ZHCSJB5B September 2019 – December 2019 DRV8904-Q1 , DRV8906-Q1 , DRV8908-Q1 , DRV8910-Q1 , DRV8912-Q1
UNLESS OTHERWISE NOTED, this document contains PRODUCTION DATA.
Low-current open-load detection is another type of active open-load detection in the DRV89XX-Q1 devices. In low-current open-load detection, the current detection threshold is around 10x lower than the active open-load detection scheme. This feature gives the user flexibility to detect a valid open-load condition when driving loads that require low current.
As shown in Figure 58, if the low-side MOSFET is in operating condition (switched-ON) and the current flowing in the particular MOSFET is lower than the low-current active open-load current threshold (IOLD_LOW) for at least open-load detection deglitch time (tOLD), then an open-load condition is detected. The OLD bit in the IC status (IC_STAT) register is set, the HBX_LS_OLD bit in the open-load status register (OLD_STAT_X) is set and nFAULT pin is driven low during an open-load detect. Normal operation resumes (driver operation and the nFAULT pin is released) when the open-load condition is removed and CLR_FLT command is issued. The OLD bit remains set until cleared through the CLR_FLT bit.
NOTE
The low-current OLD has following limitations
Figure 59 shows the flowchart for implementing the low-current active OLD in continuous mode of operation. Following are the steps to configure and detect the low-current active OLD in the DRV89XX-Q1 device.
NOTE
The low-current OLD is applicable only for low-side FETs. The user has to enable the low-current OLD mode for the corresponding low-side FET.