12 Revision History
Changes from Revision I (August 2023) to Revision J (October 2024)
- 更新了整个文档中的表格、图和交叉参考的编号格式Go
- Updated distance through isolation, while maintaining other insulation specificationsGo
- Updated the input leakage current for ENx pins throughout the electrical characteristic sections Go
- Updated the TDDB plot and the projected lifetimeGo
- Deleted the Community Resources section and added the
Support Resources sectionGo
Changes from Revision H (March 2023) to Revision I (August 2023)
- Updated Thermal Characteristics, Safety Limiting Values, and Thermal Derating Curves to provide more accurate system-level thermal calculationsGo
- Updated electrical and switching characteristics to match device performanceGo
Changes from Revision G (March 2020) to Revision H (March 2023)
- 将整个文档中的标准名称从“DIN V VDE V 0884-11:2017-01”更改为“DIN EN IEC 60747-17 (VDE 0884-17)”Go
- 通篇删除了对标准 IEC/EN/CSA 60950-1 的引用Go
- 通篇删除了所有标准名称中的标准版本和年份参考Go
- Added Maximum impulse voltage (VIMP) specification per DIN EN IEC 60747-17 (VDE 0884-17)Go
- Changed test conditions and values of Maximum surge isolation voltage (VIOSM) specification per DIN EN IEC 60747-17 (VDE 0884-17)Go
- Clarified method b test conditions of Apparent charge (qPD)Go
- Changed values of Maximum surge isolation voltage (VIOSM) specification per DIN EN IEC 60747-17 (VDE 0884-17)Go