ZHCSB81C June 2013 – February 2018 CSD18532NQ5B
PRODUCTION DATA.
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
STATIC CHARACTERISTICS | |||||||
BVDSS | Drain-to-source voltage | VGS = 0 V, ID = 250 μA | 60 | V | |||
IDSS | Drain-to-source leakage current | VGS = 0 V, VDS = 48 V | 1 | μA | |||
IGSS | Gate-to-source leakage current | VDS = 0 V, VGS = 20 V | 100 | nA | |||
VGS(th) | Gate-to-source threshold voltage | VDS = VGS, ID = 250 μA | 2.4 | 2.8 | 3.4 | V | |
RDS(on) | Drain-to-source on-resistance | VGS = 6 V, ID = 25 A | 3.5 | 4.4 | mΩ | ||
VGS = 10 V, ID = 25 A | 2.7 | 3.4 | |||||
gfs | Transconductance | VDS = 30 V, ID = 25 A | 140 | S | |||
DYNAMIC CHARACTERISTICS | |||||||
Ciss | Input capacitance | VGS = 0 V, VDS = 30 V, ƒ = 1 MHz | 4100 | 5340 | pF | ||
Coss | Output capacitance | 495 | 644 | pF | |||
Crss | Reverse transfer capacitance | 16 | 21 | pF | |||
RG | Series gate resistance | 1.2 | 2.4 | Ω | |||
Qg | Gate charge total (10 V) | VDS = 30 V, ID = 25 A | 49 | 64 | nC | ||
Qgd | Gate charge gate-to-drain | 7.9 | nC | ||||
Qgs | Gate charge gate-to-source | 16 | nC | ||||
Qg(th) | Gate charge at Vth | 11 | nC | ||||
Qoss | Output charge | VDS = 30 V, VGS = 0 V | 69 | nC | |||
td(on) | Turnon delay time | VDS = 30 V, VGS = 10 V,
IDS = 25 A, RG = 0 Ω |
8.2 | ns | |||
tr | Rise time | 8.7 | ns | ||||
td(off) | Turnoff delay time | 20 | ns | ||||
tf | Fall time | 2.7 | ns | ||||
DIODE CHARACTERISTICS | |||||||
VSD | Diode forward voltage | ISD = 25 A, VGS = 0 V | 0.8 | 1 | V | ||
Qrr | Reverse recovery charge | VDS = 30 V, IF = 25 A,
di/dt = 300 A/μs |
139 | nC | |||
trr | Reverse recovery time | 64 | ns |