ZHCSDO0A March 2015 – May 2015 DRV8701
PRODUCTION DATA.
MIN | MAX | UNIT | |
---|---|---|---|
Power supply voltage (VM) | –0.3 | 47 | V |
Power supply voltage ramp rate (VM) | 0 | 2 | V/µs |
Charge pump voltage (VCP, CPH) | –0.3 | VM + 12 | V |
Charge pump negative switching pin (CPL) | –0.3 | VM | V |
Internal logic regulator voltage (DVDD) | –0.3 | 3.8 | V |
Internal analog regulator voltage (AVDD) | –0.3 | 5.75 | V |
Control pin voltage (PH, EN, IN1, IN2, nSLEEP, nFAULT, VREF, IDRIVE, SNSOUT) | –0.3 | 5.75 | V |
High-side gate pin voltage (GH1, GH2) | –0.3 | VM + 12 | V |
Continuous phase node pin voltage (SH1, SH2) | –1.2 | VM + 1.2 | V |
Pulsed 10 µs phase node pin voltage (SH1, SH2) | –2.0 | VM + 2 | V |
Low-side gate pin voltage (GL1, GL2) | –0.3 | 12 | V |
Continuous shunt amplifier input pin voltage (SP, SN) | –0.5 | 1 | V |
Pulsed 10-µs shunt amplifier input pin voltage (SP, SN) | –1 | 1 | V |
Shunt amplifier output pin voltage (SO) | –0.3 | 5.75 | V |
Open-drain output current (nFAULT, SNSOUT) | 0 | 10 | mA |
Gate pin source current (GH1, GL1, GH2, GL2) | 0 | 250 | mA |
Gate pin sink current (GH1, GL1, GH2, GL2) | 0 | 500 | mA |
Shunt amplifier output pin current (SO) | 0 | 5 | mA |
Operating junction temperature, TJ | –40 | 150 | °C |
Storage temperature, Tstg | –65 | 150 | °C |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human body model (HBM) ESD stress voltage(1) | ±2000 | V |
Charged device model (CDM) ESD stress voltage(2) | ±500 |
MIN | MAX | UNIT | ||
---|---|---|---|---|
VM | Power supply voltage range | 5.9 | 45 | V |
VCC | Logic level input voltage | 0 | 5.5 | V |
VREF | Reference RMS voltage range (VREF) | 0.3(1) | AVDD | V |
ƒPWM | Applied PWM signal (PH/EN or IN1/IN2) | 100 | kHz | |
IAVDD | AVDD external load current | 30(2) | mA | |
IDVDD | DVDD external load current | 30(2) | mA | |
ISO | Shunt amplifier output current loading (SO) | 5 | mA | |
TA | Operating ambient temperature | –40 | 125 | °C |
THERMAL METRIC(1) | DRV8701 | UNIT | |
---|---|---|---|
RGE (VQFN) | |||
24 PINS | |||
RθJA | Junction-to-ambient thermal resistance | 34.8 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 37.1 | °C/W |
RθJB | Junction-to-board thermal resistance | 12.2 | °C/W |
ψJT | Junction-to-top characterization parameter | 0.6 | °C/W |
ψJB | Junction-to-board characterization parameter | 12.2 | °C/W |
RθJC(bot) | Junction-to-case (bottom) thermal resistance | 3.7 | °C/W |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
POWER SUPPLIES (VM, AVDD, DVDD) | |||||||
VM | VM operating voltage | 5.9 | 45 | V | |||
IVM | VM operating supply current | VM = 24 V; nSLEEP high | 6 | 9.5 | mA | ||
IVMQ | VM sleep mode supply current | nSLEEP = 0 VM = 24 V |
TA = 25°C | 9 | 15 | μA | |
TA = 125°C(1) | 14 | 25 | |||||
tSLEEP | Sleep time | nSLEEP low to sleep mode | 100 | μs | |||
tWAKE | Wake-up time | nSLEEP high to output change | 1 | ms | |||
tON | Turn-on time | VM > UVLO to output transition | 1 | ms | |||
DVDD | Internal logic regulator voltage | External load 0 to 30 mA | 3.0 | 3.3 | 3.5 | V | |
AVDD | Internal logic regulator voltage | External load 0 to 30 mA | 4.4 | 4.8 | 5.2 | V | |
CHARGE PUMP (VCP, CPH, CPL) | |||||||
VCP | VCP operating voltage | VM = 12 V; IVCP = 0 to 12 mA | 20.5 | 21.5 | 22.5 | V | |
VM = 8 V; IVCP = 0 to 10 mA | 13.5 | 14.4 | 15 | ||||
VM = 5.9 V; IVCP = 0 to 8 mA | 9.4 | 9.9 | 10.4 | ||||
IVCP | Charge pump current capacity | VM > 12 V | 12 | mA | |||
8 V < VM < 12 V | 10 | ||||||
5.9 V < VM < 8 V | 8 | ||||||
fVCP(1) | Charge pump switching frequency | VM > UVLO | 200 | 400 | 700 | kHz | |
CONTROL INPUTS (PH, EN, IN1, IN2, nSLEEP) | |||||||
