See (1)(2) | MIN | MAX | UNIT |
|---|
| Supply Voltage (VDD) | −0.3 | 2.5 | V |
| LVCMOS Input Voltage | −0.3 | VDD + 0.3 | V |
| LVDS Driver Output Voltage | −0.3 | 3.6 | V |
| LVDS Output Short-Circuit Duration | Continuous | |
| Junction Temperature | | 150 | °C |
| Storage Temperature (Tstg) | −65 | 150 | °C |
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or anyother conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) GND tolerance +/-5mV compared to system GND