| VALUE | UNIT |
|---|
| V(ESD) | Electrostatic discharge(3) | Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | ±3000 | V |
| Charged-device model (CDM), per JEDEC specification JESD22-C101 or ANSI/ESDA/JEDEC JS-002(2) | ±1500 |
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(3) The test was performed on IC terminals that may potentially be exposed to the customer at the product level. The BQ2404x IC requires a minimum of the listed capacitance, external to the IC, to pass the ESD test. The D+ D- lines require clamp diodes such as CM1213A-02SR from CMD to protect the IC for this testing.