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SLCS144E July 2004 – October 2014 LM317L

PRODUCTION DATA.

封装选项

请参考 PDF 数据表获取器件具体的封装图。

机械数据 (封装 | 引脚)

D|8
PW|8
PK|3
LP|3

散热焊盘机械数据 (封装 | 引脚)

PK|3
- PPTD070

订购信息

7 Specifications

7.1 Absolute Maximum Ratings⁽¹⁾

over operating temperature range (unless otherwise noted)

			MIN	MAX	UNIT
V_l – V_O	Input-to-output differential voltage			35	V
T_J	Operating virtual-junction temperature			150	°C

(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

7.2 Handling Ratings

			MIN	MAX	UNIT
T_stg	Storage temperature range		–65	150	°C
V_(ESD)	Electrostatic discharge	Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins⁽¹⁾	0	3000	V
V_(ESD)	Electrostatic discharge	Charged device model (CDM), per JEDEC specification JESD22-C101, all pins⁽²⁾	0	2000	V

(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

7.3 Recommended Operating Conditions

			MIN	MAX	UNIT
V_O	Output voltage		1.25	32	V
V_I – V_O	Input-to-output voltage differential		2.5	32	V
I_O	Output current		2.5	100	mA
T_J	Operating virtual-junction temperature	LM317LC	0	125	°C
T_J	Operating virtual-junction temperature	LM317LI	–40	125	°C

7.4 Thermal Information

THERMAL METRIC⁽¹⁾			LM317L				UNIT
THERMAL METRIC⁽¹⁾			D 8 PINS	LP 3 PINS	PK 3 PINS	PW 8 PINS	UNIT
Rθ_JA	Junction-to-ambient thermal resistance		97.1	139.5	51.5	149.4	°C/W

(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report (SPRA953).

7.5 Electrical Characteristics

over recommended operating virtual-junction temperature range (unless otherwise noted)

PARAMETER	TEST CONDITIONS⁽¹⁾		MIN	TYP	MAX	UNIT
Input voltage regulation⁽²⁾	V_I – V_O = 5 V to 35 V	T_J = 25°C		0.01	0.02	%V
Input voltage regulation⁽²⁾	V_I – V_O = 5 V to 35 V	I_O = 2.5 mA to 100 mA		0.02	0.05	%V
Ripple regulation	V_O = 10 V,	f = 120 Hz		65		dB
Ripple regulation	V_O = 10 V, 10-μF capacitor between ADJUSTMENT and ground		66	80		dB
Output voltage regulation	V_I = 5 V to 35 V, T_J = 25°C, I_O = 2.5 mA to 100 mA,	V_O ≤ 5 V		25		mV
	V_I = 5 V to 35 V, T_J = 25°C, I_O = 2.5 mA to 100 mA,	V_O ≥ 5 V		5		mV/V
	V_I = 5 V to 35 V, I_O = 2.5 mA to 100 mA	V_O ≤ 5 V		50		mV
	V_I = 5 V to 35 V, I_O = 2.5 mA to 100 mA	V_O ≥ 5 V		10		mV/V
Output voltage change with temperature	T_J = 0°C to 125°C			10		mV/V
Output voltage long-term drift	After 1000 hours at T_J = 125°C and V_I – V_O = 35 V			3	10	mV/V
Output noise voltage	f = 10 Hz to 10 kHz,	T_J = 25°C		30		μV/V
Minimum output current to maintain regulation	V_I – V_O = 35 V			1.5	2.5	mA
Peak output current	V_I – V_O ≤ 35 V		100	200		mA
ADJUSTMENT current				50	100	μA
Change in ADJUSTMENT current	V_I – V_O = 2.5 V to 35 V,	I_O = 2.5 mA to 100 mA		0.2	5	μA
Reference voltage (output to ADJUSTMENT)	V_I – V_O = 5 V to 35 V, P ≤ rated dissipation	I_O = 2.5 mA to 100 mA,	1.2	1.25	1.3	V

(1) Unless otherwise noted, these specifications apply for the following test conditions: V_I – V_O = 5 V and I_O = 40 mA. Pulse-testing techniques must be used that maintain the junction temperature as close to the ambient temperature as possible. All characteristics are measured with a 0.1-μF capacitor across the input and a 1-μF capacitor across the output.

(2) Input voltage regulation is expressed here as the percentage change in output voltage per 1-V change at the input.

7.6 Typical Characteristics

Figure 1. Change in Adjustment Current Over Temperature