ZHCSP94A November   2021  – February 2022 BQ27Z746

PRODUCTION DATA  

  1. 特性
  2. 应用
  3. 说明
  4. Revision History
  5. Pin Configurations and Functions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
      1. 6.5.1 Supply Current
      2. 6.5.2 Common Analog (LDO, LFO, HFO, REF1, REF2, I-WAKE)
      3. 6.5.3 Battery Protection (CHG, DSG)
      4. 6.5.4 Cell Sensing Output (BAT_SP, BAT_SN)
      5. 6.5.5 Gauge Measurements (ADC, CC, Temperature)
      6. 6.5.6 Flash Memory
    6. 6.6 Digital I/O: DC Characteristics
    7. 6.7 Digital I/O: Timing Characteristics
    8. 6.8 Typical Characteristics
  7. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  BQ27Z746 Processor
      2. 7.3.2  Battery Parameter Measurements
        1. 7.3.2.1 Coulomb Counter (CC) and Digital Filter
        2. 7.3.2.2 ADC Multiplexer
        3. 7.3.2.3 Analog-to-Digital Converter (ADC)
        4. 7.3.2.4 Internal Temperature Sensor
        5. 7.3.2.5 External Temperature Sensor Support
      3. 7.3.3  Power Supply Control
      4. 7.3.4  Bus Communication Interface
      5. 7.3.5  Low Frequency Oscillator
      6. 7.3.6  High Frequency Oscillator
      7. 7.3.7  1.8-V Low Dropout Regulator
      8. 7.3.8  Internal Voltage References
      9. 7.3.9  Overcurrent in Discharge Protection
      10. 7.3.10 Overcurrent in Charge Protection
      11. 7.3.11 Short-Circuit Current in Discharge Protection
      12. 7.3.12 Primary Protection Features
      13. 7.3.13 Battery Sensing
      14. 7.3.14 Gas Gauging
      15. 7.3.15 Zero Volt Charging (ZVCHG)
      16. 7.3.16 Charge Control Features
      17. 7.3.17 Authentication
    4. 7.4 Device Functional Modes
      1. 7.4.1 Lifetime Logging Features
      2. 7.4.2 Configuration
        1. 7.4.2.1 Coulomb Counting
        2. 7.4.2.2 Cell Voltage Measurements
        3. 7.4.2.3 Auto Calibration
        4. 7.4.2.4 Temperature Measurements
  8. Applications and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 Design Requirements (Default)
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Changing Design Parameters
      3. 8.2.3 Calibration Process
      4. 8.2.4 Gauging Data Updates
        1. 8.2.4.1 Application Curve
  9. Power Supply Requirements
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 第三方米6体育平台手机版_好二三四免责声明
    2. 11.2 Documentation Support
      1. 11.2.1 Related Documentation
    3. 11.3 接收文档更新通知
    4. 11.4 支持资源
    5. 11.5 Trademarks
    6. 11.6 Electrostatic Discharge Caution
    7. 11.7 术语表
  12. 12Mechanical, Orderable, and Packaging Information

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

Cell Sensing Output (BAT_SP, BAT_SN)

