ZHCSKR6B
January 2020 – January 2022
BQ28Z610-R1
PRODUCTION DATA
1
特性
2
应用
3
说明
4
Revision History
5
说明(续)
6
Pin Configuration and Functions
7
Specifications
7.1
Absolute Maximum Ratings
7.2
ESD Ratings
7.3
Recommended Operating Conditions
7.4
Thermal Information
7.5
Supply Current
7.6
Power Supply Control
7.7
Low-Voltage General Purpose I/O, TS1
7.8
Power-On Reset (POR)
7.9
Internal 1.8-V LDO
7.10
Current Wake Comparator
7.11
Coulomb Counter
7.12
ADC Digital Filter
7.13
ADC Multiplexer
7.14
Cell Balancing Support
7.15
Internal Temperature Sensor
7.16
NTC Thermistor Measurement Support
7.17
High-Frequency Oscillator
7.18
Low-Frequency Oscillator
7.19
Voltage Reference 1
7.20
Voltage Reference 2
7.21
Instruction Flash
7.22
Data Flash
7.23
Current Protection Thresholds
7.24
Current Protection Timing
7.25
N-CH FET Drive (CHG, DSG)
7.26
I2C Interface I/O
7.27
I2C Interface Timing
7.28
Typical Characteristics
8
Detailed Description
8.1
Overview
8.2
Functional Block Diagram
8.3
Feature Description
8.3.1
Battery Parameter Measurements
8.3.1.1
BQ28Z610-R1 Processor
8.3.2
Coulomb Counter (CC)
8.3.3
CC Digital Filter
8.3.4
ADC Multiplexer
8.3.5
Analog-to-Digital Converter (ADC)
8.3.6
ADC Digital Filter
8.3.7
Internal Temperature Sensor
8.3.8
External Temperature Sensor Support
8.3.9
Power Supply Control
8.3.10
Power-On Reset
8.3.11
Bus Communication Interface
8.3.12
I2C Timeout
8.3.13
Cell Balancing Support
8.3.14
N-Channel Protection FET Drive
8.3.15
Low Frequency Oscillator
8.3.16
High Frequency Oscillator
8.3.17
1.8-V Low Dropout Regulator
8.3.18
Internal Voltage References
8.3.19
Overcurrent in Discharge Protection
8.3.20
Short-Circuit Current in Charge Protection
8.3.21
Short-Circuit Current in Discharge 1 and 2 Protection
8.3.22
Primary Protection Features
8.3.23
Gas Gauging
8.3.24
Charge Control Features
8.3.25
Authentication
8.4
Device Functional Modes
8.4.1
Lifetime Logging Features
8.4.2
Configuration
8.4.2.1
Coulomb Counting
8.4.2.2
Cell Voltage Measurements
8.4.2.3
Current Measurements
8.4.2.4
Auto Calibration
8.4.2.5
Temperature Measurements
9
Applications and Implementation
9.1
Application Information
9.2
Typical Applications
9.2.1
Design Requirements (Default)
9.2.2
Detailed Design Procedure
9.2.2.1
Setting Design Parameters
9.2.2.2
Calibration Process
9.2.2.3
Gauging Data Updates
9.2.3
Application Curve
10
Power Supply Recommendations
11
Layout
11.1
Layout Guidelines
11.2
Layout Example
12
Device and Documentation Support
12.1
第三方米6体育平台手机版_好二三四免责声明
12.2
Documentation Support
12.3
接收文档更新通知
12.4
支持资源
12.5
Trademarks
12.6
Electrostatic Discharge Caution
12.7
术语表
13
Mechanical, Packaging, and Orderable Information
封装选项
机械数据 (封装 | 引脚)
DRZ|12
MPDS289B
散热焊盘机械数据 (封装 | 引脚)
订购信息
zhcskr6b_oa
zhcskr6b_pm
7.2
ESD Ratings
VALUE
UNIT
V
(ESD)
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins
(1)
±2000
V
Charged device model (CDM), per ANSI/ESDA/JEDEC JS-002, all pins
(2)
±500
(1)
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2)
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
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