Measured over operating free-air temperature with VDDS = 3.0 V (unless otherwise noted). The times listed here do not include software overhead.
| PARAMETER |
TEST CONDITIONS |
MIN |
TYP |
MAX |
UNIT |
| MCU, Reset to Active(1) |
|
|
850 - 4000 |
|
µs |
| MCU, Shutdown to Active(1) |
|
|
850 - 4000 |
|
µs |
| MCU, Standby to Active |
|
|
160 |
|
µs |
| MCU, Active to Standby |
|
|
36 |
|
µs |
| MCU, Idle to Active |
|
|
14 |
|
µs |
(1) The wakeup time is dependent on remaining charge on VDDR capacitor when starting the device, and thus how long the device has been in Reset or Shutdown before starting up again. The wake up time increases with a higher capacitor value.