Unless otherwise noted, characteristics noted under conditions of TA = –40 to 85℃
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Static Response
VBUFACC Buffer accuracy
(BAT_SP – BAT_SN)
VBAT @ 1500 mV and 2400 mV DC,
PACK-BAT_SP ≥ 200 mV,
BAT_SP load: Hi-Z to 1 kΩ,
BAT_SN load: 1 kΩ to 10 kΩ
1450 1500 1550 mV
2350 2400 2450
VBUFOFFS BAT_SN common mode shift
(BAT_SN – VSS)
400-mV option, VBAT = 1.5 V to 2.5 V 370 400 430 mV
200-mV option, VBAT = 2.0 V to 2.5 V 170 200 230
0-mV option, VBAT = 2.0 V to 2.5 V –30 0 30
600-mV option, VBAT = 2.0 to 2.5 V 550 600 650
ΔVBUF_LINE Buffer line regulation VBAT = 1.5 to 2.5 V, no load, BAT_SP – BAT_SN, VPACK – VBAT = 1.0 V 10 mV
ΔVBUF_LOAD Buffer load regulation VBAT = 2.4 V, load = 1 mA, BAT_SP – BAT_SN, VPACK - VBAT = 1.0 V 1.2 mV
VRLOACC RLO mode accuracy
(BAT_SP – BAT_SN)
VBAT = 3000-mV to 5000-mV DC,
For stability, 0-mV buffer option enabled
BAT_SP load: Hi-Z to 1 kΩ
BAT_SN load: 1 kΩ to 10 kΩ
–7 +7 mV
VRLOACCP RLO mode accuracy
(BAT_SP – VSS)
–5 +5
VRLOACCN RLO mode accuracy
(BAT_SN – VSS)
–5 +5
RLO_SP BAT_SP low resistance mode 200-Ω option, DSG FET = ON 160 200 260
510-Ω option, DSG FET = ON 459 510 561
RLO_SN BAT_SN low resistance mode 200-Ω option, DSG FET = ON 160 200 260
510-Ω option, DSG FET = ON 459 510 561
RHIZ_SP BAT_SP high impedance mode CHG FET = OFF 0.6 1.0 1.3 MΩ
RHIZ_SN BAT_SN high impedance mode 0.6 1.0 1.3
tBUF_OFF Buffer turn-off timing (1) Buffer disable timing respect to DSG FET turn-on 500 us
CBUF_SP Max external capacitance for stable operation (1) BAT_SP to SRN (PACK–) 150 pF
CBUF_SN BAT_SN to SRN (PACK–) 150
BBUF_BW Buffer unity gain bandwidth (1) Buffer enabled 30 kHz
VBCP BAT_SP – BAT +Fault (BCP) Threshold Range(1)

Recommended threshold range.
Factory trimmed in ≈2-mV steps

+100 +250 mV

Factory default trimmed threshold(3)

+200
VBCP_ACC BAT_SP – BAT +Fault Accuracy (3) RLO mode enabled,
Step size 10 mV
–10 +10
VBDP BAT_SP – BAT –Fault (BDP) Threshold Range(1) Recommended threshold range.
Factory trimmed in ≈2-mV steps
–250 –100 mV
Factory default trimmed threshold(3) –200
VBDP_ACC BAT_SP – BAT –Fault Accuracy (3) RLO mode enabled,
Step size 10 mV
–10 +10
VBCN BAT_SN – VSS +Fault (BCN) Threshold Range(1) Recommended threshold range.
Factory trimmed in ≈2-mV steps
+100 +250 mV
Factory default trimmed threshold(3) +200
VBCN_ACC BAT_SN – VSS +Fault Accuracy (3) RLO mode enabled,
Step size 10 mV
–10 +10
VBDN BAT_SN – VSS –Fault (BDN) Threshold Range(1) Recommended threshold range.
Factory trimmed in ≈2-mV steps
–250 –100 mV
Factory default trimmed threshold(3) –200
VBDN_ACC BAT_SN – VSS –Fault Accuracy (3) RLO mode enabled,
Step size 10 mV
–10 +10
tLO_FAULT_DLY BAT_SP / BAT_SN
fault comparator delay(1)
8-ms delay 8 ms
100-ms delay 100 ms
tLO_FAULT_STRT BAT_SP / BAT_SN
fault restart time (1)(2)
1000 ms
Transient Response
VLOAD_SP BAT_SP load transient (1) No load ≥ 1 KΩ ≥ No load,
Transition time 1 μs
–300 300 mV
VLOAD_SN BAT_SN load transient (1) –200 200 mV
VLINE_SN BAT_SN line transient (1) VBAT = 1.5 V ≥ 2.4 V ≥ 1.5 V,
Transition slope 500 mV / 10 us
–30 30 mV
VTRANS (BAT_SP – BAT_SN)
transition transient (1)
Firmware commanded transition from BUF mode to RLO mode –700 50 mV
Specified by Design. Not production tested.
Firmware-based parameter. Not production tested.
Accuracy assured by factory trim at specified default threshold. A change from the default threshold requires device calibration in the field. Refer to the BQ27Z746 Technical Reference Manual.