ZHCSCQ6C August   2014  – October 2024 FDC1004

PRODUCTION DATA  

  1.   1
  2. 特性
  3. 应用
  4. 说明
  5. Pin Configuration and Functions
  6. Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 I2C Interface Voltage Level
    7. 5.7 I2C Interface Timing
    8. 5.8 Typical Characteristics
  7. Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 The Shield
      2. 6.3.2 The CAPDAC
      3. 6.3.3 Capacitive System Offset Calibration
      4. 6.3.4 Capacitive Gain Calibration
    4. 6.4 Device Functional Modes
      1. 6.4.1 Single Ended Measurement
      2. 6.4.2 Differential Measurement
    5. 6.5 Programming
      1. 6.5.1 Serial Bus Address
      2. 6.5.2 Read/Write Operations
      3. 6.5.3 Device Usage
        1. 6.5.3.1 Measurement Configuration
        2. 6.5.3.2 Triggering Measurements
        3. 6.5.3.3 Wait for Measurement Completion
        4. 6.5.3.4 Read of Measurement Result
    6. 6.6 Register Maps
      1. 6.6.1 Registers
        1. 6.6.1.1 Capacitive Measurement Registers
        2. 6.6.1.2 Measurement Configuration Registers
        3. 6.6.1.3 FDC Configuration Register
        4. 6.6.1.4 Offset Calibration Registers
        5. 6.6.1.5 Gain Calibration Registers
        6. 6.6.1.6 Manufacturer ID Register
        7. 6.6.1.7 Device ID Register
  8. Applications and Implementation
    1. 7.1 Application Information
      1. 7.1.1 Liquid Level Sensor
      2. 7.1.2 46
    2. 7.2 Typical Application
      1. 7.2.1 Design Requirements
      2. 7.2.2 Detailed Design Procedure
      3. 7.2.3 Application Curve
    3. 7.3 Best Design Practices
    4. 7.4 Initialization Set Up
    5. 7.5 Power Supply Recommendations
    6. 7.6 Layout
      1. 7.6.1 Layout Guidelines
      2. 7.6.2 Layout Example
  9. Device and Documentation Support
    1. 8.1 Documentation Support
      1. 8.1.1 Related Documentation
    2. 8.2 接收文档更新通知
    3. 8.3 支持资源
    4. 8.4 Trademarks
    5. 8.5 静电放电警告
    6. 8.6 术语表
  10. Revision History
  11. 10Mechanical, Packaging, and Orderable Information

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

Triggering Measurements

For a single measurement, trigger the desired measurement (that is, which one of the configured measurements) when needed by:

  1. Setting REPEAT (Register 0x0C:bit[8]) to 0.
  2. Setting the corresponding MEAS_x field (Register 0x0C:bit[7:4]) to 1.
    • For example, to trigger a single measurement of Measurement 2 at a rate of 100S/s, set Address 0x0C to 0x0540.
Note that, at a given time, only one measurement of the configured measurements can be triggered in this manner (that is, MEAS_1 and MEAS_2 cannot both be triggered in a single operation).

The FDC1004 can also trigger a new measurement on the completion of the previous measurement (repeated measurements). This is setup by:

  1. Setting REPEAT (Register 0x0C:bit[8]) to 1.
  2. Setting the corresponding MEAS_x field (Register 0x0C:bit[7:4]) to 1.
When the FDC1004 is setup for repeated measurements, multiple configured measurements (up to a maximum of 4) can be performed in this manner, but Register 0x0C must be written in a single transaction.