ZHCSI53A May 2018 – November 2018 LM5122ZA
PRODUCTION DATA.
Selection of the power N-channel MOSFET devices by breaking down the losses is one way to compare the relative efficiencies of different devices. Losses in the low-side N-channel MOSFET device can be separated into conduction loss and switching loss.
Low-side conduction loss is approximately calculated as follows:
where
Alternatively, the factor of 1.3 can be eliminated, and the high temperature on-resistance of the N-channel MOSFET device can be estimated using the RDS(ON) vs temperature curves in the N-channel MOSFET datasheet.
Switching loss occurs during the brief transition period as the low-side N-channel MOSFET device turns on and off. During the transition period both current and voltage are present in the channel of the N-channel MOSFET device. The low-side switching loss is approximately calculated as follows:
tR and tF are the rise and fall times of the low-side N-channel MOSFET device. The rise and fall times are usually mentioned in the N-channel MOSFET data sheet or can be empirically observed with an oscilloscope.
An additional Schottky diode can be placed in parallel with the low-side N-channel MOSFET switch, with short connections to the source and drain in order to minimize negative voltage spikes at the SW node.