If at any time the voltage across BSTx and SHx pins falls lower than the V_{BST_UV} threshold voltage for longer than the t_{BST_UV_DG} time, the device detects a BST undervoltage event. Afer detecting the BST_UV event, all of the gate driver outputs are driven low to disable the external MOSFETs, and nFAULT pin is driven low. After the BST_UV condition is cleared, the fault state remains latched and can be cleared through an nSLEEP pin reset pulse (t_RST).