ZHCSIO5B October 2017 – January 2021 DRV8873-Q1
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
POWER SUPPLIES (VM, DVDD) | ||||||
VVM | VM operating voltage | 4.5 | 38 | V | ||
IVM | VM operating supply current | VVM = 13.5 V; nSLEEP = 1; DISABLE =0 | 5 | 10 | mA | |
IVM(Q) | VM sleep mode supply current | VVM = 13.5 V; nSLEEP = 0 | 15 | 30 | µA | |
VDVDD | Internal logic regulator voltage | 2-mA load, VVM > 5.5 V | 4.7 | 5 | 5.3 | V |
t(SLEEP) | Sleep time | nSLEEP low to start device shutdown | 50 | µs | ||
t(RESET) | nSLEEP reset pulse | nSLEEP low to only clear fault registers | 5 | 20 | µs | |
t(WAKE) | Wake-up time | nSLEEP high to device ready for input signals | 1.5 | ms | ||
ton | Turn-on time | VM > V(UVLO); nSLEEP = 1, to output transition | 1.5 | ms | ||
t(DISABLE) | DISABLE deglitch time | DISABLE signal transition | 2.5 | µs | ||
CHARGE PUMP (VCP, CPH, CPL) | ||||||
VVCP | VCP operating voltage | with respect to VM | VVM+5 | V | ||
IVCP | VCP current | VVM = 13.5 V | 7 | 10 | mA | |
f(VCP) | Charge pump switching frequency | VVM > V(UVLO); nSLEEP = 1 | 400 | kHz | ||
LOGIC-LEVEL INPUTS (EN/IN1, PH/IN2, nSLEEP, SCLK, SDI) | ||||||
VIL | Input logic-low voltage | 0 | 0.8 | V | ||
VIH | Input logic-high voltage | 1.6 | 5.3 | V | ||
VHYS | Input logic hysteresis | 150 | mV | |||
IIL | Input logic-low current | VIN = 0 V | –5 | 5 | µA | |
IIH | Input logic-high current | VIN = 5 V | 50 | µA | ||
RPD | Internal pulldown resistance | to GND | 100 | kΩ | ||
tpd | Propagation delay (EN/IN1, PH/IN2 to OUTx = 50%) | SR = 000b; IO = 1 A | 1.2 | µs | ||
SR = 001b; IO = 1 A | 1.6 | |||||
SR = 010b; IO = 1 A | 2.6 | |||||
SR = 011b; IO = 1 A | 3.4 | |||||
SR = 100b; IO = 1 A | 4.1 | |||||
SR = 101b; IO = 1 A | 5.2 | |||||
SR = 110b; IO = 1 A | 7.8 | |||||
SR = 111b; IO = 1 A | 13.3 | |||||
LOGIC-LEVEL INPUT (DISABLE) | ||||||
RPU,DIS | Internal pull-up resistance | DISABLE to DVDD | 100 | kΩ | ||
VIL,DIS | Input logic-low voltage | 0 | 0.8 | V | ||
VIH,DIS | Input logic-high voltage | 1.6 | 5.3 | V | ||
LOGIC-LEVEL INPUT (nSCS) | ||||||
VIL,nSCS | Input logic-low voltage | 0 | 0.8 | V | ||
VIH,nSCS | Input logic-high voltage | 1.6 | 5.3 | V | ||
RPU,nSCS | Internal pull-up resistance | nSCS to nSLEEP | 450 | kΩ | ||
LOGIC-LEVEL INPUT (nSLEEP) | ||||||
VIL,SLEEP | Input logic-low voltage | 0 | 0.8 | V | ||
VIH,SLEEP | Input logic-high voltage | 2.7 | 5.3 | V | ||
IIH,SLEEP | Input logic-high current | VIN = 5 V; nSCS is High | 80+ISDO(1) | µA | ||
THREE-LEVEL INPUT (MODE) | ||||||
RIN-1 | Input mode 1 | Tied to GND | 105 | Ω | ||
RIN-2 | Input mode 2 | Tied to GND | 190 | kΩ | ||
RIN-3 | Input mode 3 | Tied to DVDD | 105 | Ω | ||
PUSH-PULL OUTPUT (SDO) | ||||||
RPD,SDO | Internal pull-down resistance | With respect to GND | 30 | 50 | Ω | |
RPU,SDO | Internal pull-up resistance | With respect to nSLEEP | 120 | 240 | Ω | |
OPEN DRAIN OUTPUT (nFAULT) | ||||||
VOL | Output logic-low voltage | IO = 2 mA | 0.1 | V | ||
IOZ | Output high-impedance leakage | VO = 5 V | –2 | 2 | µA | |
MOTOR DRIVER OUTPUTS (OUT1, OUT2) | ||||||
