ZHCS477K September 2011 – August 2022 BQ294502 , BQ294504 , BQ294506 , BQ294512 , BQ294522 , BQ294524 , BQ294532 , BQ294533 , BQ294534 , BQ294582 , BQ294592
PRODUCTION DATA
12.6 Electrostatic Discharge Caution
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. |
| ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. |