ZHCSKG3B September 2016 – February 2024 DS280DF810
PRODUCTION DATA
请参考 PDF 数据表获取器件具体的封装图。
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
CLKf | Calibration clock frequency | 25 | MHz | |||
CLKPPM | Calibration clock PPM tolerance | -100 | 100 | PPM | ||
CLKIDC | Recommended/tolerable input duty cycle | 40% | 50% | 60% | ||
CLKODC | Intrinsic calibration clock duty cycle distortion | Intrinsic duty cycle distortion of chip calibration clock output at the CAL_CLK_OUT pin, assuming 50% duty cycle on CAL_CLK_IN pin. | 45% | 55% | ||
CLKnum | Number of devices which can be cascaded from CAL_CLK_OUT to CAL_CLK_IN | Assumes worst-case 60% and 40% input duty cycle on the first device. CAL_CLK_OUT from first device connects to CAL_CLK_IN of second device, and so on until the last device. | 20 | N/A |