ZHCSR27D August 2020 – September 2022 BQ79612-Q1 , BQ79614-Q1 , BQ79616-Q1
PRODUCTION DATA
Address | 0x033C | |||||||
RW | Bit 7 | Bit 6 | Bit 5 | Bit 4 | Bit 3 | Bit 2 | Bit 1 | Bit 0 |
Name | RSVD | CBFET_CTRL_GO | OW_SNK[1:0] | COMP_ADC_SEL[2:0] | COMP_ADC _GO | |||
Reset | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 |
RSVD = | Reserved | |||||||
CBFET_CTRL_GO = | When this GO bit = 1, device turns on the CBFET
configured and turns off whichever CBFET is clear in DIAG_CBFET_CTRL1/2 regisetrs.
This GO action is executed only if CB is not running or it’s in pause, otherwise,
CBFETs are controlled by regular CB control. If CBFET are turned on by this GO bit, once CB is started or resume, the CBFET controls returns to the regular CB control (and not by this GO bit action) |
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OW_SNK[1:0] = | Turns on current sink on VC pins, CB pins, or BBP/N pins. Changes to these bits take effect immediately. Host MCU is
responsible to turn on the correct sink current before performing open wire (OW)
test and to turn off the sink current after OW test is completed. 00 = All VC, BBP/N, CB pins current sink is off. 01 = Turn on current sink on all VC pins 10 = Turn on current sink on all CB pins 11 = Turn on current sink on BBP/N pins |
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COMP_ADC_SEL[2:0] = | Enables the device diagnostic comparison through
the ADC measurements. Host enables the corresponding ADCs in continuous mode before
enabling this diagnostic. These bits are sampled when [COMP_ADC_GO] = 1. 000 = No ADC comparison is performed 001 = Cell voltage measurement check. Device compares the cell channels specified by [AUX_CELL_SEL4:0] against the following criteria: VCELL (from Main ADC) vs. AUXCELL (from AUX ADC) delta is less than [VCCB_THR4:0]. The [DRDY_VCCB] = 1 when this comparison is completed. 010 = Open wire (OW) check on VC pins. MCU enables the current sink on all VC pins through the [OW_SNK1:0] before enabling this comparison. Device compares corresponding VC pins specified by ACTIVE_CELL register against the following criteria: VCELL (from Main ADC) is less than DIAG_COMP_CTRL2 [OW_THR3:0]. The [DRDY_VC_OW] = 1 when the comparison is completed. 011 = Open wire (OW) check on CB pins MCU enables the current sink on all VC pins through the [OW_SNK1:0] before enabling this comparison. Device compares corresponding CB pins specified by [AUX_CELL_SEL4:0] against the following criteria: AUXCELL (from AUX ADC) is less than DIAG_COMP_CTRL2 [OW_THR3:0]. The [DRDY_CBOW] = 1 when the comparison is completed. 100 = CBFET check. MCU preconfigures the following before starting this check:
AUXCELL (from AUX ADC) < 1/3 of VCELL (from Main ADC). [DRDY_CBFET] = 1 when the comparison is completed. 101 = GPIO measurement check (applies to GPIO configured as ADC and OTUT inputs or ADC only input). Device compares main GPIO measurement vs. AUX GPIO measurements delta is less than [GPIO_THR2:0]. The [DRDY_GPIO] = 1 when the comparison is completed. Other codes: No ADC comparison is performed |
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COMP_ADC_GO = | Device starts diagnostic test specified by
[COMP_ADC_SEL2:0] setting. When this bit is written to 1, the selected
[COMP_ADC_SEL2:0] is sampled. Change of [COMP_ADC_SEL2:0] setting
has no effect unless this GO bit is written to 1 again. This bit is cleared to 0 in read. 0 = Ready. Writing 0 has no effect 1 = Star diagnostic selected by [COMP_ADC_SEL2:0] |