ZHCSJP0A May   2019  – November 2019 ATL431LI-Q1 , ATL432LI-Q1

PRODUCTION DATA.  

  1. 1 特性
  2. 2 应用
  3. 3 说明
    1.     Device Images
      1.      简化原理图
  4. 4 修订历史记录
  5. 5 Device Comparison Table
  6. 6 Pin Configuration and Functions
    1.     Pin Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Typical Characteristics
  8. 8 Parameter Measurement Information
    1. 8.1 Temperature Coefficient
    2. 8.2 Dynamic Impedance
  9. 9 Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
    4. 9.4 Device Functional Modes
      1. 9.4.1 Open Loop (Comparator)
      2. 9.4.2 Closed Loop
  10. 10Applications and Implementation
    1. 10.1 Application Information
    2. 10.2 Typical Applications
      1. 10.2.1 Comparator With Integrated Reference
      2. 10.2.2 Design Requirements
      3. 10.2.3 Detailed Design Procedure
        1. 10.2.3.1 Basic Operation
          1. 10.2.3.1.1 Overdrive
        2. 10.2.3.2 Output Voltage and Logic Input Level
          1. 10.2.3.2.1 Input Resistance
      4. 10.2.4 Application Curves
      5. 10.2.5 Precision LED Lighting Current Sink Regulator
        1. 10.2.5.1 Design Requirements
        2. 10.2.5.2 Detailed Design Procedure
          1. 10.2.5.2.1 Basic Operation
            1. 10.2.5.2.1.1 Output Current Range and Accuracy
          2. 10.2.5.2.2 Power Consumption
      6. 10.2.6 Shunt Regulator/Reference
        1. 10.2.6.1 Design Requirements
        2. 10.2.6.2 Detailed Design Procedure
          1. 10.2.6.2.1 Programming Output/Cathode Voltage
          2. 10.2.6.2.2 Total Accuracy
          3. 10.2.6.2.3 Stability
          4. 10.2.6.2.4 Start-Up Time
        3. 10.2.6.3 Application Curves
      7. 10.2.7 Isolated Flyback with Optocoupler
        1. 10.2.7.1 Design Requirements
          1. 10.2.7.1.1 Detailed Design Procedure
            1. 10.2.7.1.1.1 ATL431LI-Q1 Biasing
            2. 10.2.7.1.1.2 Resistor Feedback Network
      8. 10.2.8 Adjustable Reference for Tracking LDO
        1. 10.2.8.1 Design Requirements
        2. 10.2.8.2 Detailed Design Procedure
          1. 10.2.8.2.1 External Capacitors
    3. 10.3 System Examples
  11. 11Power Supply Recommendations
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13器件和文档支持
    1. 13.1 器件支持
      1. 13.1.1 器件命名规则
    2. 13.2 文档支持
      1. 13.2.1 相关文档
    3. 13.3 相关链接
    4. 13.4 接收文档更新通知
    5. 13.5 支持资源
    6. 13.6 商标
    7. 13.7 静电放电警告
    8. 13.8 Glossary
  14. 14机械、封装和可订购信息

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

7.6 Typical Characteristics

Data at high and low temperatures are applicable only within the recommended operating free-air temperature ranges of the various devices.

ATL431LI-Q1 ATL432LI-Q1 vref_vs_temp.gifFigure 1. Reference Voltage versus Free-Air Temperature
ATL431LI-Q1 ATL432LI-Q1 D003VkavsIkaATL431.gifFigure 3. Cathode Current versus Cathode Voltage
ATL431LI-Q1 ATL432LI-Q1 D004Ioff.gifFigure 5. Off-State Cathode Current
versus Free-Air Temperature
ATL431LI-Q1 ATL432LI-Q1 D002IrefvsTemp.gifFigure 2. Reference Current versus Free-Air Temperature
ATL431LI-Q1 ATL432LI-Q1 D004IKAminATL431.gifFigure 4. Cathode Current versus Cathode Voltage
ATL431LI-Q1 ATL432LI-Q1 D0006deltav.gifFigure 6. Ratio of Delta Reference Voltage to Delta Cathode Voltage versus Free-Air Temperature
ATL431LI-Q1 ATL432LI-Q1 D000gainphase.gif
Figure 7. Small-Signal Voltage Amplification
versus Frequency
ATL431LI-Q1 ATL432LI-Q1 D005Zkavsf.gifFigure 9. Reference Impedance versus Frequency
ATL431LI-Q1 ATL432LI-Q1 pulseresponse.gifFigure 11. Pulse Response
ATL431LI-Q1 ATL432LI-Q1 ATL431D010Stability1mA_v3.gif
The areas under the curves represent conditions that may cause the device to oscillate. For curves B and C, R2 and V+ are adjusted to establish the initial VKA and IKA conditions, with CL = 0. VBATT and CL then are adjusted to determine the ranges of stability.
Figure 13. Stability Boundary Conditions for All ATL431LI-Q1, ATL432LI-Q1 Devices Above 1 mA
ATL431LI-Q1 ATL432LI-Q1 ATL431D010Stability100uA_v2.gif
A. The areas in-between the curves represent conditions that may cause the device to oscillate. For curves B and C, R2 and V+ are adjusted to establish the initial VKA and IKA conditions, with CL = 0. VBATT and CL then are adjusted to determine the ranges of stability.
Figure 15. Stability Boundary Conditions for All ATL431LI-Q1, ATL432LI-Q1 Devices Below 1 mA
ATL431LI-Q1 ATL432LI-Q1 tc_4_2_lvs543.gifFigure 8. Test Circuit for Voltage Amplification
ATL431LI-Q1 ATL432LI-Q1 tc_4_4_lvs543.gif
Figure 10. Test Circuit for Reference Impedance
ATL431LI-Q1 ATL432LI-Q1 tc_5_2_lvs543.gif
Figure 12. Test Circuit for Pulse Response
ATL431LI-Q1 ATL432LI-Q1 tc_6_4_lvs543.gifFigure 14. Test Circuit for Stability Boundary Conditions
ATL431LI-Q1 ATL432LI-Q1 tc_6_4_lvs543.gifFigure 16. Test Circuit for Stability Boundary Conditions
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