米6体育平台手机版

ZHCSHC4H August 1999 – December 2017 LM35

PRODUCTION DATA.

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机械数据 (封装 | 引脚)

D|8
- MSOI002K
LP|3
- MSOT002D
NEB|3
NDV|3
- MMSF004B

散热焊盘机械数据 (封装 | 引脚)

订购信息

6.6 Electrical Characteristics: LM35A, LM35CA

Unless otherwise noted, these specifications apply: −55°C ≤ T_J ≤ 150°C for the LM35 and LM35A; −40°C ≤ T_J ≤ 110°C for the LM35C and LM35CA; and 0°C ≤ T_J ≤ 100°C for the LM35D. V_S= 5 Vdc and I_LOAD= 50 μA, in the circuit of Full-Range Centigrade Temperature Sensor. These specifications also apply from 2°C to T_MAX in the circuit of Figure 14.

PARAMETER	TEST CONDITIONS		LM35A			LM35CA			UNIT
PARAMETER	TEST CONDITIONS		MIN	TYP	MAX	TYP	TYP	MAX	UNIT
Accuracy⁽⁴⁾	T_A = 25°C			±0.2			±0.2		°C
		Tested Limit⁽²⁾			±0.5			±0.5
		Design Limit⁽³⁾
	T_A = –10°C			±0.3			±0.3
		Tested Limit⁽²⁾
		Design Limit⁽³⁾						±1
	T_A = T_MAX			±0.4			±0.4
		Tested Limit⁽²⁾			±1			±1
		Design Limit⁽³⁾
	T_A = T_MIN			±0.4			±0.4
		Tested Limit⁽²⁾			±1
		Design Limit⁽³⁾						±1.5
Nonlinearity⁽⁵⁾	T_MIN ≤ T_A ≤ T_MAX, –40°C ≤ T_J ≤ 125°C			±0.18			±0.15		°C
		Tested Limit⁽²⁾
		Design Limit⁽³⁾			±0.35			±0.3
Sensor gain (average slope)	T_MIN ≤ T_A ≤ T_MAX			10			10		mV/°C
		Tested Limit⁽²⁾			9.9
		Design Limit⁽³⁾						9.9
	–40°C ≤ T_J ≤ 125°C			10			10
		Tested Limit⁽²⁾			10.1
		Design Limit⁽³⁾						10.1
Load regulation⁽¹⁾ 0 ≤ I_L ≤ 1 mA	T_A = 25°C			±0.4			±0.4		mV/mA
		Tested Limit⁽²⁾			±1			±1
		Design Limit⁽³⁾
	T_MIN ≤ T_A ≤ T_MAX, –40°C ≤ T_J ≤ 125°C			±0.5			±0.5
		Tested Limit⁽²⁾
		Design Limit⁽³⁾			±3			±3
Line regulation⁽¹⁾	T_A = 25°C			±0.01			±0.01		mV/V
		Tested Limit⁽²⁾			±0.05			±0.05
		Design Limit⁽³⁾
	4 V ≤ V_S ≤ 30 V, –40°C ≤ T_J ≤ 125°C			±0.02			±0.02
		Tested Limit⁽²⁾
		Design Limit⁽³⁾			±0.1			±0.1
Quiescent current⁽⁶⁾	V_S = 5 V, 25°C			56			56		µA
		Tested Limit⁽²⁾			67			67
		Design Limit⁽³⁾
	V_S = 5 V, –40°C ≤ T_J ≤ 125°C			105			91
		Tested Limit⁽²⁾
		Design Limit⁽³⁾			131			114
	V_S = 30 V, 25°C			56.2			56.2
		Tested Limit⁽²⁾			68			68
		Design Limit⁽³⁾
	V_S = 30 V, –40°C ≤ T_J ≤ 125°C			105.5			91.5
		Tested Limit⁽²⁾
		Design Limit⁽³⁾			133			116
Change of quiescent current⁽¹⁾	4 V ≤ V_S ≤ 30 V, 25°C			0.2			0.2		µA
		Tested Limit⁽²⁾			1			1
		Design Limit⁽³⁾
	4 V ≤ V_S ≤ 30 V, –40°C ≤ T_J ≤ 125°C			0.5			0.5
		Tested Limit⁽²⁾
		Design Limit⁽³⁾			2			2
Temperature coefficient of quiescent current	–40°C ≤ T_J ≤ 125°C			0.39			0.39		µA/°C
		Tested Limit⁽²⁾
		Design Limit⁽³⁾			0.5			0.5
Minimum temperature for rate accuracy	In circuit of Figure 14, I_L = 0			1.5			1.5		°C
		Tested Limit⁽²⁾
		Design Limit⁽³⁾			2			2
Long term stability	T_J = T_MAX, for 1000 hours			±0.08			±0.08		°C

(1) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance.

(2) Tested Limits are ensured and 100% tested in production.

(3) Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels.

(4) Accuracy is defined as the error between the output voltage and 10 mv/°C times the case temperature of the device, at specified conditions of voltage, current, and temperature (expressed in °C).

(5) Non-linearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature range of the device.

(6) Quiescent current is defined in the circuit of Figure 14.