over operating free-air temperature range (unless otherwise noted)(1) | MIN | MAX | UNIT |
|---|
| VDD to VSS | –0.3 | 7 | V |
| HB to HS | –0.3 | 7 | V |
| LI or HI input | –0.3 | 15 | V |
| LOH, LOL output | –0.3 | VDD +0.3 | V |
| HOH, HOL output | VHS – 0.3 | VHB +0.3 | V |
| HS to VSS | –5 | 93 | V |
| HS to VSS (2) | –5 | 100 | V |
| HB to VSS | 0 | 100 | V |
| HB to VSS(2) | 0 | 107 | V |
| Operating junction temperature | | 150 | °C |
| Storage temperature, Tstg | –55 | 150 | °C |
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Device can withstand 1000 pulses up to the value indicated in the table of 100-ms duration and less than 1% duty cycle over its lifetime.