The BQ298xyz device detects a current fault by monitoring the voltage drop across an external sense resistor (R_SNS) between the CS and VSS pins. The device applies the same method to detect OCD and SCD faults and applies the same recovery scheme to release the OCD and SCD faults.

The device detects an OCD fault when (V_CS – VSS) > OCD threshold (+V_OC). If this condition exists for longer than the OCD delay (t_OC), the DSG output is driven to V_FETOFF to turn off the DSG FET. The SCD detection is similar to OCD, but uses the SCD threshold (V_SCD) and SCD delay (t_SCD) time.

During an OCD or SCD state, the device turns on the recovery detection circuit. An internal current sink (I_{PACK – VDD}) is connected between the PACK and VDD pins, and the device consumes I_{OC_REC} during the OCD and SCD fault until recovery is detected.

The OCD or SCD status is released and the DSG output rises to HIGH, that is V_DSG = VDD × (1 + A_FETON), if (V_BAT – V_PACK) < 400 mV, indicating a discharge load is removed.