ZHCSTD7A December 2021 – November 2023 BQ79631-Q1
PRODUCTION DATA
The OV and UV protectors have several operation modes controlled by OVUV_CTRL[OVUV_MODE1:0] and is summarized in Table 8-6. To start the OVUV protectors, MCU sets OVUV_CTRL[OVUV_GO] = 1.
[OVUV_MODE1:0] | Operation Mode | Description |
---|---|---|
0b00 | Stop OV and UV protectors | Stop OV and UV protectors |
0b01 | Round robin run | The OV and UV protectors are looping through all VS inputs. The UV protector detects UV_THRESH. |
0b10 | OV and UV BIST run (diagnostic use, see Section 8.3.5.4 for details) |
A BIST (built-in self-test) cycle on the OV and UV comparators
and the detection paths. VS ADC measurement from the Main ADC and the OV and UV detections through the OVUV protectors are not available during this run. MCU shall stop ADC measurement when performing OVUV BIST. |
0b11 | Single channel run (diagnostic use, see Section 8.3.5.4 for details) |
Use for checking the OV and UV DACs. The OV and UV comparator is locked to a single VS input channel in this mode. Channel is locked by OVUV_CTRL[OVUV_LOCK3:0]. |
If OVUV BIST run is in progress, but MCU start ADC, the ADC result registers will be held at 0x8000. ADC measurements will resume once OVUV BIST is completed and after tAFE_SETTLE time pass.
If ADC is running, but MCU start OVUV BIST, the ADC result registers will be held at its last measurement. ADC measurement update resumes once OVUV BIST is completed and after tAFE_SETTLE time pass