ZHCSDT1D june 2015 – may 2023 ISO5451
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
tr | Output signal rise time | CLOAD = 1 nF, see Figure 8-1, Figure 8-2 and Figure 8-3 | 12 | 20 | 35 | ns |
tf | Output signal fall time | 12 | 20 | 37 | ns | |
tPLH, tPHL | Propagation Delay | 76 | 110 | ns | ||
tsk-p | Pulse Skew |tPHL – tPLH| | 20 | ns | |||
tsk-pp | Part-to-part skew | 30(1) | ns | |||
tGF | Glitch filter on IN+, IN–, RST | 20 | 30 | 40 | ns | |
tDESAT (10%) | DESAT sense to 10% OUT delay | 300 | 415 | 500 | ns | |
tDESAT (GF) | DESAT glitch filter delay | 330 | ns | |||
tDESAT ( FLT) | DESAT sense to FLT-low delay | see Figure 8-3 | 2000 | 2420 | ns | |
tLEB | Leading edge blanking time | see Figure 8-1 and Figure 8-2 | 330 | 400 | 500 | ns |
tGF(RSTFLT) | Glitch filter on RST for resetting FLT | 300 | 800 | ns | ||
CI | Input capacitance(2) | VI = VCC1/2 + 0.4 × sin (2πft), f = 1 MHz, VCC1 = 5 V | 2 | pF | ||
CMTI | Common-mode transient immunity | VCM = 1500 V, see Figure 8-4 | 50 | 100 | kV/μs |