VIL | Input logic low voltage | 0.8 | V | ||||
VIH | Input logic high voltage | 1.5 | V | ||||
VHYS | Input logic hysteresis | 100 | mV | ||||
IIL | Input logic low current | VIN = 0 V | –5 | 5 | μA | ||
IIH | Input logic high current | VIN = 5 V | 78 | μA | |||
RPD | Pulldown resistance | 64 | 115 | 173 | kΩ | ||
tPD | Propagation delay | PH/EN, IN1/IN2 to GHx/GLx | 500 | ns | |||
CONTROL OUTPUTS (nFAULT, SNSOUT) | |||||||
VOL | Output logic low voltage | IO = 2 mA | 0.1 | V | |||
IOZ | Output high impedance leakage | VIN = 5 V | –2 | 2 | μA | ||
FET GATE DRIVERS (GH1, GH2, SH1, SH2, GL1, GL2) | |||||||
VGHS | High-side VGS gate drive (gate-to-source) | VM > 12 V; VGHS with respect to SHx | 8.5 | 9.5 | 10.5 | V | |
VM = 8 V; VGHS with respect to SHx | 5.5 | 6.4 | 7 | ||||
VM = 5.9 V; VGHS with respect to SHx | 3.5 | 4.0 | 4.5 | ||||
VGLS | Low-side VGS gate drive (gate-to-source) | VM > 12 V | 8.5 | 9.3 | 10.5 | V | |
VM = 5.9 V | 3.9 | 4.3 | 4.9 | ||||
tDEAD | Output dead time | Observed tDEAD depends on IDRIVE setting | 380 | ns | |||
tDRIVE | Gate drive time | 2.5 | μs | ||||
IDRIVE,SRC | Peak source current | RIDRIVE < 1 kΩ to GND | 6 | mA | |||
RIDRIVE = 33 kΩ ±5% to GND | 12.5 | ||||||
RIDRIVE = 200 kΩ ±5% to GND, or
RIDRIVE < 1 kΩ to AVDD |
25 | ||||||
RIDRIVE > 500 kΩ ±5% to GND | 100 | ||||||
RIDRIVE = 68 kΩ ±5% to AVDD | 150 | ||||||
IDRIVE,SNK | Peak sink current | RIDRIVE < 1 kΩ to GND | 12.5 | mA | |||
RIDRIVE = 33 kΩ ±5% to GND | 25 | ||||||
RIDRIVE = 200 kΩ ±5% to GND | 50 | ||||||
RIDRIVE < 1 kΩ to AVDD | 200 | ||||||
RIDRIVE > 500 ±5% kΩ to GND | 300 | ||||||
RIDRIVE = 68 kΩ ±5% to AVDD | 50 | ||||||
IHOLD | FET holding current | Source current after tDRIVE | 6 | mA | |||
Sink current after tDRIVE | 25 | ||||||
ISTRONG | FET hold-off strong pulldown | GHx | 490 | mA | |||
GLx | 690 | ||||||
ROFF | FET gate hold-off resistor | Pulldown GHx to SHx | 200 | kΩ | |||
Pulldown GLx to GND | 150 | ||||||
CURRENT SHUNT AMPLIFIER AND PWM CURRENT CONTROL (SP, SN, SO, VREF) | |||||||
VVREF | VREF input voltage | For current internal chopping | 0.3(3) | AVDD | V | ||
AV | Amplifier gain | 50 < VSP < 200 mV; VSN = GND | 18 | 20 | 22 | V/V | |
10 < VSP < 50 mV; VSN = GND | 16 | 20 | 24 | ||||
VOFF | SO offset | VSP = VSN = GND | 50 | 250 | mV | ||
ISP | SP input current | VSP = 100 mV; VSN = GND | -40 | μA | |||
tSET(2) | Settling time to ±1% | VSP = VSN = GND to VSP = 100 mV, VSN = GND |
1.5 | µs | |||
CSO(2) | Allowable SO pin capacitance | 1 | nF | ||||
tOFF | PWM current regulation off-time | 25 | µs | ||||
tBLANK | PWM blanking time | 2 | µs | ||||
PROTECTION CIRCUITS | |||||||
VUVLO | VM undervoltage lockout | VM falling; UVLO report | 5.4 | 5.8 | V | ||
VM rising; UVLO recovery | 5.6 | 5.9 | |||||
VUVLO,HYS | VM undervoltage hysteresis | Rising to falling threshold | 100 | mV | |||
tUVLO | VM UVLO falling deglitch time | VM falling; UVLO report | 10 | μs | |||
VCPUV | Charge pump undervoltage | CPUV report | VM + 2.8 | V | |||
VDS OCP | Overcurrent protection trip level, VDS of each external FET | High-side FETs: VM – SHx Low-side FETs: SHx – SP |
0.8 | 1 | V | ||
VSP OCP | Overcurrent protection trip level, measured by sense amplifier | VSP voltage with respect to GND | 0.8 | 1 | V | ||
tOCP | Overcurrent deglitch time | 4.5 | µs | ||||
tRETRY | Overcurrent retry time | 3 | ms | ||||
TTSD(2) | Thermal shutdown temperature | Die temperature, TJ | 150 | °C | |||
THYS(2) | Thermal shutdown hysteresis | Die temperature, TJ | 20 | °C | |||
VGS CLAMP | Gate drive clamping voltage | Positive clamping voltage | 10.5 | 13 | V | ||
Negative clamping voltage | –1 | –0.7 | –0.5 |