The following conditions apply (unless otherwise specified)(1)(2):
RL = 100Ω, VCC =
±5VDC, AV = +2 feedback resistor (RF) =
250Ω, gain resistor (RG) = 250Ω
PARAMETER |
TEST
CONDITIONS |
NOTES |
MIN |
MAX |
UNIT |
SUB-
GROUPS |
IBN |
Input bias current, noninverting |
|
|
–15 |
15 |
μA |
1, 2 |
|
–21 |
21 |
μA |
3 |
IBI |
Input bias current, inverting |
|
|
–30 |
30 |
μA |
1, 2 |
|
–34 |
34 |
μA |
3 |
VIO |
Input offset voltage |
|
|
–4.5 |
4.5 |
mV |
1, 3 |
|
–6.0 |
6.0 |
mV |
2 |
ICC |
Supply
current, no load |
RL = ∞ |
|
|
15 |
mA |
1, 2, 3 |
PSSR |
Power supply
rejection ratio |
–VCC = –4.5V to
–5.0V, +VCC = 4.5V to
5.0V |
|
45 |
|
dB |
1, 2, 3 |
(1) The algebraic convention, whereby the most negative value is a
minimum and most positive is a maximum, is used in this table. Negative current
shall be defined as conventional current flow out of a device terminal.
(2) Pre- and post-irradiation limits are identical to those listed
under the dc parameter tables. Post-irradiation testing is conducted at room
temperature, 25°C, only. Testing is performed as specified in MIL-STD-883 Test
Method 1019 Condition A. The ELDRS-Free part is also tested per Test Method 1019
Conditions D.