| VALUE | UNIT |
---|
VESD | Electrostatic discharge(1) | Human body model (HBM) ESD stress voltage(2) | ±3000 | V |
Charged device model (CDM) ESD stress voltage(3) | ±1000 |
(1) Electrostatic discharge (ESD) to measure device sensitivity and immunity to damage caused by assembly line electrostatic discharges in to the device.
(2) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. Manufacturing with less than 500-V HBM is possible with the necessary precautions.
(3) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. Manufacturing with less than 250-V CDM is possible with the necessary precautions.