ZHCSQP9 March 2023 AMC1306M25E
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
tH | DOUT hold time after rising edge of CLKIN | CLOAD = 15 pF | 3.5 | ns | ||
tD | Rising edge of CLKIN to DOUT valid delay | CLOAD = 15 pF | 15 | ns | ||
tr | DOUT rise time | 10% to 90%, 2.7 V ≤ DVDD ≤ 3.6 V, CLOAD = 15 pF | 2.5 | 6 | ns | |
10% to 90%, 4.5 V ≤ DVDD ≤ 5.5 V, CLOAD = 15 pF | 3.2 | 6 | ||||
tf | DOUT fall time | 10% to 90%, 2.7 V ≤ DVDD ≤ 3.6 V, CLOAD = 15 pF | 2.2 | 6 | ns | |
10% to 90%, 4.5 V ≤ DVDD ≤ 5.5 V,CLOAD = 15 pF | 2.9 | 6 | ||||
tSTART | Device start-up time | AVDD step from 0 to 3.0 V with DVDD ≥ 2.7 V to bitstream valid, 0.1% settling | 0.5 | ms |