2 修订历史记录
Changes from June 3, 2014 to October 3, 2018
- 删除了以“专用脉冲输出引脚...”开头的特性 项目Go
- 在以“实时时钟 (RTC) 模块...”开头的特性 项目中添加了“通过专用电源 (AUXVCC3) 供电”Go
- Added Section 3.1, Related ProductsGo
- Added typical conditions statements at the beginning of Section 5, SpecificationsGo
- Added SD24_B input pins and AUXVCCx pins to exception list on "Voltage applied to pins" parameter, and added SD24_B input pin limits in "Diode current at pins" parameter in Section 5.1, Absolute Maximum RatingsGo
- Added Section 5.2, ESD RatingsGo
- Added note on CVCORE in Section 5.3, Recommended Operating ConditionsGo
- Added Section 5.7, Thermal Resistance CharacteristicsGo
- Changed TYP value of CL,eff with Test Conditions of "XTS = 0, XCAPx = 0" from 2 pF to 1 pF in Table 5-1, Crystal Oscillator, XT1, Low-Frequency ModeGo
- Corrected the formula in note (1) [added "/ (85ºC – (–40ºC)"] in Table 5-2, Internal Very-Low-Power Low-Frequency Oscillator (VLO)Go
- Corrected the formula in note (1) [added "/ (85ºC – (–40ºC)"] in Table 5-3, Internal Reference, Low-Frequency Oscillator (REFO)Go
- Added note to RPull in Table 5-5, Schmitt-Trigger Inputs – General-Purpose I/OGo
- Changed the MIN value of the V(DVCC_BOR_hys) parameter from 60 mV to 50 mV in Table 5-12, PMM, Brownout Reset (BOR)Go
- Updated notes (1) and (2) and added note (3) in Table 5-18, Wake-up Times From Low-Power Modes and ResetGo
- Corrected the names of the AUXVCC1, AUXVCC2, and AUXVCC3 pins in Auxiliary Supplies sectionGo
- Corrected the name of the AUXCHCx bit in the Test Conditions of Table 5-26, Auxiliary Supplies, Charge Limiting ResistorGo
- Replaced fFrame parameter with fLCD, fFRAME,4mux, and fFRAME,8mux parameters in Table 5-34, LCD_C Recommended Operating ConditionsGo
- Removed ADC10DIV from the formula for the TYP value in the second row of the tCONVERT parameter in Table 5-45, 10-Bit ADC, Timing Parameters, because ADC10CLK is after divisionGo
- Updated Test Conditions for all parameters in Table 5-46, 10-Bit ADC, Linearity Parameters: Changed from "CVREF+ = 20 pF" to "CVeREF+ = 20 pF"; Changed from "(VeREF+ – VeREF–)min ≤ (VeREF+ – VeREF–)" to "1.4 V ≤ (VeREF+ – VeREF–)"; Added "CVeREF+ = 20 pF" to EI Test ConditionsGo
- Added "ADC10SREFx = 11b" to Test Conditions for EG and ET in Table 5-46Go
- Added Section 6.1, OverviewGo
- Removed "2 Channel" option from SD24_B block in Figure 6-1, Functional Block Diagram – PZ Package (all devices support "3 Channel" option)Go
- Removed "2 Channel" option from SD24_B block in Figure 6-2, Functional Block Diagram – PN Package (all devices support "3 Channel" option)Go
- Changed all instances of "bootloader" to "bootloader" throughout documentGo
- Corrected spelling of NMIIFG in Table 6-10, System Module Interrupt Vector RegistersGo
- 将先前的开发工具支持部分替换为Section 8.3工具与软件Go
- 更改了格式并在Section 8.4文档支持 中添加了内容Go