ZHCSLQ5D
October 2007 – August 2020
LM5067
PRODUCTION DATA
1
特性
2
应用
3
说明
4
Revision History
5
Device Comparison
6
Pin Configuration and Functions
Pin Functions
7
Specifications
7.1
Absolute Maximum Ratings
7.2
ESD Ratings
7.3
Recommended Operating Conditions
7.4
Thermal Information
7.5
Electrical Characteristics
7.6
Switching Characteristics
7.7
Typical Characteristics
8
Detailed Description
8.1
Overview
8.2
Functional Block Diagram
8.3
Feature Description
8.3.1
Power Up Sequence
8.3.2
Gate Control
8.3.3
Current Limit
8.3.4
Circuit Breaker
8.3.5
Power Limit
8.3.6
Fault Timer and Restart
8.3.7
Undervoltage Lock-Out (UVLO)
8.3.8
Overvoltage Lock-Out (OVLO)
8.3.9
Power Good Pin
8.4
Device Functional Modes
8.4.1
Shutdown / Enable Control
9
Application and Implementation
9.1
Application Information
9.2
Typical Application
9.2.1
Design Requirements
9.2.2
Detailed Design Procedure
9.2.2.1
RIN, CIN
9.2.2.2
Current Limit, RS
9.2.2.3
Power Limit Threshold
9.2.2.4
Turn-On Time
9.2.2.4.1
Turn-on With Current Limit Only
9.2.2.4.2
Turn-on With Power Limit and Current Limit
9.2.2.5
MOSFET Selection
9.2.2.6
Timer Capacitor, CT
9.2.2.6.1
Insertion Delay
9.2.2.6.2
Fault Timeout Period
9.2.2.6.3
Restart Timing
9.2.2.7
UVLO, OVLO
9.2.2.7.1
Option A:
9.2.2.7.2
Option B:
9.2.2.7.3
Option C:
9.2.2.7.4
Option D:
9.2.2.8
Thermal Considerations
9.2.2.9
System Considerations
9.2.2.9.1
System Considerations During Surge Events
9.2.2.10
Power Good Pin
9.2.3
Application Curves
10
Power Supply Recommendations
10.1
Operating Voltage
11
Layout
11.1
Layout Guidelines
11.2
Layout Example
12
Device and Documentation Support
12.1
Trademarks
12.2
静电放电警告
12.3
术语表
13
Mechanical, Packaging, and Orderable Information
封装选项
机械数据 (封装 | 引脚)
NPA|14
MPDS386
DGS|10
MPDS035C
散热焊盘机械数据 (封装 | 引脚)
订购信息
zhcslq5d_oa
zhcslq5d_pm
7.4
Thermal Information
THERMAL METRIC
(1)
(2)
LM5067
UNIT
VSSOP
SOIC
10 PINS
14 PINS
R
θJA
Junction-to-ambient thermal resistance
94
90
°C/W
R
θJC
Junction-to-case thermal resistance
44
27
(1)
For more information about traditional and new thermal metrics, see the
Semiconductor and IC package thermal metrics
application report
.
(2)
Tested on a 4 layer JEDEC board with 2 vias under the package. See JEDEC standards JESD51-7 and JESD51-3. See the Thermal Considerations section.
千亿体育app官网登录(中国)官方网站IOS/安卓通用版/手机APP
|
米乐app下载官网(中国)|ios|Android/通用版APP最新版
|
米乐|米乐·M6(中国大陆)官方网站
|
千亿体育登陆地址
|
华体会体育(中国)HTH·官方网站
|
千赢qy国际_全站最新版千赢qy国际V6.2.14安卓/IOS下载
|
18新利网v1.2.5|中国官方网站
|
bob电竞真人(中国官网)安卓/ios苹果/电脑版【1.97.95版下载】
|
千亿体育app官方下载(中国)官方网站IOS/安卓/手机APP下载安装
|