ZHCSCO2E May 2014 – January 2022 CSD23382F4
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
STATIC CHARACTERISTICS | |||||||
BVDSS | Drain-to-Source Voltage | VGS = 0 V, IDS = –250 μA | –12 | V | |||
IDSS | Drain-to-Source Leakage Current | VGS = 0 V, VDS = –9.6 V | –1 | μA | |||
IGSS | Gate-to-Source Leakage Current | VDS = 0 V, VGS = –8 V | –10 | μA | |||
VGS(th) | Gate-to-Source Threshold Voltage | VDS = VGS, IDS = 250 μA | –0.5 | –0.8 | –1.1 | V | |
RDS(on) | Drain-to-Source On-Resistance | VGS = –1.8 V, IDS = –0.1 A | 149 | 199 | mΩ | ||
VGS = –2.5 V, IDS = –0.5 A | 90 | 105 | mΩ | ||||
VGS = –4.5 V, IDS = –0.5 A | 66 | 76 | mΩ | ||||
gƒs | Transconductance | VDS = –10 V, IDS = –0.5 A | 3.4 | S | |||
DYNAMIC CHARACTERISTICS | |||||||
Ciss | Input Capacitance | VGS = 0 V, VDS = –6 V, ƒ = 1 MHz | 180 | 235 | pF | ||
Coss | Output Capacitance | 118 | 154 | pF | |||
Crss | Reverse Transfer Capacitance | 12.8 | 16.6 | pF | |||
RG | Series Gate Resistance | 350 | Ω | ||||
Qg | Gate Charge Total (–4.5 V) | VDS = –6 V, IDS = –0.5 A | 1.04 | 1.35 | nC | ||
Qgd | Gate Charge Gate-to-Drain | 0.15 | nC | ||||
Qgs | Gate Charge Gate-to-Source | 0.50 | nC | ||||
Qg(th) | Gate Charge at Vth | 0.18 | nC | ||||
Qoss | Output Charge | VDS = –6 V, VGS = 0 V | 1.08 | nC | |||
td(on) | Turn On Delay Time | VDS = –6 V, VGS = –4.5 V, IDS = –0.5 A,RG = 2 Ω | 28 | ns | |||
tr | Rise Time | 25 | ns | ||||
td(off) | Turn Off Delay Time | 66 | ns | ||||
tƒ | Fall Time | 41 | ns | ||||
DIODE CHARACTERISTICS | |||||||
VSD | Diode Forward Voltage | ISD = –0.5 A, VGS = 0 V | –0.75 | –1 | V | ||
Qrr | Reverse Recovery Charge | VDS= –6 V, IF = –0.5 A, di/dt = 200 A/μs | 1.8 | nC | |||
trr | Reverse Recovery Time | 8.4 | ns |