SLDS272 September 2024 DRV81620-Q1
ADVANCE INFORMATION
Not subject to production test, guaranteed by design
TEST CONDITIONS | MIN | NOM | MAX | UNIT | ||
---|---|---|---|---|---|---|
tnSCS_lead | Enable lead time (falling nSCS to rising SCLK) | 200 | ns | |||
tnSCS_lag | Enable lag time (falling SCLK to rising nSCS) | 200 | ns | |||
tnSCS_td | Transfer delay time (rising nSCS to falling nSCS) | 250 | ns | |||
tSDO_en | Output enable time (falling nSCS to SDO valid) | CL = 20 pF at SDO pin | 200 | ns | ||
tSDO_dis | Output disable time (rising nSCS to SDO Hi-z) | CL = 20 pF at SDO pin | 200 | ns | ||
fSCLK | Serial clock frequency | 5 | MHz | |||
tSCLK_P | Serial clock period | 200 | ns | |||
tSCLK_H | Serial clock logic high time | 75 | ns | |||
tSCLK_L | Serial clock logic low time | 75 | ns | |||
tSDI_su | Data setup time (required time SDI to falling SCLK) | 20 | ns | |||
tSDI_h | Data hold time (falling SCLK to SDI) | 20 | ns | |||
tSDO_v | Output data valid time with capacitive load | CL = 20 pF at SDO pin | 100 | ns |