The DLPC23x-Q1 provides a significant amount of BIST support to manage the operational integrity of the system. This BIST support is divided into two general BIST types, which are non-periodic and periodic.

Non-periodic BISTs are tests that are typically run one time, and are run outside of normal operation because their activity will disturb the operation of the system. These tests are specified to be run either by a Flash parameter or by a Host command. The Flash parameter specifies which tests are to be run during system power-up and initialization. The Host command is used to select and specify the running of these tests when the system is in Standby Mode (often just before the system is powered down). Some examples of non-periodic tests are: tests for all of the ASIC memories, tests for the main data processing path, and testing of the DMD memory.

Periodic BISTs are tests that are run on an almost continual basis during normal ASIC operation. These tests are managed (set up, enabled, results gathered and evaluated) automatically by the ASIC embedded software. Some examples of periodic tests are: tuning and verification of the DMD High-Speed Interface, input source monitoring (clock, active pixels, active lines), and external video checksum monitoring.

For more information on BISTs, refer to DLPC230-Q1 / DLPC230S-Q1 Programmer's Guide for Display Applications or DLPC230-Q1 Programmer's Guide for Light Control Applications.