Figure 3. LVDS Output DC Configuration During Device Test
Figure 4. LVDS Output AC Configuration During Device Test
Figure 5. DC Coupled LVCMOS Input During Device Test
Figure 6. Output Voltage and Rise/Fall Time
1. Output skew is calculated as the greater of the following: As the difference between the fastest and the slowest tPLHn or the difference between the fastest and the slowest tPHLn (n = 0, 1, 2, 3).
2. Part-to-part skew is calculated as the greater of the following: As the difference between the fastest and the slowest tPLHn or the difference between the fastest and the slowest tPHLn across multiple devices (n = 0, 1, 2, 3).