2 修订历史记录

Changes from December 19, 2013 to September 28, 2018

• 通篇更改了文档格式，其中包括添加章节编号 Go
• 添加了器件信息 表Go
• Added Section 3, Device Comparison, and moved Table 3-1 to itGo
• Added Section 3.1, Related ProductsGo
• Added Section 4 and moved pinouts and terminal functions tables to itGo
• Corrected the port number (P4.2) on pin 61 in Figure 4-2, 100-Pin PZ Package (Top View)Go
• Added note to P1.3/ADC10CLK/A3 (pin 8) in Table 4-3, Terminal Functions – PEU PackageGo
• Added typical conditions statements at the beginning of Section 5, SpecificationsGo
• Moved all electrical specifications to Section 5Go
• Added SD24_B input pins and AUXVCCx pins to exception list on "Voltage applied to pins" parameter, and added SD24_B input pin limits in "Diode current at pins" parameter in Section 5.1, Absolute Maximum RatingsGo
• Added Section 5.2, ESD RatingsGo
• Added note to C_VCOREGo
• Added Section 5.7, Thermal Packaging CharacteristicsGo
• Changed the TYP value of the C_L,eff parameter with Test Conditions of "XTS = 0, XCAPx = 0" from 2 pF to 1 pF in Section 5.16, Crystal Oscillator, XT1, Low-Frequency ModeGo
• Updated notes (1) and (2) and added note (3) in Section 5.26, Wake-up Times From Low-Power Modes and ResetGo
• Corrected the names of the AUXVCC1, AUXVCC2, and AUXVCC3 pins in Auxiliary Supplies tablesGo
• Corrected the bit name in the Test Conditions of the R_CHARGE parameter (changed CHCx to AUXCHCx) in Section 5.34, Auxiliary Supplies, Charge Limiting ResistorGo
• Replaced f_Frame parameter with f_LCD, f_FRAME,4mux, and f_FRAME,8mux parameters in Section 5.46, LCD_C Recommended Operating ConditionsGo
• On the V_ID,FS parameter in Section 5.48, SD24_B Power Supply and Recommended Operating Conditions: Changed the MIN value from "V_REF/GAIN" to "–V_REF/GAIN"; Removed "Unipolar mode" test condition (mode is not supported)Go
• Removed ADC10DIV from the formula for the TYP value in the second row of the t_CONVERT parameter in Section 5.57, 10-Bit ADC Switching Characteristics, because ADC10CLK is after divisionGo
• Changed Test Conditions for all parameters in Section 5.58, 10-Bit ADC Linearity Parameters: Removed "V_REF–"; Changed from "(V_eREF+ – V_eREF–)min ≤ (V_eREF+ – V_eREF–)" to "1.4 V ≤ (V_eREF+ – V_eREF–)"; Changed from "C_VREF+ = 20 pF" to "C_VeREF+ = 20 pF"; Added "C_VeREF+ = 20 pF" to E_I; Added "ADC10SREFx = 11b" to E_T and E_GGo
• Removed "V_REF–" from the Test Conditions for the V_eREF+, V_eREF–, and (V_eREF+ – V_eREF–) parameters in Section 5.59, 10-Bit ADC External ReferenceGo
• Changed MIN value of AV_CC(min) parameter with Test Conditions of "REFVSEL = {0} for 1.5 V" from 2.2 V to 1.8 V in Section 5.60, REF Built-In ReferenceGo
• Changed the MAX value of the t_{EN_CMP} parameter with Test Conditions of "CBPWRMD = 10" from 50 µs to 100 µs in Section 5.61, Comparator_BGo
• Throughout document, changed all instances of "bootstrap loader" to "bootloader"Go
• Corrected spelling of NMIIFG in Table 6-13, System Module Interrupt Vector RegistersGo
• 添加了Section 7并将开发工具支持、器件和开发工具命名规则 和商标 部分移到这里Go
• 将先前的开发工具支持部分替换为Section 7.3工具与软件Go
• 增加了Section 8，机械，封装和可订购信息Go