ZHCSLT4D April   2019  – December 2023 DLP660TE

PRODUCTION DATA  

  1.   1
  2. 特性
  3. 应用
  4. 说明
  5. Pin Configuration and Functions
    1. 4.1 Pin Functions—Test Pads
  6. Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  Storage Conditions
    3. 5.3  ESD Ratings
    4. 5.4  Recommended Operating Conditions
    5. 5.5  Thermal Information
    6. 5.6  Electrical Characteristics
    7. 5.7  Capacitance at Recommended Operating Conditions
    8. 5.8  Timing Requirements
    9. 5.9  System Mounting Interface Loads
    10. 5.10 Micromirror Array Physical Characteristics
    11. 5.11 Micromirror Array Optical Characteristics
    12. 5.12 Window Characteristics
    13. 5.13 Chipset Component Usage Specification
  7. Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Power Interface
      2. 6.3.2 Timing
    4. 6.4 Device Functional Modes
    5. 6.5 Optical Interface and System Image Quality Considerations
      1. 6.5.1 Optical Interface and System Image Quality
        1. 6.5.1.1 Numerical Aperture and Stray Light Control
        2. 6.5.1.2 Pupil Match
        3. 6.5.1.3 Illumination Overfill
    6. 6.6 Micromirror Array Temperature Calculation
    7. 6.7 Micromirror Power Density Calculation
    8. 6.8 Micromirror Landed-On/Landed-Off Duty Cycle
      1. 6.8.1 Definition of Micromirror Landed-On/Landed-Off Duty Cycle
      2. 6.8.2 Landed Duty Cycle and Useful Life of the DMD
      3. 6.8.3 Landed Duty Cycle and Operational DMD Temperature
      4. 6.8.4 Estimating the Long-Term Average Landed Duty Cycle of a Product or Application
  8. Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Application
      1. 7.2.1 Design Requirements
      2. 7.2.2 Detailed Design Procedure
      3. 7.2.3 Application Curves
    3. 7.3 DMD Die Temperature Sensing
  9. Power Supply Recommendations
    1. 8.1 DMD Power Supply Power-Up Procedure
    2. 8.2 DMD Power Supply Power-Down Procedure
  10. Layout
    1. 9.1 Layout Guidelines
    2. 9.2 Layout Example
      1. 9.2.1 Layers
      2. 9.2.2 Impedance Requirements
      3. 9.2.3 Trace Width, Spacing
        1. 9.2.3.1 Voltage Signals
  11. 10Device and Documentation Support
    1. 10.1 第三方米6体育平台手机版_好二三四免责声明
    2. 10.2 Device Support
      1. 10.2.1 Device Nomenclature
      2. 10.2.2 Device Markings
    3. 10.3 Documentation Support
      1. 10.3.1 Related Documentation
    4. 10.4 接收文档更新通知
    5. 10.5 支持资源
    6. 10.6 Trademarks
    7. 10.7 静电放电警告
    8. 10.8 术语表
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

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机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

Absolute Maximum Ratings

Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions. If outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.
MIN MAX UNIT
Supply Voltages
VCC Supply voltage for LVCMOS core logic(1) –0.5 2.3 V
VCCI Supply voltage for LVDS receivers(1) –0.5 2.3 V
VOFFSET Supply voltage for HVCMOS and micromirror electrode(1)(2) –0.5 11 V
VBIAS Supply voltage for micromirror electrode(1) –0.5 19 V
VRESET Supply voltage for micromirror electrode(1) –15 –0.3 V
|VCC – VCCI| Supply voltage delta (absolute value)(3) 0.3 V
|VBIAS – VOFFSET| Supply voltage delta (absolute value)(4) 11 V
|VBIAS – VRESET| Supply voltage delta (absolute value)(5) 34 V
Input Voltages
Input voltage for all other LVCMOS input pins(1) –0.5 VCC + 0.5 V
Input voltage for all other LVDS input pins(1)(5) –0.5 VCCI + 0.5 V
|VID| Input differential voltage (absolute value)(5) 500 mV
IID Input differential current(6) 6.25 mA
Clocks
ƒCLOCK Clock frequency for LVDS interface, DCLK_A 400 MHz
ƒCLOCK Clock frequency for LVDS interface, DCLK_B 400 MHz
ƒCLOCK Clock frequency for LVDS interface, DCLK_C 400 MHz
ƒCLOCK Clock frequency for LVDS interface, DCLK_D 400 MHz
Environmental
TARRAY and TWINDOW Temperature, operating(7) 0 90 °C
Temperature, non-operating(7) –40 90 °C
|TDELTA| Absolute Temperature delta between any point on the window edge and the ceramic test point TP1(8) 30 °C
TDP Dew Point Temperature, operating and non-operating (noncondensing) 81 °C
All voltages are referenced to common ground VSS. VBIAS, VCC, VCCI, VOFFSET, and VRESET power supplies are all required for proper DMD operation. VSS must also be connected.
VOFFSET supply transients must fall within specified voltages.
Exceeding the recommended allowable voltage difference between VCC and VCCI may result in excessive current draw.
Exceeding the recommended allowable voltage difference between VBIAS and VOFFSET may result in excessive current draw.
Exceeding the recommended allowable voltage difference between VBIAS and VRESET may result in excessive current draw.
LVDS differential inputs must not exceed the specified limit or damage may result to the internal termination resistors.
The highest temperature of the active array (as calculated using Section 6.6) or of any point along the window edge as defined in Figure 6-1. The locations of thermal test points TP2, TP3, TP4 and TP5 in Figure 6-1 are intended to measure the highest window edge temperature. If a particular application causes another point on the window edge to be at a higher temperature, that point is used.
Temperature delta is the highest difference between the ceramic test point 1 (TP1) and anywhere on the window edge as shown in Figure 6-1. The window test points TP2, TP3, TP4 and TP5 shown in Figure 6-1 are intended to result in the worst case delta. If a particular application causes another point on the window edge to result in a larger delta temperature, that point is be used.