RDS(ON) | High-side FET on-resistance | VVM = 13.5 V; TA = 25°C; TJ = 25°C | 75 | mΩ | ||
VVM = 13.5 V; TA = 25°C; TJ = 150°C | 125 | 155 | ||||
RDS(ON) | Low-side FET on-resistance | VVM = 13.5 V; TA = 25°C; TJ = 25°C | 75 | mΩ | ||
VVM = 13.5 V; TA = 25°C; TJ = 150°C | 125 | 155 | ||||
t(DEAD) | Output dead time | SR = 100b | 500 | ns | ||
VF(DIODE) | Body diode forward voltage | IO = 1 A | 0.8 | V | ||
ISINK | Sink current when OUTx = Hi-Z | nSLEEP = 0 | 62 | µA | ||
nSLEEP = 1, DISABLE = 1 | 340 | |||||
SR | Slew rate (H/W Device) OUTx 10% to 90% changing | IO = 1 A; Connect to GND | 53.2 | V/µs | ||
IO = 1 A; R(SR) = 22 kΩ ± 5% to GND | 34 | |||||
IO = 1 A; R(SR) = 68 kΩ ± 5% to GND | 18.3 | |||||
IO = 1 A; No connect (Hi-Z) | 13 | |||||
IO = 1 A; R(SR) = 51 kΩ ± 5% to DVDD | 7.9 | |||||
IO = 1 A; Connect to DVDD | 2.6 | |||||
SR | Slew rate (SPI Device) OUTx 10% to 90% changing | IO = 1 A; SR = 000b | 53.2 | V/µs | ||
IO = 1 A; SR = 001b | 34 | |||||
IO = 1 A; SR = 010b | 18.3 | |||||
IO = 1 A; SR = 011b | 13 | |||||
IO = 1 A; SR = 100b | 10.8 | |||||
IO = 1 A; SR = 101b | 7.9 | |||||
IO = 1 A; SR = 110b | 5.3 | |||||
IO = 1 A; SR = 111b | 2.6 | |||||
CURRENT SENSE OUTPUTS (IPROPI1, IPROPI2) | ||||||
k | Current mirror scaling | 1100 | A/A | |||
kERR | Current mirror scaling | IO < 1 A | –50 | 50 | mA | |
IO ≥ 1 A | –5 | 5 | % | |||
t(IPROPI) | OUTx to IPROPI | VO = 2 V; SR = 000b | 2.2 | µs | ||
VO = 2 V; SR = 111b | 10.5 | |||||
CURRENT REGULATION | ||||||
ITRIP | Current limit threshold | ITRIP_LVL = 00b; VVM = 13.5 V | 3.27 | 3.85 | 4.43 | A |
ITRIP_LVL = 01b; VVM = 13.5 V | 4.6 | 5.4 | 6.2 | |||
ITRIP_LVL = 10b; VVM = 13.5 V | 5.5 | 6.5 | 7.5 | |||
ITRIP_LVL = 11b; VVM = 13.5 V | 5.95 | 7 | 8.1 | |||
tOFF | PWM off-time | TOFF = 00b | 20 | µs | ||
TOFF = 01b | 40 | |||||
TOFF = 10b | 60 | |||||
TOFF = 11b | 80 | |||||
tBLANK | PWM blanking time | 5 | µs | |||
PROTECTION CIRCUITS | ||||||
V(UVLO) | VM undervoltage lockout | VM falling; UVLO report | 4.35 | 4.45 | V | |
VM rising; UVLO recovery | 4.5 | 4.7 | ||||
t(UVLO) | VM UVLO falling deglitch time | VM falling; UVLO report | 10 | µs | ||
V(RST) | VM UVLO reset | VM falling; UVLO report; device reset | 4.1 | V | ||
VVCP(UV) | Charge pump undervoltage | VVM = 12 V; TA = 25°C; CPUV report | VVM + 2.25 | V | ||
I(OCP) | Overcurrent protection trip level | 10 | A | |||
t(OCP) | Overcurrent deglitch time | 3 | 5 | µs | ||
t(RETRY) | Overcurrent retry time (H/W Device) | 4 | ms | |||
t(RETRY) | Overcurrent retry time (SPI Device) | OCP_TRETRY = 00b | 0.5 | ms | ||
OCP_TRETRY = 01b | 1 | |||||
OCP_TRETRY = 10b | 2 | |||||
OCP_TRETRY = 11b | 4 | |||||
VOLA | Open load active mode | 150 | 300 | 450 | mV | |
td(OL) | Open load diagnostic delay time | OL_DLY = 0b | 0.3 | ms | ||
OL_DLY = 1b | 1.2 | |||||
IOL | Open load current | 3 | mA | |||
TOTW | Thermal warning temperature | Die temperature (TJ) | 140 | 150 | 160 | °C |
TTSD | Thermal shutdown temperature | Die Temperature (TJ) | 165 | 175 | 185 | °C |
Thys | Thermal shutdown hysteresis | Die temperature (TJ) | 20 | °C |