ZHCSQV5B November 1998 – July 2022 CD54HC245 , CD54HCT245 , CD74HC245 , CD74HCT245
PRODUCTION DATA
请参考 PDF 数据表获取器件具体的封装图。
PARAMETER | TEST CONDITIONS(1) | VCC(V) | 25°C | -40°C to 85°C | -55°C to 125°C | UNIT | ||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|
MIN | TYP | MAX | MIN | MAX | MIN | MAX | ||||||
HC TYPES | ||||||||||||
VIH | High-level input voltage | 2 | 1.5 | 1.5 | 1.5 | V | ||||||
4.5 | 3.15 | 3.15 | 3.15 | V | ||||||||
6 | 4.2 | 4.2 | 4.2 | V | ||||||||
VIL | Low-level input voltage | 2 | 0.5 | 0.5 | 0.5 | V | ||||||
4.5 | 1.35 | 1.35 | 1.35 | V | ||||||||
6 | 1.8 | 1.8 | 1.8 | V | ||||||||
VOH | High-level output voltage CMOS loads |
IOH = – 20 μA | 2 | 1.9 | 1.9 | 1.9 | V | |||||
IOH = – 20 μA | 4.5 | 4.4 | 4.4 | 4.4 | V | |||||||
IOH = – 20 μA | 6 | 5.9 | 5.9 | 5.9 | V | |||||||
High-level output voltage TTL loads |
IOH = – 4 mA | 4.5 | 3.98 | 3.84 | 3.7 | V | ||||||
IOH = – 5.2 mA | 6 | 5.48 | 5.48 | 5.2 | V | |||||||
VOL | Low-level output voltage CMOS loads |
IOL = 20 μA | 2 | 0.1 | 0.1 | 0.1 | V | |||||
IOL = 20 μA | 4.5 | 0.1 | 0.1 | 0.1 | V | |||||||
IOL = 20 μA | 6 | 0.1 | 0.1 | 0.1 | V | |||||||
Low-level output voltage TTL |
IOL = 4 mA | 4.5 | 0.26 | 0.33 | 0.4 | V | ||||||
IOL = 5.2 mA | 6 | 0.26 | 0.33 | 0.4 | V | |||||||
II | Input leakage current | VI = VCC or GND | 6 | ±0.1 | ±1 | ±1 | µA | |||||
ICC | Quiescent device current | VI = VCC or GND | 6 | 8 | 80 | 160 | µA | |||||
IOZ | Three-state leakage current | VO = VCC or GND | 6 | ±0.5 | ±5 | ±10 | µA | |||||
HCT TYPES | ||||||||||||
VIH | High-level input voltage | 4.5 to 5.5 | 2 | 2 | 2 | V | ||||||
VIL | Low-level input voltage | 4.5 to 5.5 | 0.8 | 0.8 | 0.8 | V | ||||||
VOH | High-level
output voltage CMOS loads |
IOH = – 20 μA | 4.5 | 4.4 | 4.4 | 4.4 | V | |||||
High-level
output voltage TTL |
IOH = – 4 mA | 4.5 | 3.98 | 3.84 | 3.7 | V | ||||||
VOL | Low-level
output voltage CMOS |
IOL = 20 μA | 4.5 | 0.1 | 0.1 | 0.1 | V | |||||
Low-level
output voltage TTL |
IOH = 4 mA | 4.5 | 0.26 | 0.33 | 0.4 | V | ||||||
II | Input leakage current | VI = VCC and GND | 5.5 | ±0.1 | ±1 | ±1 | µA | |||||
ICC | Quiescent device current | VI = VCC and GND | 5.5 | 8 | 80 | 160 | µA | |||||
IOZ | Three-state leakage current | VO = VCC or GND | 6 | ±0.5 | ±5 | ±10 | µA | |||||
∆ICC(1) | Additional quiescent device current per input pin | An or Bn input held at VCC – 2.1 V | 4.5 to 5.5 | 100 | 144 | 180 | 196 | µA | ||||
OE input held at VCC – 2.1 V | 4.5 to 5.5 | 100 | 540 | 675 | 735 | µA | ||||||
DIR input held at VCC – 2.1 V | 4.5 to 5.5 | 100 | 324 | 405 | 441 | µA |