If the die temperature exceeds the trip point of the thermal shutdown limit (T_OTSD), an OTSD event is recognized. After detecting the OTSD overtemperature event, all of the gate driver outputs are driven low to disable the external MOSFETs, charge pump is disabled and nFAULT pin is driven low. After OTSD condition is cleared, the fault state remains latched and can be cleared through an nSLEEP pin reset pulse (t_RST)