ZHCSDE3G February 2015 – October 2022 DP83867CR , DP83867IR
PRODUCTION DATA
请参考 PDF 数据表获取器件具体的封装图。
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. | |
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. |