bit-stream for any input voltage value (with the exception of a full-scale input signal, as described in the Output Behavior in Case of a Full-Scale Input section) can be calculated using Equation 1:

Equation 1.

The AMC1304-Q1 system clock is typically 20 MHz and is provided externally at the CLKIN pin. Data are synchronously provided at 20 MHz at the DOUT pin. Data change at the CLKIN falling edge. For more details, see the Switching Characteristics table.

Figure 50. Analog Input versus AMC1304-Q1 Modulator Output

8.4.1 Fail-Safe Output

In the case of a missing high-side supply voltage (LDOIN), the output of a ΔΣ modulator is not defined and can cause a system malfunction. In systems with high safety requirements, this behavior is not acceptable. Therefore, the AMC1304-Q1 implements a fail-safe output function that ensures the device maintains its output level in case of a missing LDOIN, as shown in Figure 51.

Figure 51. Fail-Safe Output of the AMC1304-Q1

8.4.2 Output Behavior in Case of a Full-Scale Input

If a full-scale input signal is applied to the AMC1304-Q1 (that is, V_IN ≥ V_Clipping), the device generates a single one or zero every 128 bits at DOUT, depending on the actual polarity of the signal being sensed, as shown in Figure 52. In this way, differentiating between a missing LDOIN and a full-scale input signal is possible on the system level.

Figure 52. Overrange Output of the AMC1304-Q1