ZHCSL85B May 2020 – April 2021 AMC3306M25
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
ANALOG INPUT | ||||||
RIN | Single-ended input resistance | INN = HGND | 19 | kΩ | ||
RIND | Differential input resistance | 22 | kΩ | |||
IIB | Input bias current | INP = INN = HGND; IIB = (IIBP + IIBN) / 2 |
–41 | –30 | –24 | μA |
IIO | Input offset current(1) | IIO = IIBP – IIBN; INP = INN = HGND | ±10 | nA | ||
CIN | Single-ended input capacitance | INN = HGND, fIN = 310 kHz | 2 | pF | ||
CIND | Differential input capacitance | fIN = 310 kHz | 1 | pF | ||
ACCURACY | ||||||
EO | Offset error(1) | INN = INP = HGND, TA = 25°C | –50 | ±10 | 50 | µV |
TCEO | Offset error thermal drift(4) | INN = INP = HGND | –1 | 1 | µV/°C | |
EG | Gain error | TA = 25°C | –0.2% | ±0.005% | 0.2% | % |
TCEG | Gain error drift(5) | –35 | 35 | ppm/°C | ||
DNL | Differential nonlinearity | Resolution: 16 bits | –0.99 | 0.99 | LSB | |
INL | Integral nonlinearity | Resolution: 16 bits | –4 | ±1 | 4 | LSB |
SNR | Signal-to-noise ratio | fIN = 1 kHz | 81 | 83 | dB | |
SINAD | Signal-to-noise + distortion | fIN = 1 kHz | 79 | 82.5 | dB | |
THD | Total harmonic distortion(3) | 5 MHz ≤ fCLKIN ≤ 21 MHz, fIN = 1 kHz | –96 | –88 | dB | |
SFDR | Spurious-free dynamic range | fIN = 1 kHz | 88 | 97 | dB | |
CMRR | Common-mode rejection ratio | fIN = 0 Hz, VCM min ≤ VIN ≤ VCM max | –95 | dB | ||
fIN = 10 kHz, VCM min ≤ VIN ≤ VCM max, VINP = VINN = 500 mVPP | –84 | |||||
PSRR | Power-supply rejection ratio | VDD from 3.0 V to 5.5 V, at DC | –120 | dB | ||
INP = INN = HGND, VDD from 3.0 V to 5.5 V, 10 kHz, 100 mV ripple | –120 | |||||
DIGITAL I/O | ||||||
IIN | Input leakage current | GND ≤ VIN ≤ VDD | 0 | 7 | μA | |
CIN | Input capacitance | 4 | pF | |||
VIH | High-level input voltage | 0.7 × VDD | VDD + 0.3 | V | ||
VIL | Low-level input voltage | –0.3 | 0.3 × VDD | V | ||
CLOAD | Output load capacitance | 15 | 30 | pF | ||
VOH | High-level output voltage | IOH = –20 µA | VDD – 0.1 | V | ||
IOH = –4 mA | VDD – 0.4 | |||||
VOL | Low-level output voltage | IOL = 20 µA | 0.1 | V | ||
IOL = 4 mA | 0.4 | |||||
CMTI | Common-mode transient immunity | 75 | 135 | kV/μs | ||
POWER SUPPLY | ||||||
IDD | Low-side supply current | no external load on HLDO | 26 | 40 | mA | |
1 mA external load on HLDO | 28 | 42 | ||||
VDCDC_OUT | DC/DC output voltage | DCDC_OUT to HGND | 3.1 | 3.5 | 4.65 | V |
VDCDCUV | DC/DC output undervoltage detection threshold voltage | VDCDC_OUT falling | 2.1 | 2.25 | V | |
VHLDO_OUT | High-side LDO output voltage | HLDO_OUT to HGND, up to 1 mA external load(2) | 3 | 3.2 | 3.4 | V |
VHLDOUV | High-side LDO output undervoltage detection threshold voltage | VHLDO_OUT falling | 2.4 | 2.6 | V | |
IH | High-side supply current for auxiliary circuitry | Load connected from HLDO_OUT to HGND; non-switching; –40℃ ≤ TA ≤ 85℃(2) |
1 | mA | ||
tSTART | Device startup time | VDD step to 3.0 V to bitstream valid | 0.9 | 1.4 | ms |