ZHCSS23A april 2023 – august 2023 LMH32401-Q1
PRODUCTION DATA
- 1
- 1 特性
- 2 应用
- 3 说明
- 4 Revision History
- 5 Pin Configuration and Functions
-
6 Specifications
- 6.1 绝对最大额定值
- 6.2 ESD Ratings
- 6.3 Recommended Operating Conditions
- 6.4 Thermal Information
- 6.5 Electrical Characteristics: Gain = 2 kΩ
- 6.6 Electrical Characteristics: Gain = 20 kΩ
- 6.7 Electrical Characteristics: Both Gains
- 6.8 Electrical Characteristics: Logic Threshold and Switching Characteristics
- 6.9 Typical Characteristics
- 7 Detailed Description
- 8 Application and Implementation
- 9 Device and Documentation Support
- 10Mechanical, Packaging, and Orderable Information
8.2 Typical Application
Figure 8-3 LMH32401-Q1
Test CircuitThis section demonstrates the performance of the LMH32401-Q1 device when the input current flows into the IN pin. Figure 8-3 shows the circuit used to test the LMH32401-Q1 device with a voltage source. This configuration demonstrates the use case when the photodiode anode is tied to the amplifier input and the photodiode cathode is tied to a positive voltage greater than 2.47 V.