ZHCSMY7J July   2021  – November 2023 BQ77216

PRODUCTION DATA  

  1.   1
  2. 特性
  3. 应用
  4. 说明
  5. 说明(续)
  6. Device Comparison Table
  7. Pin Configuration and Functions
  8. Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 DC Characteristics
    6. 7.6 Timing Requirements
  9. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Voltage Fault Detection
      2. 8.3.2 Open-Wire Fault Detection
      3. 8.3.3 Temperature Fault Detection
      4. 8.3.4 Oscillator Health Check
      5. 8.3.5 Sense Positive Input for Vx
      6. 8.3.6 Output Drive, COUT and DOUT
      7. 8.3.7 The LATCH Function
      8. 8.3.8 Supply Input, VDD
    4. 8.4 Device Functional Modes
      1. 8.4.1 NORMAL Mode
      2. 8.4.2 FAULT Mode
      3. 8.4.3 Customer Test Mode
  10. Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Design Requirements
      2. 9.1.2 Detailed Design Procedure
        1. 9.1.2.1 Cell Connection Sequence
    2. 9.2 Systems Example
  11. 10Power Supply Recommendations
  12. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  13. 12Device and Documentation Support
    1. 12.1 第三方米6体育平台手机版_好二三四免责声明
    2. 12.2 接收文档更新通知
    3. 12.3 支持资源
    4. 12.4 Trademarks
    5. 12.5 静电放电警告
    6. 12.6 术语表
  14. 13Revision History
  15. 14Mechanical, Packaging, and Orderable Information

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

The LATCH Function

The device can be enabled to latch the fault signal, which effectively disables the recovery functions of all fault detections. The only way to recover from a fault state when the latch is enabled is a POR of the device.